Langer EMV-Technik GmbH
Langer EMV-Technik GmbH is a medium-sized electro-technical company which is active in the field of electromagnetic compatibility-related
- +1 888 687 5 687
+49 (0) 351 430093-0 - +49 (0) 351 430093-22
- mail@langer-emv.de
- sales@langer-emv.de
- Nöthnitzer Hang 31
Bannewitz, D-01728
Germany
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Product
IC Tester
ICE1
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The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Product
Micro probes 1 MHz up to 1 GHz
MFA 02 set
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The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
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Product
MP CI set
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The MP CI set up to measure coupling impedance is used to determine EMC characteristics of connectors and cables. The coupling inductivity defines the coupling inductance of external disturbance on the shield or on the ground with the desired signals. If the coupling inductivity is considered in the construction set-up and the pin or wire assignment of connectors or cables, then the connectors or cables will be more interference-resistant. The MP CI set-up for measuring coupling impedance can be used for following measurements at connectors or cables: 1. measurement of a single signal (common mode) 2. measurement of a symmetrical signal (common mode) 3. measurement of a symmetrical signal (differential mode)
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Product
Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
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The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Product
Near Field Micro Probe ICR HV H Field
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The measurement coil is located vertically in the probe head. The near field probes are run with a positioning system (Langer Scanner).
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Product
Burst Detectors
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The Burst detector monitors interference threshold exceedances at cable-and line bundles. It selectively detects conducted disturbances, which would influence the monitored device.
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Product
Immunity
ESD coupling
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is used for conducted coupling of Langer ESD pulses (200ps rise time) into ICs.
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Product
IC EMC Analysis
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We carry out standard measurements according to BISS/IEC and analysis of the interference immunity and interference emissions of ICs during development.With the targeted EMC analysis, we uncover weak points in the ICs so that the IC developer can use them to develop improvements for the product
