- InterWorking Labs, Inc.
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TCP Tests
The Maxwell Pro TCP Test Suite is used by design engineers, quality assurance engineers and testers to find and fix bugs in their TCP stack or engine. The tests help ensure that the TCP stack is sufficiently robust so that it is not vulnerable to the wide range of attacks in today's Internet. The tests make use of the Maxwell Pro network emulation environment, so that each test sequence can intelligently impair all aspects of the TCP protocol.
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1Gsps, 18 Channel, Logic Analyzer with Protocol Analyzer plugins and Hardware Compression
DigiView™ DV518
- Physical Channels: 18- Sample rate: 4ch@1 Gsps or 9ch@500Msps or 18ch@1Gsps (4 ch. are sampled every 1ns or 9 ch. are sampled every 2ns or 18 ch. are sammpled every 4ns)- Typical capture: 100M transitions (> 1B samples)- Hardware based triggers with 8 universal match circuits, and partitionable 16 stage sequencer- Adjustable Threshold (± 4V)- Real-time, Hardware-based, Adaptive Compression- Channels protected to ± 20V- Ground leads protected to ± 12V- High-quality test leads: 66 strand soft...show more -
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Automated DC Parametric Curve Tracer
MultiTrace
MultiTrace curve tracer is a mid-sized benchtop model supporting pin counts from 216-625 pins and includes the PGA-625 fixture as a standard interface. MultiTrace supports a wide range of test applications: Failure analysis, Reliability testing, Counterfeit device analysis, Nondestructive electrical counterfeit test, Opens, shorts leakage testing (OSL), Post decap electrical inspection, Optical fault localization, ESD testing, Latch-up testing, Supply current measurements, and more!
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Ohm-Stat Deluxe Combo Data Logger Tester
ISO-9000 conformance: no more log booksResults automatically entered onto a computerAutomatically stores results for 50,000 employeesIncludes ESD protection test log software: free upgrades foreverCE mark, NIST listedTests heelgrounders and wriststraps in 3 sec individually and simultaneouslyBarcode, mag stripe, proximity meter availableResults can be emailed and/or networkedAdjustable limits9v battery or 110/220v powered
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Transient Suppression for Corelis JTAG Controllers
TAP Protection Adapter
Transient events such as Electrostatic Discharge (ESD), inductive switching, and lightning can damage electrical equipment, leading to costly repairs and test equipment down-time, reducing production capacity and increasing time-to-market.The Corelis TAP Protection Adapter is designed to enhance protection to any Corelis JTAG controller, shielding against harmful events using a combination of electrical defenses.The compact adapter features series resistors and transient voltage suppressor (TVS) diodes to mitigate damage to the JTAG controller. Protect your investment and enjoy peace-of-mind with the TAP Protection Adapter.
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ESD Tester
Tokyo Electronics Trading Co., Ltd.
Is performed to test the susceptibility of ICs and electronic devices to ESD.
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ESD & Latch-Up Test Service
MASER Engineering has automatic test equipment for the most common ESD test pulse models. MIL - JEDEC - ESDA - IEC standards. IC level Human Body Model. IC level Machine Model. IC level Charged Device Model. System level IEC 61000 HBM. AEC-Q100 Field Induced Gate Leakage test. Static Latch-Up test. Dynamic Latch-Up test.
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Wrist Strap Tester
Statclean Technology (S) Pte Ltd
ESD wrist strap is most commonly used protective devices which prevent the build-up of electrostatic charge on personnel. The random failure of wrist strap compromises the protection. Thus, it is important to test every wrist strap regularly.
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Electrostatic Discharge
Our electrostatic discharge (ESD) measurement and control solutions include charge plate monitors, sensors, resistivity meters, and voltmeters. Reliably monitor, measure, locate, and test for static electricity.
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ESD & Latch-Up Test System
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Electrostatic Discharge Simulator
ESD61000-2
ESD simulator (Electrostatic Discharge Generator or Electrostatic Gun) is in full compliance with IEC 61000-4-2, EN61000-4-2, ISO10605, GB/T17626.2, GB/T17215.301 and GB/T17215.322. The ESD generator is designed for the assessment of electrical and electronic equipment to withstand ESD performance. ESD61000-2/ESD61000-2A has LCD display in both English and Chinese, they equipped with an infrared remote control which can allow you do the test in some special place.
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PRODUCTS TESTING
ESD
MicroStat Laboratories -R.E.T.S.
Our ESD test capabilities include resistance, resistivity, electrostatic shielding, charge generation, and charge dissipation. We routinely test flooring materials, packaging, footwear, garments, ionizers and many other ESD control products and materials. We utilize the relevant test methods and standards of the ESD Association, ANSI, ASTM, NFPA, IEST, IEC, AATCC, or our clients’ in-house specifications.
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Digital/Analog Audit Kit
Botron's Digital/Analog Audit Kit insulation and continuity tester is designed for electrical testing. The wide range of test voltages makes the Audit Kit ideal for users involved with ESD testing. The kit gives greater functionality with simplified operation and an ergonomically designed case.
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LED Tester For Ultra High Power
Electrical Testing: Forward：VF、DVF、VFD、IF、DIF Reverse：VZ、DVZ、IR、DIR AC：VAC、IAC、WAC、PFOptical Testing: can test LOP in cd/mcd/W/mW/lm... from different optical components Wavelength λp,λd,λc,hw,purity,(x,y),CCT,CRIFour-wire measurement and contact resistance in case of deviation. Auto polarity identification and preheat function.Compatible mechanical interface.Optional ESD static test system.
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Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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20KV 30KV Electrostatic Discharge ESD Simulator
20KV/ 30KV Electrostatic Discharge ESD Simulator
Shenzhen Chuangxin Instruments Co., Ltd.
