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PathWave IC-CAP Device Modeling Platform
W7300B
The W8500BP IC-CAP Device Modeling Platform Bundle provides the basic tools you need to start modeling devices and circuits. It provides the necessary tools to:
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Model PS-1
16820-100
The Model PS1 under tank probe is designed to be used in conjunction with customer-supplied ¾” National Pipe Thread (NPT) PVC piping and the product has a ¾” (NPT) threaded end that accepts a standard coupling. Any number of pipe pieces can be combined via couplings to provide the required probe insertion length under a tank. The probe can be combined with any standard reference electrode with a ¼ x 20 threaded fitting, including the RE-5, RE-5C and RE-7 portable reference electrodes. Reference electrodes are sold separately. The sealed cable to be fed through a customer-supplied PVC pipe comprises #16 AWG wire with red colored PVC insulation and the wire length can be selected via the radio buttons in the field below.
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Custom & Special Models
Futek Advanced Sensor Technology, Inc.
Custom Load Cells manufactured in the US by FUTEK Advanced Sensor Technology (FUTEK), a leading manufacturer producing a huge selection of Custom Force Sensors and Custom Torque Sensors utilizing one of the most advanced technologies in the Sensor Industry: Metal foil strain gauge technology.
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System Modeling
Mentor Graphics SystemVision is a mixed-signal modeling and simulation environment using the power of VHDL-AMS and SPICE to verify your control and mechatronic systems. SystemVision includes graphical design entry, VHDL-AMS modeling and library tools, leading-edge simulation technology and powerful waveform viewing and analysis tools
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Model DG-9 (Universal Voltage)
DA8-G9-UNIV
Designed for semi-solids; powdered, granular or textile materials; and pliable sheets in rolls or stacks. Optional needle electrodes and sensitivity modules which allow for a wide range of moisture measurements. Rechargeable NiMH batteries save hassle and money of battery replacement.
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NF-Series Standard Plus Models
The E-DRIV® NF-Series standard plus models feature a selectable Double Hit Mode for soft joint applications and a selectable Soft Start mode. Engineered for high volume manufacturing applications the brushless motor design ensures durability and reduces the standard maintenance costs associated with brush type electric screwdrivers. The NF power tool is ESD certified, ensuring less than 1 Ohm at the bit tip. ESD management assures product quality, cost savings and a reduction in overall ESD failures.
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Multifunctional Devices
Computer Gesteuerte Systeme GmbH
Each channel is independent and can be configured in a different operation mode. The technical data of each channel depends upon which electronic card of the EL6 and EL7 series is used.
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BAW Devices
Teledyne’s Bulk Acoustic Wave (BAW) Product Line has been producing BAW delay devices since the early 1960’s. Over the years, Teledyne Microwave Solutions (TMS) has constantly improved BAW technology and is currently the world’s only supplier of microwave bulk acoustic wave delay devices. Markets for BAW devices include instrumentation and radar altimeters and are available in connectorized, pin and surface mount configurations.
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Bridge Devices
USB
*Royalty free Virtual Com Port (VCP) drivers*Simple GUI based Xpress configurator for configuring, programming and customizing applications*No USB expertise required*Seamless compatibility with most operating systems*UART, SPI, I2C/SMBus and I2S interface options available*Fastest way to add USB Turn key, no firmware development needed
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Franklin Tester Model
Model FT2
Franklin Tester Model FT-2 is designed as per IS:649 & ASTM:717 Standard to measure insulation resistivity of electrical steel sheet. It requires precision & noise free DC regulated power supply and equally distributed pressure on electrode. Franklin Tester FT-2 regulated power supply provides 0.5000V with 0.1% accuracy over load and no load. Most of national and international standard has specified only 0.5%, means FT-2 is equipped with five time better accuracy than required.
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IMU MODELING AND SIMULATION
CAST Navigation’s INS systems provide high rate inertial data with exceptional fidelity to support the integration and testing of today’s complex EGI and GNSS/INS navigation systems. The CAST system is designed for optimal performance when the inertial sensor and GNSS receiver are either loosely, tightly or ultra-tightly coupled, or when an INS aiding source can be utilized by any other type of device.
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Architectural Modeling Software
Formit
FormIt architectural modeling software enables architects to sketch, collaborate, analyze, and revise early-stage design concepts and easily connect their ideas to Revit.
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Metrology Device
XPLOR 100
XPLOR 100 is a state of the art, fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.
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Model And Resonance Testing
Response Dynamics Vibration Engineering, Inc.
