Langer EMV-Technik GmbH
Langer EMV-Technik GmbH is a medium-sized electro-technical company which is active in the field of electromagnetic compatibility-related
- +1 888 687 5 687
+49 (0) 351 430093-0 - +49 (0) 351 430093-22
- mail@langer-emv.de
- sales@langer-emv.de
- Nöthnitzer Hang 31
Bannewitz, D-01728
Germany
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Product
Near Field Probes 30 MHz - 6 GHz
XF Family
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The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
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Product
Measuring and Calibration Stations
PCB
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Is used to measure electric and magnetic fields of an ESD generator
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Product
Near Field Micro Probe Sets
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The near field probe is designed for a high-resolution measurement of electrical near fields.
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Product
Preamplifier
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Is designed for the amplification of measuring signals, e.g. weak signals of near field probes with high resolution.
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Product
Mini Burst Field Generators
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Mini burst field generators are small and handy burst generators used to detect weak spots in the device under test.
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Product
H-Field Burst Detector
BD 11
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The BD 11 is used to detect a burst or ESD current pulse on a cable, for example in a complex system. This makes it easier to investigate the causes of sporadic faults in the system. It is small and handy, its sensitivity is very high and continuously adjustable.
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Product
IC Side Channel Analysis
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These probes allow you to couple fast, transient magnetic field, E-field, and current pulses into ICs.
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Product
Optical signal transmission
Bus systems
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Allows for the transmission of high speed CAN signals via optical fibre cables during EMC tests or when there are great potential differences (high voltage).
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Product
Accessory EFT/Burst generators IEC 61000-4-4
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The field sources and the burst transformer are used to harden the device under test. They are powered by an EFT/burst generator.
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Product
Burst Detectors
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The Burst detector monitors interference threshold exceedances at cable-and line bundles. It selectively detects conducted disturbances, which would influence the monitored device.
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Product
IC EMC Analysis
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We carry out standard measurements according to BISS/IEC and analysis of the interference immunity and interference emissions of ICs during development.With the targeted EMC analysis, we uncover weak points in the ICs so that the IC developer can use them to develop improvements for the product
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Product
IC Measurement Technology
Emission
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is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins.
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Product
MP field sources calibration set
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The MP field source calibration set is used to measure electric or magnetic fields in a frequency range up to 3 GHz. RF fields or transient fields can be measured. The MP field source calibration set is used to check fields of the Langer EMV-Technik GmbH field sources, fields of TEM cells and IC striplines.
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Product
Optical Signal Transmission
Analog
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Used for oscillographing analog signals under EFT/EDS/RF interference.
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Product
Near Field Probes 1GHz - 10 GHz
SX set
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The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
