Test Systems

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  • COMBITEST - Relay Test System COMBITEST relay test system provides a wide range of testing capabilities. All parts of the COMBIFLEX relay and the overall system can be accessed for testing. COMBITEST also means additional personnel safety during testing. In a test it is possible to inject signals to the isolated relay in order to observe its performance and operation limits.
    ABB
  • NSG 4070 - EMC Immunity Test System An advanced combination of signal generator and compact immunity test system. Its large frequency range from 9kHz to 1GHz and its modular set-up using internal or external amplifiers enable a large variety of applications including tests according to IEC 61000-4-6, various BCI applications as well as signal generator and power meter for test systemsas per IEC 61000-4-3, IEC 61000-4-20, IEC 61000-4-21 and many other applications.
    Teseq AG
  • EMC / RF Test System Engineering / Development & Integration Anechoic chamber, radio isolation room construction, removal, maintenance and repair. System Integration of complete Test System. Development team has the expertise and technical experience and provide a customized service demand, the project includes a full range of EMI / EMS / RF test equipment with neighboring sell and repair
    EMC Instruments
  • LCII Ferroelectric Test System Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
    Radiant Technologies
  • 303 Series - Relay Test System The SemiTek 303-Relay Test System is PC-based and designed to test the integrity of electromechanical or coax relay devices. The system may be configured for multi-terminal testing right from the main station and the PC.

    With production and final test in mind, the 303-Relay Test System can perform an array of tests and control device output binning in a fraction of the time of any other tester on the market.

    Under program control, the test system can test:
    * Pull In/Drop Out
    * Contact Voltage Drop
    * Insulation Leakage
    * Variable AC Coil Frequency
    * Timing
    * Coil Resistance
    * Semiconductor
    * Isolation
    * Contact Resistance
    * Dielectric Withstanding.

    To maximize the system’s resources, multiple switching cards can be configured for additional test terminals (subject to space) allowing an operator to test at one site while prepping another. This helps to maximize the use of the system. In this configuration, each terminal may test the same or a different relay part.
    SemiTek International
  • Cadex C8000 - Advanced Programmable Battery Testing System The Cadex C8000 Series Battery Testing System (400W) is a high-performance battery-testing device designed specifically for battery research and product test laboratories. Four independent battery service channels with 4-wire battery test cables. Programmable battery ports enable automatic and manual control. Includes BatteryLab PC software.
    Cadex Electronics
  • Xtramus NuStreams 2000i - Gigabit Ethernet IP Performance Test Systems NuStreams-2000i is an advanced Ethernet test system for Layer 2 to 7 and wire-speed Layer 2 and Layer 3 IP packet generation for testing of multichannel IP devices. Designed for testing in the laboratory and in manufacturing NuStreams 2000 can be easily configured for Ethernet switch, router and gateway production testing. Call for demo.
    Omnicor
  • GF303D-120 - All-in-one test systems Range of the current
    source is 10 mA to 120 A
    Range of the voltage
    source is 10 V to 500 V
    Supplied via test voltage
    with protective earth conductor or mains voltage
    For direct current measure-
    ment up to 500 V / 120 A
    Beijing GFUVE Electronics
  • GF302D-120 - Portable three phase test system with integrated current and voltage source Control of Switching Operations
    With the help of vector diagrams the correct wiring in meter installations is ensured. Errors in the wiring are the most frequently occuring errors and can result in high financial losses at the carriers side.
    Functions
    Vector diagram display of quantities
    Power and energy measurement of active, reactive and apparent energy
    Frequency-, phase angle- and power factor measurement
    Rotary field display
    Network analysis
    Network analysis is for testing the net quality. Interfering sources e. g. can necessitate an extension of the net or lead to wrong measurements.
    Functions
    Distortion factor measurement
    Waveform sampling
    Harmonic waveform analysis for voltage and current up to the 40th THD
    Selective power measurement
    Error measurement under defined load
    With the error measurement the measuring mechanism is tested on correct functioning.
    Functions
    Testing of electricity meter installations with 2-wire, 3-wire and 4-wire circuits
    4 quadrant measurement
    Register measurement under defined load
    With the register measurement the meter's register are tested on correct functioning.
    Functions
    Testing of energy and power registers
    Current and voltage generation
    Functions
    Free programmable load point setting for current and voltage
    Programmable phase shifting from
    0 to 360°
    Programmable frequency
    Programming of balanced and unbalanced load points
    Energy dosage
    Beijing GFUVE Electronics
  • 201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.

