Corelis, Inc.

Product

JTAG Emulator for BAE Systems RAD750 Microprocessors

CodeRunner JTAG Emulator

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Corelis, Inc.

CodeRunner JTAG Emulator - Corelis, Inc.

Designed for the most hazardous high radiation environments, the BAE Systems RAD750 radiation hardened PowerPC microprocessor is the most advanced processor offered to the space community. From the Mars Reconnaissance Orbiter to the Curiosity Rover, the RAD750 microprocessor has proven time and again to lead the industry in quality, performance, and cost.

Product

High-Speed USB 2.0 JTAG Controller

USB-1149.1/1E

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Corelis, Inc.

USB-1149.1/1E - Corelis, Inc.

The USB-1149.1/1E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/1E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.

Product

Boundary-Scan Test and In-System

PCIe-1149.1

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Corelis, Inc.

PCIe-1149.1 - Corelis, Inc.

The Corelis PCIe-1149.1 is a high-performance boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. When combined with a ScanTAP™ intelligent pod, the PCIe-1149.1 offers up to 80 MHz clock rates on 4 or 8 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.

Product

PCI Based JTAG Controller

PCI-1149.1/Turbo

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Corelis, Inc.

PCI-1149.1/Turbo - Corelis, Inc.

The PCI-1149.1/Turbo is a powerful PCI-based JTAG/boundary-scan controller that is used for testing and in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.

Product

Test & Programming Software

ScanExpress

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Corelis, Inc.

ScanExpress - Corelis, Inc.

The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.

Product

Test Program Execution for High-Volume Production Systems

ScanExpress Runner Gang

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Corelis, Inc.

ScanExpress Runner Gang - Corelis, Inc.

Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.

Product

JTAG Boundary-Scan Controller

NetUSB-1149.1/SE

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Corelis, Inc.

NetUSB-1149.1/SE - Corelis, Inc.

8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.

Product

At-Speed Non-Intrusive Functional Testing

ScanExpress JET

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Corelis, Inc.

ScanExpress JET - Corelis, Inc.

Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.

Product

High-Performance LAN & USB JTAG Controller

NetUSB II™

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Corelis, Inc.

NetUSB II™ - Corelis, Inc.

Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires a controller with high performance specifications and diverse features.

Product

Advanced Diagnostics for ScanExpress™ JET JTAG Embedded Test Solutions

ScanExpress JET Advanced Solutions

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Corelis, Inc.

ScanExpress JET Advanced Solutions - Corelis, Inc.

ScanExpress JET advanced diagnostics add additional diagnostic resolution with fully automated analysis translating functional test results to down to the net and pin level, even with BGA packages.The seamless integration with ScanExpress JET and ScanExpress Runner as well as the ability to output ScanExpress Viewer fault reports for PCB visualization make ScanExpress JET Advanced Diagnostics a must-have tool for any JTAG test system.

Product

Transient Suppression for Corelis JTAG Controllers

TAP Protection Adapter

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Corelis, Inc.

TAP Protection Adapter - Corelis, Inc.

Transient events such as Electrostatic Discharge (ESD), inductive switching, and lightning can damage electrical equipment, leading to costly repairs and test equipment down-time, reducing production capacity and increasing time-to-market.The Corelis TAP Protection Adapter is designed to enhance protection to any Corelis JTAG controller, shielding against harmful events using a combination of electrical defenses.The compact adapter features series resistors and transient voltage suppressor (TVS) diodes to mitigate damage to the JTAG controller. Protect your investment and enjoy peace-of-mind with the TAP Protection Adapter.

Product

Boundary-Scan Test Executive

ScanExpress Runner

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Corelis, Inc.

ScanExpress Runner - Corelis, Inc.

Efficiency in engineering means managing your most precious resources: time and effort. Automated testing is essential and boundary-scan is a critical component; no other structural test system provides the same value.When down to the wire, your boundary-scan test system needs to be built both for ease-of-use and reliability; a robust and powerful mechanism to ensure that no matter the state of production, all boundary-scan tests can be quickly and faithfully executed to maintain forward momentum.

Product

Bus Analyzers & Exercisers

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Corelis, Inc.

Corelis, Inc.

Corelis offers several bus analyzer products to satisfy different technical needs and price points. Corelis bus analyzers and exercisers offer analysis, test, debug, and validation capabilities for product development, system integration, and manufacturing of digital boards and systems. All of our bus analyzers are PC-based and come with software that runs on Microsoft Windows 7, Windows 8/8.1 and Windows 10.

Product

Boundary-Scan Advanced Diagnostics Option for ScanExpress Runner

ScanExpress ADO

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Corelis, Inc.

ScanExpress ADO - Corelis, Inc.

Being able to quickly pin point faults can provide the difference between a long night at the office or spending time at home with the family.ScanExpress ADO is designed to take diagnostic guesswork out of the equation. The fully automated analysis option quickly parses test vectors and identifies faults down to the net and pin level.

Product

Design for Testability (DFT Test)

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Corelis, Inc.

Corelis, Inc.

Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.