Test Systems

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  • Xtramus NuStreams 600 - Gigabit Ethernet IP Performance Test System NuStreams chassis NuStreams-600i is an ideal test beds for lab design, troubleshooting and mass production test of network products. Support 10G Ethernet, Gigabit Ethernet, 10/100 Mbps Ethernet, NuStreams-600i provides various interface for different test requirement.
    Omnicor
  • GPM - DC test system The modular DC test system saves time, costs and space. It can be used in factory testing and is also available for on-site testing with container and trailer solutions to assure a short assembly and disassembly. An in the DC module integrated voltage divider enables the space saving design and due to the modular design the test system is extendable to higher voltages later on.
    Highvolt Prüftechnik
  • 201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.

    Under program control, the 201.net tests a growing number of devices including:
    * Diodes / Zeners
    * Bipolar Transistors
    * Field Effect Transistors
    * Arrays
    * MOSFET
    * MOSFET Depletion
    * Optocouplers
    * JFet / JFet NO
    * Mechanical Relays
    * Sidac
    * Triac / SCRs
    * IGBT
    SemiTek International
  • RT66B Ferroelectric Test System Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
    Radiant Technologies
  • Series 3650 - Primary Cell Test System The Multifunction Series 3650 primary cell test system is a versatile tester engineered to meet the demands of existing and upcoming ANSI and IEC primary cell tests. Each test position operates independently of all other test positions and has a dynamic range to ANSI and IEC standards of current|power|resistance of over 25,000 to 1.
    Maccor
  • HP8000E - Colorimetric & Electrical Test System for LED Chips Colorimetric & Electrical Test System is very useful property to identify the quality of LED Chips by measuring the photometric, colorimetric and electrical parameters of LED Chips. This test system is composed of spectrometer, test table and electrical measuring instrument. LED chips test table has movement mechanism (size: 75mm*75mm), probe, optical fiber and microscope (40X) devices, can lighten the various LED chips fleetly and stably.
    Hopu Optics Technology
  • PXI - Test System We provide a complete PXI test system made by PXI individual components: 19'' rack, Measuring and stimuli cards, Relay cards, Power Supplies, Integration additional protocol cards such as CAN and CANopen, Boundary Scan, Integration of additional test hardware
    Toptest GmbH
  • ATS-UKMFT 627 - New Combined In-circuit-Function Test System The basic version of the combined In-circuit-function test comes with 32 bi-directional logic channels, 32 multi-matrix channels and 128 In-circuit- and function measuring channels (expandable to max. 608). Its in-circuit- and function measuring unit has more than 60 measuring ranges incl. transient recorder functions and Fourier analysis. 2 programmable, complementary twin PSUs, 0 to 24 V, supply the DUT and stimulate signals as does the sine and squarewave generator. This test system is also available with an integrated test fixture (working area 192 x 172 mm) for precise contacting of the PCB. For measuring in new test programs it can be tilted up when closed with the contacted DUT.
    Reinhardt System-
  • NSG 4070 - EMC Immunity Test System An advanced combination of signal generator and compact immunity test system. Its large frequency range from 9kHz to 1GHz and its modular set-up using internal or external amplifiers enable a large variety of applications including tests according to IEC 61000-4-6, various BCI applications as well as signal generator and power meter for test systemsas per IEC 61000-4-3, IEC 61000-4-20, IEC 61000-4-21 and many other applications.
    Teseq AG
  • Test Systems for the Automotive Industry Systems in automobile technology are becoming more and more complicated and demand special and more intelligent production and testing technologies, so that forward-pointing product quality enables steps towards a decisive market lead.
    Vogelsang & Benning
  • AC2010 - Digital PLC Control Console for AC Test System Himalayal AC2010 is advanced digital PLC control and measuring console. The programme is special designed for high voltage test. The console adopt windows operation software, industrial personal computer. User can realize manual or automatic control with this console.
    Shanghai Himalayal
  • Xtramus NuStreams 2000i - Gigabit Ethernet IP Performance Test Systems NuStreams-2000i is an advanced Ethernet test system for Layer 2 to 7 and wire-speed Layer 2 and Layer 3 IP packet generation for testing of multichannel IP devices. Designed for testing in the laboratory and in manufacturing NuStreams 2000 can be easily configured for Ethernet switch, router and gateway production testing. Call for demo.
    Omnicor
  • 303 Series - Relay Test System The SemiTek 303-Relay Test System is PC-based and designed to test the integrity of electromechanical or coax relay devices. The system may be configured for multi-terminal testing right from the main station and the PC.