Resonance identification, dynamic testing, modal analysis and operating deflection shape analysis, form the basis of our set of expertise in vibration analysis, and are described on this page, in the embedded video below, and in the links above in more detail. This is the heart of vibration testing and key to making a confounding vibration issues understandable. Our vibration testing, structural dynamics and modal analysis consulting services have helped push the limits of technologies and cutting edge designs for over 30 years.
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Security Devices
Schweitzer Engineering Laboratories, Inc.
Security devices protect perimeters and secure communications within LANs.
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Analog DAQ Devices
Family of ruggedized products that provide an isolated analog, digital or temperature interface to a PC via the PC’s USB port.
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Device Testing
The BTL Working Group (BTL-WG) has developed a test package which contains a set of testing procedures. These can be acquired and used by manufacturers to pre-test their products for BACnet compliance before they send their products to an RBTO (Recognized BACnet Testing Organization) for BTL Testing. The BTL Test Package is available on the test documentation page.
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Measuring and Test Devices
ProfiMessage D
With a ProfiMessage D device, you can immediately begin using a optinal PROFINET interface as well as communicating to third-party systems via an OPC UA Server/Client. The device is also equipped with a display to show important configuration and measurement data. Other special features include universal sensor inputs, high-level data security, and a diverse range of interfaces.
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BJT Modeling
IC-CAP supports a number of bipolar junction transistor (BJT) models. For more information on the various types of IC-CAP supported BJT models, refer to the table below.
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Wireless I/O Devices
Advantech's remote I/O devices bring an IT oriented spirit to the market, fulfilling mobile monitoring and controlling needs under an IoT framework.
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MODEM SHARING DEVICES
The Modem Sharing Devices are designed to allow RS-232 DTE (terminal) devices to share Leased Line and Dial line Modems or DSU's. Data arriving at the Master Port is continually broadcast to all Subchannels. The attached terminal device that raises the RTS control signal is automatically given control of the MSD. Data rates of up to 128 Kbps are supported.
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Model Quality Assurance (MQA)
Model Quality Assurance (MQA) is an automated SPICE model validation software which allows you to check and analyze SPICE model library, compare different models, and generate quality assurance (QA) reports in a complete and efficient way. With more than ten years of history, MQA has become the industry standard for SPICE model acceptance and signoff and is widely adopted by leading integrated device manufacturers (IDMs), foundries and design houses.
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BSDL models for Verilog, LASAR, HILO
MODBSDL
MODBSDL Software reads a BSDL file and writes an ACUGEN-format simulation model. This model can then be simulated and fault graded using ACUGEN's ATGEN product, or converted to another simulation format.
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Power Switching Devices
Watlow Electric Manufacturing Company
Watlow solid state power switching devices complement the rapid switching required by PID temperature controllers and help deliver optimum system performance and service life. They are available in 1-phase and 3-phase/2-leg and 3-leg configurations, feature touch-safe terminations, input indicators, zero-cross, random or phase-angle fire options, ratings from 18 to 1,000 amperes and agency approvals including CE and UL® 508. Various configurations offer short circuit current ratings (SCCR) of 200,000 amperes, extensive system and heater diagnostic capabilities, heater bake out, integrated heat sinks, on-board fuses, RoHS compliance and serial communications.
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Economical Solution, as Data Handling, Modelling Capabilities
PowerFactory
DIgSILENT has set standards and trends in power system modelling, analysis and simulation for more than 25 years. The proven advantages of the PowerFactory software are its overall functional integration, its applicability to the modelling of generation-, transmission-, distribution- and industrial grids, and the analysis of these grids' interactions. With PowerFactory Version 14, DIgSILENT presents a further step towards seamless integration of functionality and data management within a multi-user environment.
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Medical Devices
As more medical devices become wireless, manufacturers will be looking for compact and affordable testing solutions for wireless components. Copper Mountain Technologies’ USB vector network analyzers provide portable, cost-effective network analysis solutions for medical wireless device applications.
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Fiber-Optic Devices
Understanding that fiber-optic devices are key devices for building global information networks, Renesas has applied its advanced R&D, design, development, and quality management expertise to creating a diverse portfolio of products for a wide range of fiber-optic communications applications.
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Device Interface
Providing flexible, dependable services for device interface design, development, ordering, production, and support. The importance of the device interface has greatly increased, as high speed, high density semiconductor devices are more rapidly developed, and as customers more severely demand high accuracy, high reliability, and high productivity of testing.





























