DARE!! Instruments invented the LASER powered E-field probe, called the RadiSense, back in 1999. This caused a major change in measuring accurate fieldstrengths during radiated susceptibility testing. The fact that the E-field probe is undependent of an internal battery, because the field probe electronics is powered by LASER, had another advantage; that the size of the field probe could be much smaller. A smaller field probe volume automatically means that it measures more accurately.
The 100A is a small, handheld magnetic field probe ideal for locating the sources of EMC emissions. Its integrated electrostatic shield offers good common-mode rejection, and its fine spatial resolution make it easy to track a source of emissions down to the offending component.
The 100C magnetic field probe has the largest loop of any probe in the series. It has the best sensitivity of the magnetic field probes. Because the large size of the loop, its high-frequency response and spatial resolution are not as good as the 100A and 100B.
The 100B magnetic field probe has the smallest loop of any probe in the series. It offers the best spatial resolution and high-frequency response of the magnetic field probes, but has lower sensitivity than the 100A or 100C.
The 101A probe set contains one each of the 100A,B,C, and D probes. The three loop probes are sensitive to magnetic fields. They have different diameters, so that the user can select the optimal probe for the frequency of interest. The 100D stub probe is sensitive to electric fields, and offers the best spatial resolution of all.
The 100D is an electric field probe, unlike the 100A/B/C. It has the best spatial resolution of all the probes. However, because it is an electric field probe, it does not offer the common mode rejection that the magnetic field probes have.
Our EMC probe set allows for straightforward pinpointing and measurement of interference sources in electronic component groups as well as execution and monitoring of generic EMC measurement. Our probe set is especially suitable for: - Pinpointing interference sources. - Estimation of interference field strength. - Verification of shielding and filtering measures- Identifying faulty components. - Detecting circuitry overly sensitive to interference.
With a diverse range of probes with solutions that can meet the challenge of any industry from EMC/EMI to SAR and HAC. APREL is proud to have solutions that can perform from the low Hz to high GHz and offer the choice of custom probes for our automated test system customers.
The H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation. They serve to locate and identify potential sources of interference within the building blocks of electronic assemblies.
The Model 91197-1 and 91197-1L EMC current probes are our most sensitive low frequency probes. The 91550-1 and 91550-1L current probes have have a calibration available down to 20 Hz which makes them ideal test equipment for such test methods as MILSTD-462 CEO1 and RSO1. In particular, the newer CEO1 limits which are dependent on EUT current/voltage requirements are more stringent than the older fixed limit CEO1 requirement
The RF100 probe set consists of a passive E field probe and H field probe, BNC adaptor and carry case. The output is via a BNC socket. These are general purpose probes which are ideal for use in conjunction with an EMC measuring system. They are sensitive to sources in close proximity, but are insensitive to background signals.
The High Resolution EMC Scanner features:25µm resolution. Import 3D surface models. Scanning at a fixed distance from the surface. Calibrate to beacon. Real time inspection camera with 10µm resolution. High resolution near field probes
The CTK probes are powerful diagnostic tools that are an ideal complement to conventional EMC test equipment kits. Their high sensitivity and small tip size ensures accurate location of sources and tracks. The CTK kit comprises two probes, an E field and an H field. Both are self contained compact hand held probes which feature a very small sensing element, high gain amplifier and three outputs.
EMxpert allows you to visualize the root causes of potential EMC and EMI problems in real-time. You get insights about why designs fail, something no chamber can give you. You don't need to wait for chamber time to re-design and test by trial and error. You can now rapidly diagnose even intermittent problems, which may otherwise go undetected when using handheld or automated single probes.
Com-Power model PAP-010 Preamplifier is intended for improving measurement system sensitivity of near field probes. It has a frequency range of 10 to 1000 MHz. It is compact in size and is powered by external DC adapter.
A wide range of accessories such as: Antennas, High Voltage Probes, Absorbing Clamps, Near Field Probes, etc. and other complete the range of products. This will enable the operator to always have the correct set-up for any EMC standard. Several accessories enlarge the capability of the systems in any test condition to offer a useful tool either to achieve the CE mark or for design debugging and pre-qualification testing.
Conducted currents can be measured without making direct contact with the source conductor or metallic surface by means of clamp-on broadband current probes. The BCP-5xx EMC Current Probes are designed to permit field intensity meters, spectrum analyzers, and other 50W impedance instruments to measure quantitative magnitudes of current.