    With production and final test in mind, the 303-Relay Test System can perform an array of tests and control device output binning in a fraction of the time of any other tester on the market.

    Under program control, the test system can test:
    * Pull In/Drop Out
    * Contact Voltage Drop
    * Insulation Leakage
    * Variable AC Coil Frequency
    * Timing
    * Coil Resistance
    * Semiconductor
    * Isolation
    * Contact Resistance
    * Dielectric Withstanding.

    To maximize the system’s resources, multiple switching cards can be configured for additional test terminals (subject to space) allowing an operator to test at one site while prepping another. This helps to maximize the use of the system. In this configuration, each terminal may test the same or a different relay part.
    SemiTek International
  • EMC / RF Test System Engineering / Development & Integration Anechoic chamber, radio isolation room construction, removal, maintenance and repair. System Integration of complete Test System. Development team has the expertise and technical experience and provide a customized service demand, the project includes a full range of EMI / EMS / RF test equipment with neighboring sell and repair
    EMC Instruments
  • PD Smart - Partial Discharge Test Systems Digital, highly advanced, multi-purpose and smart Partial Discharge and Diagnostics System
    HV Technologies
  • LCII Ferroelectric Test System Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.
    Radiant Technologies
  • TS8996 - RSE Test System The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission tests on wireless devices. The test system is often combined with a semi-anechoic or fully-anechoic chamber. The high-sensitivity filters are contained in modular shielded units, eliminating the need for a shielded control-room.
    Rohde & Schwarz GmbH
  • 341-TT/P,351-TT/P - Parallel Test Systems for Power Devices The 341-TT/P and 351-TT/P have a capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
    TESEC
  • Reflex 40 - Stick and Miss Relay Test System The Reflex 40 is a highly customisable Stick/Miss test system based on the modular Reflex architecture. The system can be configured to automatically monitor both the Pull-in/Drop-out voltage and Stick/Miss performance of up to 128 contacts.

    See also Reflex 51.
    Applied Relay Testing
  • PHG 70HB - High Voltage Testing System * Unique top class VLF test generators * For medium-voltage cables up to 50 kV * Latest testing technology VLF truesinus® * Fully automatic programmable test sequences * Accurate, quick cable testing in accordance with standards * Possibility for installation in a small vehicle * Extendable to dissipation factor and partial discharge diagnostics systems
    BAUR Prüf- Und Messtechnik
  • Relay Master - Automated Relay Test System Relay Master is an automatic relay test system capable of testing from one to 64 relays simultaneously without having to remove them from the rack.  System automation improves efficiency and reduces track time requirements.  The PC-based system stores test parameters and results in a database for ease of reliability and trending analysis. 
    Ultra-Tech Enterprises
  • Vacuum Contactor Test System The Vacuum Contactor Test System is designed to test Vacuum Contactors for routine tests for final acceptance. Analysis of test results provides information which is useful for evaluating and rectifying settings for contact timings, closing and opening speeds, travel, rebound, etc.
    Crest Technology
  • AMATS - Advanced Modularized Automatic Test System Open Architecture : The test system uses the standard instruments with VXI or GPIB interface. It won’t affect the kernel function if any instrument is added or removed due to requirement changes from customers.
    Wellring Technology
  • T5503HS - Memory Test Systems With today’s mobile electronic devices and the servers that support them handling ever-increasing volumes of data, semiconductor memory manufacturers need a highly capable, cost-efficient means of testing their latest generations of high-speed, high-capacity memory ICs – including emerging DDR4-SDRAM and LPDDR4-SDRAM chips. Advantest’s T5503HS tester gives memory manufacturers that industry-leading performance and a low cost of test along with an upgradeable system design.
    Advantest

Results 1 - 24 of 2026

Test Systems - group of interoperable devices whose integration perform a common test purpose.