ESD simulator (Electrostatic Discharge Generator or Electrostatic Gun) is in full compliance with IEC 61000-4-2, EN61000-4-2, ISO10605, GB/T17626.2, GB/T17215.301 and GB/T17215.322. The ESD generator is designed for the assessment of electrical and electronic equipment to withstand ESD performance. ESD-0230/ESD-0220 has LCD display in both English and Chinese, they equipped with an infrared remote control which can allow you do the test in some special place.
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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DUT Boards
RTI designs and manufactures DUT boards for many types of special purpose test equipment including: ESD test systems, special purpose functional testers, automated curve trace equipment, as well as standard semiconductor test equipment. All designs are performed in-house using PCB design software (Mentor PADS, CAM350) and 3D mechanical design software (Solid Edge) if required. PCB fabrication is sub-contracted to one of our long-time fabrication partners.
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Wide Range Ohmmeter
PAS-853B
- Wide Resistance Measurement Range from 0.01 ohm to 9.99x1012 ohms- Nominal Full Range Tolerance Averages <±5%- Fully Automatic Resistance Range, Test Voltage and Electrification Period Control- Automatic or Continuous Electrification ControlRugged High Performance 80 inches (200cm) Test Leads Included- Powered by one long lasting 9V Alkaline Battery- Large, Easy to Read LCD Display- Meets requirements of ESD Association Standards for material and audit resistance measurement requirements- Certificate of Calibration Traceable to NIST included
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ESD Wrist Strap & ESD Heel Strap (Footwear) combination Tester
ESD Wrist Strap and ESD Footwear being the front line defense against electrostatic build-up on the human body, must remain electrically perceptive for the user. Thus, it is very important to test every wrist strap and heel strap regularly. This combination Tester does the job efficiently without the hassle of juggling several gadgets.
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1Gsps, 9 Channel, Logic Analyzer with Protocol Analyzer plugins and Hardware Compression
DigiView™ DV509
- Physical Channels: 9- Sample rate: 4ch@1 Gsps or 9ch@500Msps (4 ch. are sampled every 1ns or 9 ch. are sampled every 2ns)- Typical capture: 100M transitions (> 1B samples)- Hardware based triggers with 8 universal match circuits, and partitionable 16 stage sequencer- Adjustable Threshold (± 4V)- Real-time, Hardware-based, Adaptive Compression- Channels protected to ± 20V- Ground leads protected to ± 12V- High-quality test leads: 66 strand soft copper wires, flexible insulation, and gold pla...show more -
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Optically Isolated Measurement System
IsoVu
IsoVu offers complete galvanic isolation and is the industry’s first measurement solution capable of accurately resolving high bandwidth, low voltage differential signals in the presence of large common mode voltages. The stand out feature of IsoVu™ is its best in class common mode rejection across the entire bandwidth. Accurate differential measurements rely on a measurement system’s bandwidth, rise time, common mode voltage, common mode rejection capability, and the ability to connect to small...show more -
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PCI Bus Analog Output Board, 4 Isolated Outputs, 14 Bit
APCI-3501-4
4 analog output channels Optical isolation 500 V Settling time 30 µs typ. 14-bit resolution (13 bit for 0-10 V) Output voltage: ±10 V, 0-10 V (switchable through software) Output voltage after reset: 0 V Each output channel has its own ground line (without optical isolation from the others) Driver capacity: 5 mA/500 pF Short-circuit protection, EMI filters Noise neutralization of the PC supply Creeping distance: 3.2 mm acc. to DIN VDE 0411-100 Watchdog for resetting the analog output channels (4...show more -
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Ohm-Stat Ground/Circuit Tester to Test ESD Ground
Tests ground for all 110v electrical circuitsWill determine the status of all electrical groundsEasy to use LED lightsWarranteeProduct conforms to the ESD S.20.20 spec standardsIdentify electrical problemsUsed with the Ohm-Stat RT-1000 resistivity meter
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ESD Latch Up Tester
1100-ESD
Tokyo Electronics Trading Co., Ltd.
The Model 1100-ESD can easily and accurately perform ESD tests (HBM, MM) on ICs up to 64 pins. Also, all common pin combinations required by the standard can be realized.
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Ohm-Stat Guardian Constant Monitor
Tests one person and one wriststrapRed and green LED and fail buzzerNIST calibration includedWorks with single wire capacitance wriststrapsCE markCan be calibrated110v AC adapter or 9v battery poweredIdeal for in plant or field service workProduct conforms to the ESD S.20.20 spec standardsGround dock includedLow cost
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Shoes and Wrist Strap Tester
WST100
• Tester designed for checking the conformity of operators wrist strap and/or shoes to the ESD protection standard.• It is also designed to be permanent wall mounted in a production facility for daily testing of employee’s wrist straps and footwear.• Easy to operate, red and green LEDs give clear “pass” or “fail” indication• Individual tests for the wrist strap, the right and left shoe• Can register up to 60 000 different measurements• Output for interface with PC or automatic door opening system• Operates battery that can be supplemented with an AC net adaptor• Tester and calibration plug are delivered with a certificate ofcalibration
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ESD Test Simulator
ONYX16
The ONYX is a state of the art electrostatic discharge simulator available in 16kV or 30kV versions. It is the most ergonomic 30kV ESD gun without an additional base control unit that can be battery or mains operated. The easy to use touch screen, ergonomic design, modular RC units, multilingual interface, remote control software, built-in LED light and temperature & humidity display allows for trouble-free use of the ONYX in all types of test sites.
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Decay Accessory Set
PGB-745
- Designed for measuring charge movement and decay time of ESD controlled materials- The set consists of two stainless steel electrodes and two very high resistance test leads selected for this application- The high resistance leads minimize leakage during the test cycle and are equipped with male banana plugs
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Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
