Corelis, Inc.
Corelis is a pioneer in the rapid development of innovative IEEE-1149.x-compliant products and services in support of the JTAG/boundary-scan market. As a result of our ingenuity and contributions to the industry, a growing number of customers have been able to incorporate boundary-scan technology into their product development processes in order to gain a competitive edge in today’s marketplace.
- 1(562) 926-6727
- info@corelis.com
- 13100 Alondra Blvd.
Suite 102
Cerritos, CA 90703
United States of America
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Product
Boundary-Scan DIMM Socket Tester
ScanDIMM
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Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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Product
Turnkey Boundary Scan Solutions
TestGenie
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TestGenie is a low-cost boundary-scan solution for those companies that have a genuine requirement for JTAG testing, but have difficulty absorbing the tool costs or assigning the resources required to implement the test technology into their development or production processes. TestGenie allows customers to use full-featured versions of Corelis ScanExpress products at a fraction of the cost.Once you’ve selected boundary-scan as a practical solution, the second biggest decision is whether you want to do the test development yourself or have a third party do it. The decision should not be considered lightly as there are advantages and disadvantages to each.
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Product
High-Speed 4-TAP USB 2.0 JTAG Controller
USB-1149.1/4E
Controller
The USB-1149.1/4E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/4E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.
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Product
Mixed Signal, Multi-Functional Test Module
PXIe-ScanIO-112
Test Module
The PXIe-ScanIO-112 delivers a powerful combination of digital, analog, and AC-coupled testing in a single PXIe module. With 104 boundary-scan controllable digital I/O channels and 8 analog I/O channels ranging from –15V to +15V, engineers gain the flexibility to test a wide variety of board-level designs. The module supports IEEE-1149.6 AC-coupled interconnect testing, configurable single-ended and differential pin operation, and integrates seamlessly with the Corelis ScanExpress™ suite.
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Product
Test Pattern Generator Software
ScanExpress TPG
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To deliver a product meeting the highest standards of quality and reliability, design engineers and test engineers alike must maintain test capabilities throughout the entire product life cycle, from prototype to manufacturing. Automation in test generation is essential to ensure that tests keep up with the rapid development of modern products.The ScanExpress TPG™ Intelligent Test Pattern Generator Software provides a highly advanced, automated boundary-scan test design environment—perfect for quick and efficient creation of complete boundary-scan tests for all IEEE-1149.1 and IEEE-1149.6 compliant circuit boards.
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Product
JTAG Boundary-Scan Hardware
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JTAG Boundary-Scan Hardware by Corelis, including boundary-scan controllers, 12C serial bus protocol analyzers & exercisers, JTAG boundary Scan Modules, high-volume production JTAG systems, 7 support for 3rd party JTAG controllers
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Product
Remote Intelligent Pod
ScanTAP
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The test patterns generated by the PCI-1149.1/Turbo controller are distributed to the target system either directly through ScanTAP 4 and ScanTAP-8 pods. The ScanTAP-4 and ScanTAP-8 pods can apply test vectors and/or ISP patterns to target boards with a variety of JTAG chain topologies. In the simplest case, the ScanTAP-4 and ScanTAP-8 will provide the interface between the PCI-1149.1/Turbo controller and a target system consisting of a single JTAG Test Access Port (TAP). This would be the case where the target system consists of one JTAG chain and its single associated TAP.
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Product
Flash Memory In-System Programming File Generation
ScanExpress Flash Generator
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ScanExpress Flash Generator is a tool to quickly create Flash programming files for use with ScanExpress™ software. The application operates as a standalone utility or integrates into ScanExpress TPG for creation and reuse of boundary-scan test files for in-system programming (ISP).ScanExpress Flash Generator combines a board Netlist, scan chain description, and BSDL files to automatically create Flash Programming Information (FPI) files. These files include all information necessary for ScanExpress Runner™ or ScanExpress Programmer™ execution systems to perform read, write, erase, and verify operations—in-system using high performance Corelis hardware.
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Product
JTAG/Boundary-scan Digital I/O Module
ScanIO-300LV
Digital I/O
The ScanIO-300LV JTAG/boundary-scan digital I/O module turns an IEEE-1149.1 boundary-scan controller (such as the Corelis PCI-1149.1/Turbo or NetUSB-1149.1) into a powerful digital interconnect and functional tester.
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Product
TAP Adapter for Corelis JTAG Controllers
Low Voltage Adapter
Controller
High technology, energy efficient, and small form factor products push JTAG interfaces to the limits; low power and high performance means low voltage, high speed, and high drive requirements. Building specialized interface circuits on product Printed Circuit Boards (PCBs) is inconvenient and costly—an out-of-the-box, external solution is needed.The Corelis Low Voltage adapter is an add-on accessory that provides existing scan controllers with an active, plug-in interface to access low voltage scan chains, without sacrificing performance.
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Product
High-Speed Multi-IO SPI Host Adapter
BusPro-S™
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The BusPro-S High-Speed Multi-IO SPI Host is designed with speed, versatility, and value in mind. Featuring a 60 MHz clock rate with up to 200 Mb/s throughput and support for standard, dual, quad, and 3-wire modes, the BusPro-S is the right tool for all SPI debugging applications-present and beyond.
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Product
Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
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Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
Parent
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JTAG Technologies Inc.
We are a solutions company specializing in PCB assembly testing, fault diagnosis and device programming. We develop innovative products built upon boundary-scan (IEEE Std 1149.x) standards and supply our software and hardware products and services world-wide.
Related
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