Cohu, Inc.

Product

Test Contactor/Probe Head

Atlas

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Cohu, Inc.

Atlas - Cohu, Inc.

QuadTech™ probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance.Atlas™ test contactor offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology. The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.

Product

High Parallel Test Handlers

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Cohu, Inc.

Cohu, Inc.

High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.

Product

Test Contactor

MiCon

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Cohu, Inc.

MiCon - Cohu, Inc.

The MiCon™ Test Contactor is spring pin footprint compatible supporting advanced temperature requirements as well as advanced power/current requirements. The footprint compatibility allows for easy and cost-efficient conversion from spring pin setups. The fully decoupled load board side of the spring ensure no degradation of the load board pad.MiCon features a single piece design, which ensures a long lifespan, low and stable contact resistance, high current carrying capability and an extended temperature range. The MiCon allows for testing at full specification values. The extended operating range accommodates device lead trim and form variability such as device alignment accuracy and device lead coplanarity.

Product

High Parallel Tri-Temp Pick-and-Place Handler

Delta MATRiX

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Cohu, Inc.

Delta MATRiX - Cohu, Inc.

Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.

Product

Test Handlers

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Cohu, Inc.

Cohu, Inc.

Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.

Product

Flexible Test And Scan Solution For FFC Devices

Ismeca NY32W

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Cohu, Inc.

Ismeca NY32W - Cohu, Inc.

32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.

Product

Highest Demanding Finishing Processes

Ismeca NY32

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Cohu, Inc.

Ismeca NY32 - Cohu, Inc.

32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as intelligent features enables extended autonomous operation and productivity.

Product

High-Speed Laser Mark Handler

MCT MH-3300

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Cohu, Inc.

MCT MH-3300 - Cohu, Inc.

MH-3300™ high-speed laser mark handler is used for marking of 2DID codes on the lead frame in support of strip testing, marking of reject devices, and for final package marking in strip test or assembly operations. The MH-3300 offers unparalleled throughput performance and the best cost-of-ownership in the industry.

Product

Solution For Test-in-Strip

InCarrier

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Cohu, Inc.

InCarrier - Cohu, Inc.

The InCarrier process is based on a strip-like device carrier for single devices that combines the advantages of the singulated device test with the advantages of high parallel strip test. Leveraging the strip like design the InCarrier ensures robust test-handling for even smallest devices and supports high parallel test.

Product

High-Throughput Film Frame Handler

MCT FH-1200

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Cohu, Inc.

MCT FH-1200 - Cohu, Inc.

FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).

Product

Tri-Temp Pick-and-Place Handler

MT9510 XP / x16

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Cohu, Inc.

MT9510 XP / x16 - Cohu, Inc.

MT9510 XP™/ MT9510 x16™ test handler provides full temperature control during test in extreme environmental conditions from -55˚C to +175˚C. A variety of options, upgrades and retrofits are available to configure the product to customer applications such as; automotive battery management systems (BMS) for electric (EV) and hybrid electric vehicles (HEV) and precision power regulators.

Product

Kelvin Test Contactor/Probe Head

Gemini

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Cohu, Inc.

Gemini - Cohu, Inc.

At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.

Product

Kelvin Test Contactor

cCruiser

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Cohu, Inc.

cCruiser - Cohu, Inc.

cCruiser™ Kelvin contactor was designed with cost of test optimization in mind, boasting a cantilever design that allows the testing of challenging discrete ICs and small logic package types. Providing a best-in-class proven lifespan of up to 5 million touchdowns increasing handler uptime. cCruiser reduces the cost of test for customers significantly, lasting longer and testing longer than previous contact solutions.

Product

Test Contactor/Probe Head

xWave

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Cohu, Inc.

xWave - Cohu, Inc.

Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.

Product

Kelvin Test Contactor

cCompact

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Cohu, Inc.

cCompact - Cohu, Inc.

cCompact™ test contactor offers a reduced site-to-site pitch concept enables high parallel test for power applications on strip test and pick and place handler platforms.Featuring compact Kelvin footprint with outstanding CRES stability by Denmark pin material. Automotive temperature range -60°C to +175°C. Integrated Socket Air-distribution.