303 Series - Relay Test System The SemiTek 303-Relay Test System is PC-based and designed to test the integrity of electromechanical or coax relay devices. The system may be configured for multi-terminal testing right from the main station and the PC.

With production and final test in mind, the 303-Relay Test System can perform an array of tests and control device output binning in a fraction of the time of any other tester on the market.

Under program control, the test system can test:
* Pull In/Drop Out
* Contact Voltage Drop
* Insulation Leakage
* Variable AC Coil Frequency
* Timing
* Coil Resistance
* Semiconductor
* Isolation
* Contact Resistance
* Dielectric Withstanding.

To maximize the system’s resources, multiple switching cards can be configured for additional test terminals (subject to space) allowing an operator to test at one site while prepping another. This helps to maximize the use of the system. In this configuration, each terminal may test the same or a different relay part.

NT 730 LT - Mobile Cable Testing System The "All-in-One" Trolley. Moble testing system in trolley case. Integration of functional test possible. Storage compartment for notebook and accessory. Application specific interfaces and equipment. At this time, this item is sold only in Europe.
Scope of Functions. No. of test points: max. 1024
Low voltage test: max. 40 VDC / 2A
4-wire measurement
High voltage test: max. 1500 VDC / 1050 VAC
24 - 28 VDC functional test

F-20E - Microclimate, SSD Test System The F-20E is a microclimate, SSD Test System made for reliability and qualification testing. The F-20E is a mobile chamber that will start and manage device tests, synchronize temperature/humidity, organize test history and results and provide direct device access for deep analysis and trouble shooting.

NSG 4070 - EMC Immunity Test System An advanced combination of signal generator and compact immunity test system. Its large frequency range from 9kHz to 1GHz and its modular set-up using internal or external amplifiers enable a large variety of applications including tests according to IEC 61000-4-6, various BCI applications as well as signal generator and power meter for test systemsas per IEC 61000-4-3, IEC 61000-4-20, IEC 61000-4-21 and many other applications.

RT66B Ferroelectric Test System Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.

S-100 - Fiber Optic Test System The frame of FOTS system consists of the Main control part and the Slot mounting part. The Main control part is in charge of control and interface of the system and the Slot mounting part can hold up to maximum 8 slots, which are modularized according to each function and come out in five kinds. This integrated test system is designed to help manage the test and measurement related to optical communication and component.

Xtramus NuStreams 2000i - Gigabit Ethernet IP Performance Test Systems NuStreams-2000i is an advanced Ethernet test system for Layer 2 to 7 and wire-speed Layer 2 and Layer 3 IP packet generation for testing of multichannel IP devices. Designed for testing in the laboratory and in manufacturing NuStreams 2000 can be easily configured for Ethernet switch, router and gateway production testing. Call for demo.

K-7000 - PCBA Auto Test System Analyze LVDS Quad signal Input signal data bit : Max. 10bits Analog audio input range : 200mVpp to 10Vpp Analog audio test : Speaker, Ear phone Digital audio test : Optical, Coaxial Digital audio sampling frequency : 32KHz, 44.1KHz, 48KHz

201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.

Under program control, the 201.net tests a growing number of devices including:
* Diodes / Zeners
* Bipolar Transistors
* Field Effect Transistors
* Arrays
* MOSFET
* MOSFET Depletion
* Optocouplers
* JFet / JFet NO
* Mechanical Relays
* Sidac
* Triac / SCRs
* IGBT

TCIII-1333ST - Multi-Site Test System High-end ATE's are designed to detect functional and AC/DC parametric failures but cannot identify or pinpoint potential in-system failures. Most in-system failures are a result of functional and timing compatibility issues that are generated by the system chipset. Many in-system device failures occur during system boot up or during performance of a specific operation within a given system.

LCII Ferroelectric Test System Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.

Vehicle Mobile Communications Test System Designed to make both far-field and near-field measurements on automobiles and trucks, the Mobile Communications Test System is a central component of the multipurpose Antenna Range Complex. The measurement system uses a distributed axis positioning system. The probe antenna is mounted on a lightweight yet very strong dielectric boom that moves in theta. The vehicle drives onto a large azimuth positioner that provides the rotation in phi.

BRAT Option B520-50 - Radio Test System 1 KW Programmable Power Supply

Smart II - Smart Fuel Cell Test System The SMART II is very compact, however, fully automated and integrated at a very attractive price. Our control and measurement software with powerful graphical user interface makes you easy to operate the SMART II. With the exceptional features of the SMART II, you can digitize your fuel cell economically and evaluate it easily.

BK9010B - C-Mic Auto Test System Based on the BK3010 C-Mic Tester, the BK9010B is our fastest C-mic test system. Fully automatic, with 4 or 8 couplers and test time of about half a second, you can test and sort 80 C-mics per minute — 4800 per hour, or upwards of 3 million C-Mics per month (based on 6s total cycle time)! The robotic loader lines up the microphones and loads them onto the couplers for testing. Then it sorts passing microphones into 8 quality classes and failing microphones according to the reason they failed.

Fuel Cell Test System The LXinstruments Fuel Cell Test System uses standard equipment from Agilent Technologies together with proprietary software to provide a fully modular and affordable system for making EIS measurements allowing you to characterize your fuel cell designs in both stacked and segmented configurations

Max 450 - Low Voltage Burn-in and Test System For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in

50PMA-030 - Transceiver Test System Impedance 50 Ohms Configuration 8 Port Test System dB Total 127 dB dB Step 1 dB Frequency Start 200 MHz Frequency Stop 2500 MHz Control Ethernet Manual RS-232

3360-D VLSI - Test System 50 Mhz clock rate,64 I/O channels Up to 8 sites Parallel testing Support full rang AC Inlet & Small footprint Flexible Architectures: Slot interchangeable I/O, ADDA, VI option Your Dream Platform for Various Types of Devices.

T5831/T5831ES - Memory Test Systems Next-generation NAND Flash memory and managed NAND devices, including embedded multi-media cards (eMMC), are playing increasing roles in driving the performance of SSDs and mobile electronic devices. These applications require continued increases in density and performance while demanding higher quality and reliability. To keep pace, NAND manufacturers are developing innovative, new technologies, requiring more test coverage while driving up the cost of test. Managing these testing costs requires a low-cost production test solution with NAND-specific features to increase yield and improve throughput.

8800 Controller - Controllers for Dynamic and Fatigue Testing Systems An 8800 controller is a state-of-the-art, fully digital servohydraulic controller that utilizes Instron® core technologies and is capable of running static and dynamic tests. Console software provides the main interface to the 8800 controller or a hardware operator panel provides an alternative.

PN9000 - Phase Noise Test System The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a compact instrument.