Test Systems

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  • ME78070A - Protocol Conformance Test System The ME78070A Protocol Conformance Test System supports Inter-RAT handover between TD-SCDMA and GSM mobile terminals. It complies with the requirements of 3GPP RAN-WG5 TS 34.123 and GERAN-WG3 TS 51.010. The system platform is configured from hardware including a signalling tester, software for creating and executing test cases, and a number of standard 3GPP-compliant test cases.
  • LCII Ferroelectric Test System Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
    Radiant Technologies
  • PHG 70 and PHG 80 - High Voltage Testing System PHG With the PHG TD / PD a multifunctional cable test and diagnostic system is available that has been specially designed and developed for medium voltage networks. The PHG TD/PD system ¡s the only cable test and diagnostic system with which a comprehensive complete overview on the quality and ageing of the test sample is obtained. The TD and PD diagnostic methods complement each other ideally; on the one hand, the general condition of the sample can be determined, and on the other hand, individual faults are located.
    HV Technologies
  • Model 3250/3252/3302 - Transformer Test System / Component Analyzer Test frequency: 20Hz~200kHz/1MHz, 0.02% accuracy
    Basic accuracy: 0.1%. Different output impedance modes, measurement results are compatible with other well-known LCR meters. Enhanced Turn Ratio measurement accuracy for low permeability core. Fast Inductance/ Turn Ratio measurement speed up to 80 meas./sec. Fast DCR measurement speed up to 50 meas./sec.
    Chroma ATE
  • Gas-insulated AC Test System The test system is used to do AC voltage withstand test and PD measurement for high voltage insulation products, combined electrical equipment, instrument transformers, etc.
    Yangzhou Power Electric
  • RT66B Ferroelectric Test System Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
    Radiant Technologies
  • ATS0408 - 8 ch x 4.25 Gb/s Automated Test System Fully Automated test systems for 8 channel SFP transceivers with GUI. All functional cards are built in standard 19" sub rack mount including: · AC power supplier / main processor · 4.25 Gb/s BERT / reference SFP board · Optical power meter/attenuator/ splitter · 1x8 optical switches · 8 channel SFP board (TB0408) Stack up to 64ch by using 8 x 8ch test board. Customized full automation test program is available for SFP with MSA compliant test.
    Raybit Systems
  • ECOETS - Enhanced Common Emitter Test System The Enhanced Common Optical Emitter Test System (ECOETS) is a compact electronic warfare ultra-violet, infrared (IR) laser and realistic laser simulation electro-optical test unit.
    DRS Technologies
  • Xtramus NuStreams 600 - Gigabit Ethernet IP Performance Test System NuStreams chassis NuStreams-600i is an ideal test beds for lab design, troubleshooting and mass production test of network products. Support 10G Ethernet, Gigabit Ethernet, 10/100 Mbps Ethernet, NuStreams-600i provides various interface for different test requirement.
  • DO-254/CTS™ - FPGA Test System DO-254/CTS™ is a fully customized hardware and software platform that augments target board testing to increase verification coverage by test and satisfy the verification objectives of DO-254/ED-80. The target design runs at-speed in the target device mounted on the custom daughter board. The simulation testbench is used as test vectors to enable requirements-based testing with 100% FPGA pin-level controllability and visibility necessary to implement normal range and abnormal range tests.
  • 303 Series - Relay Test System The SemiTek 303-Relay Test System is PC-based and designed to test the integrity of electromechanical or coax relay devices. The system may be configured for multi-terminal testing right from the main station and the PC.

    With production and final test in mind, the 303-Relay Test System can perform an array of tests and control device output binning in a fraction of the time of any other tester on the market.

    Under program control, the test system can test:
    * Pull In/Drop Out
    * Contact Voltage Drop
    * Insulation Leakage
    * Variable AC Coil Frequency
    * Timing
    * Coil Resistance
    * Semiconductor
    * Isolation
    * Contact Resistance
    * Dielectric Withstanding.

    To maximize the system’s resources, multiple switching cards can be configured for additional test terminals (subject to space) allowing an operator to test at one site while prepping another. This helps to maximize the use of the system. In this configuration, each terminal may test the same or a different relay part.
    SemiTek International
  • EMC / RF Test System Engineering / Development & Integration Anechoic chamber, radio isolation room construction, removal, maintenance and repair. System Integration of complete Test System. Development team has the expertise and technical experience and provide a customized service demand, the project includes a full range of EMI / EMS / RF test equipment with neighboring sell and repair
    EMC Instruments
  • RMZ-342 - Bare Board Test Systems Double-jaw stacker with PASS, NG stage. Cam-operated jaw stacker to handle boards with seams. Includes a manual fine-tuning mechanism for upper and lower fixtures. Features an upper-fixture opening/closing mechanism. RM571 (or RM522) fixture installable 
  • 201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.

