Cohu, Inc.

Product

Semiconductor Test Platform

PAx

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Cohu, Inc.

PAx - Cohu, Inc.

PAx semiconductor test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next-generation wireless standards.

Product

Gravity Test Handlers

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Cohu, Inc.

Cohu, Inc.

Extremely small to very large packages, very wide temperature range, high throughput octal site and quad site testing.

Product

Configurable OSAT Friendly Pick-and-Place Handler

Delta Eclipse

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Cohu, Inc.

Delta Eclipse - Cohu, Inc.

Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors.  The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.

Product

Scalable Multi-Channel Active Thermal Control (ATC)

T-Core Thermal Control System

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Cohu, Inc.

T-Core Thermal Control System - Cohu, Inc.

Cohu’s proprietary T-Core thermal system’s controller provides precise, multi-site temperature management of power dissipation ICs, such as graphic chips and CPUs, optimizing test yield.The T-Core thermal control system optimizes test yield at cold, ambient, and hot temperatures and offers better than +/- 1°C accuracy with response speeds of >125°C/sec. The system’s flexibility to control air, liquid, and refrigerant based thermal heads gives semiconductor manufacturers excellent temperature control capability for high volume manufacturing.

Product

Test Contactor

RF Scrub

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Cohu, Inc.

RF Scrub - Cohu, Inc.

RF Scrub™ Test Contactor’s innovative design combines an extremely short signal path (0.90mm test height) with high wear resistance pins that can operate in a wide temperature range.The RF Scrub Test Contactor’s long-life, elastomer free design and easy field maintainability makes it an optimal solution for testing of high-performance devices.The RF Scrub design minimizes load board wear and with the unique pin base material and plating, the cleaning intervals can last up to 100,000 cycles.

Product

Interface Solutions

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Cohu, Inc.

Cohu, Inc.

Cohu is the market leader in semiconductor test sockets and has 50+ years of semiconductor test expertise providing optimal test contactor and probe pin solutions for every type of application and challenge, using innovative and sophisticated R&D methods.We offer a full suite of test contactors that provide the electrical interface between the tester and the semiconductor device presented by the test handler; optimizes signal performance via an array of consumable probe pins.

Product

Probe Cards

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Cohu, Inc.

Cohu, Inc.

High-performance field repairable direct-attach probe cards.

Product

Turret Kelvin Test Contactor

cHybrid

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Cohu, Inc.

cHybrid - Cohu, Inc.

cHybrid™ Kelvin contactor contains a new and unique contact spring architecture which allows the test socket to adapt to challenging IC pad geometry requirements of todays and future small package types. Great lifetime up to 3 million touchdowns, with best-in-class contact resistance repeatability reduces cost of test significantly. A multi-beam contact structure optimizes signal integrity and current capability according to challenging electrical test requirements.cHybrid Kelvin contactor with multi-beam contact spring architecture delivers improved yield and long life minimizing cleaning cycles. This innovative solution will help customers reduce cost and maximize productivity.

Product

High Parallel Test Handlers

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Cohu, Inc.

Cohu, Inc.

High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.

Product

Kelvin Test Contactor/Probe Head

Gemini

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Cohu, Inc.

Gemini - Cohu, Inc.

At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.

Product

Test Contactor

cGator

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Cohu, Inc.

cGator - Cohu, Inc.

cGator™ singulated power contactor is a top and bottom contacting solution for power Known Good Dies (KGD).Cohu´s patent pending Volta-Flux™ MEMS probe architecture technology provides stable and low CRES for very challenging high-voltage and high-current requirements.The gentle-touch feature reduces surface impacts to a minimum while providing a reliable contact force.

Product

Kelvin Test Contactor

nano

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Cohu, Inc.

nano - Cohu, Inc.

nano Kelvin™ test contactor is a well-established Cantilever Kelvin test contactor with proven performance in the automotive market and further increasing popularity due to the robustness and reliability of the product.Featuring a small imprint area, contact motion decoupled from the test board and simple and cost-efficient test boards.

Product

Semiconductor Test Platform

Diamondx DxV

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Cohu, Inc.

Diamondx DxV - Cohu, Inc.

The Diamondx DxV semiconductor test system provides full ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor tester solutions that is no mainframe, separate workstation or support cabinets needed. The Diamondx DxV is completely stand-alone, so it can be placed on a bench or desktop:

Product

Probe Head

cViper

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Cohu, Inc.

cViper - Cohu, Inc.

cViper™ is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.

Product

High Parallel Tri-Temp Pick-and-Place Handler

Delta MATRiX

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Cohu, Inc.

Delta MATRiX - Cohu, Inc.

Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.