    Under program control, the 201.net tests a growing number of devices including:
    * Diodes / Zeners
    * Bipolar Transistors
    * Field Effect Transistors
    * Arrays
    * MOSFET
    * MOSFET Depletion
    * Optocouplers
    * JFet / JFet NO
    * Mechanical Relays
    * Sidac
    * Triac / SCRs
    * IGBT
    SemiTek International
  • Multiferroic and Ferroelectric Test System The Multiferroic is a one of a kind system that has the largest operating envelope in terms of polarization vs frequency. Offering built-in speeds 100KHz @9.9V, 50KHz @30V, 50KHz @100V, 30KHz @200V of with no module changes. This unit is expandable to 10kV. Vision Software is provided with the Multiferroic Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choice from.
    Radiant Technologies
  • RT66B Ferroelectric Test System Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
    Radiant Technologies
  • Xtramus NuStreams 600 - Gigabit Ethernet IP Performance Test System NuStreams chassis NuStreams-600i is an ideal test beds for lab design, troubleshooting and mass production test of network products. Support 10G Ethernet, Gigabit Ethernet, 10/100 Mbps Ethernet, NuStreams-600i provides various interface for different test requirement.
    Omnicor
  • LBT1201 - Lithium-ion battery automatic test system LBT1201 lithium-ion battery automatic test system for the batteries and battery protection circuit of lithium-ion battery characteristics and test requirements, an automatic test system designed for finished lithium-ion battery production testing.
    Acery Technologies
  • Burn-In Test System The Burn-In Test System combines two main ingredients for successful component Burn-In Testing. The first is an environmental chamber for temperature conditioning.
    Thermotron Industries
  • 3300 Series - Mechanical Testing Systems The Instron® 3300 Series of mechanical testing systems provide the simplicity, performance, and affordability needed for quality control and product testing. From routine, standardized QC tests to general purpose mechanical testing, the 3300 family is Instron's affordable solution for the modern laboratory. Learn more about several complete, out-of-the-box testing systems that contain everything you need to begin testing. These pre-configured packages for quick delivery offer special pricing options.
    Instron
  • Sagittarius - Intelligent Parametric Test System STAr Sagittarius revolutionizes the era in semiconductor parametric test and measurement solutions spanning across all semiconductor test needs: Si/GaAs ICs, flat-panel display (FPD), wired/wireless communications components, smart high-power ICs, RFICs, etc. Sagittarius enbles flexible configuration by integrating most parametric instruments and probe stations.
    STAr Technologies
  • T5588 - Memory Test System The T5588 meets such market demands with a maximum testing rate of 800 Mbps and by allowing the simultaneous testing of up to 512 devices. This enables high throughput testing at greatly reduced costs. T5588 is also the first DRAM package tester to offer an optional flash memory test function, making it uniquely adaptable to changing market conditions.
    Advantest
  • AS-200 SpectralShield - Noise and Vibration Test System The AS-200 SpectralShield is a noise and vibration test system that quickly identifies defective products directly on the production line. It is an essential tool that monitors the manufacturing process, increases yields, and tightens product tolerances.
    Alta Solutions Incorporated
  • WiMedia Explorer 300 - MB-OFDM Protocol Test System The WiMedia Explorer 300 is the world's first over-the-air MB-OFDM protocol test system for WiMedia Alliance's Ultrawideband common radio platform, Wireless USB protocol and Bluetooth®.
    Ellisys Sàrl
  • T6372/6362 - LCD Driver Test System Achieves simultaneous testing of up to four devices, and are capable of testing driver ICs with 10-bit resolution (1024 gradations). The T6372/6362 are the newest LCD driver test systems capable of testing at with high throughput, with and high accuracy, at low cost.
    Advantest
  • DVS5100 - Automatic Drive Test System The DVS5100 is a por table Digital Wireless and Television Signal Mapping System with a swept spectrum display.
    Z Technology
  • FTS-HD - High Capacity Force Test System The FTS-HD is a high capacity force test system engineered for precise & repeatable measurements of push or pull forces up to 1000lbs. A smooth operating turn-wheel provides a precise 0.1" travel per revolution. The FTS-HD heavy duty construction provides repeatable and reliable testing for many years. The FTS-HD features adjustable height ranges, customizable lengths (for different sample sizes) and an option for a digital length/height meter.
    Checkline
  • MTS1000i - Mixed Signal Test Systems The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
    Applied Test Resources

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Test Systems - A group of interoperable devices whose integration perform a common test purpose.