    Under program control, the 201.net tests a growing number of devices including:
    * Diodes / Zeners
    * Bipolar Transistors
    * Field Effect Transistors
    * Arrays
    * MOSFET
    * MOSFET Depletion
    * Optocouplers
    * JFet / JFet NO
    * Mechanical Relays
    * Sidac
    * Triac / SCRs
    * IGBT
    SemiTek International
  • Xtramus NuStreams 2000i - Gigabit Ethernet IP Performance Test Systems NuStreams-2000i is an advanced Ethernet test system for Layer 2 to 7 and wire-speed Layer 2 and Layer 3 IP packet generation for testing of multichannel IP devices. Designed for testing in the laboratory and in manufacturing NuStreams 2000 can be easily configured for Ethernet switch, router and gateway production testing. Call for demo.
  • NSG 4070 - EMC Immunity Test System An advanced combination of signal generator and compact immunity test system. Its large frequency range from 9kHz to 1GHz and its modular set-up using internal or external amplifiers enable a large variety of applications including tests according to IEC 61000-4-6, various BCI applications as well as signal generator and power meter for test systemsas per IEC 61000-4-3, IEC 61000-4-20, IEC 61000-4-21 and many other applications.
    Teseq AG
  • Isolator Test System The Isolator Test System is designed to test Isolators as per IEC for routine tests and final acceptance. Analysis of test results provides information which is useful for evaluating and rectifying settings for contact timings, closing and opening angular movement, angular speeds, over-travel and rebound etc.
    Crest Technology
  • GS-9000 - A-GPS Design Verification Test Systems The GS-9000 is a scalable test system built on the 8960 wireless communications test set for testing Assisted GPS (A-GPS) capabilities in mobile devices and chipsets – ensuring A-GPS devices operate as expected in cellular networks without interfering with existing network operation. The GS-9000 family of test systems includes two design verification solutions, one for bench top functional test and another for pre-conformance test. Both test systems are based on test cases defined in 51.010 and 34.171.
    Keysight Technologies
  • LB302 - Test system The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The 'device under test' (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance. Every new test system has the same pinning as it was defined during the process of standardization. This allows it to perform a self-test using a special adapter. In addition, it is also now possible for the adapter manufacturer to build a DUT adapter without knowledge of the test system.
    Computer Gesteuerte
  • AC TOV Test System Application The equipment can be operated as power source to simulate the overvoltage/current as it is occurred in the system. This equipment is mainly used for SPD TOV test caused by the failure in voltage system. It can be also used in other scientific research.
    Shanghai GrandTop
  • JFD-251 - Partial discharge test system Detection method based on RSJFD system is a current pulse method is widely used in the world, its basic principle diagram: a partial discharge test, test voltage change U Cx generated at both ends of the instantaneous, through the coupling capacitor Ck coupled to the detecting impedance Zm, circuit generates pulse current of I, the pulse voltage and current I by detecting the impedance of Zm sampling, amplifying and display processing, parameters can be measured partial discharge load discharge quantity. Pulse current method mainly uses the low frequency part of the partial discharge signals in the spectrum, can avoid the wireless interference.
    Wuhan Rising Electric
  • UNIMET 4000 - Bench top test system UNIMET 4000 is a next step further and allows the use of all basic features and test adapters as UNIMET 3000 but extends its capabilities to allow testing more complex mixed-signal devices with advanced digital interfaces. Its advanced high speed serial bus enables to shorten the test time which makes it ideal for low volume production.
    UNITES Systems A.s.
  • 5225 - WLAN Access Point Testing System   ETS-Lindgren's Model 5225 WLAN Access Point Testing System allows the operator to conduct Over-The-Air (OTA) testing of Access Point transmission and receive its throughput performance.  
  • CT6001S - HIGH VOLTAGE CYANOGEN TEST SYSTEM The CT6001S will provide the best possible picture of your process. Not only will each individual bulb be tested, but also the collected data will provide information about the performance of your equipment for analysis and correction of any equipment malfunction. Process inconsistencies will be obvious.
    T&C Power Conversion

Results 1 - 24 of 2050

Test Systems - group of interoperable devices whose integration perform a common test purpose.