DUT Boards

Automated calibration for all L-series VI instruments. Precision Calibration Loads. Load selection through computer controlled relay matrix. High resolution measure instrumentation. ...more

The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support ci ...more

High-Power Burn-In Up to 150 Watts. Individual temperature control for each device under test up to 150-watts. Programmable temperature control up to 150° C. 800 amps of DUT power available per burn-in board. ASIC architecture for per-pin timing, testing, and formatting of pattern data. ...more

High-Power Burn-In Up to 200 Watts. Individual temperature control for each DUT up to 200 W. Tests devices at a maximum temperature of 150° C. 11 programmable voltage regulators per burn-in board. 800 amps of DUT power available per burn-in board. ...more

The Docking Assembly (DA) is the piece that mounts to the face of your test head. It consists of a plate with a cutout for the load and/or DUT board(s), guide pins, docking cams, and coarse alignment bushings.  ...more

The DBS (DUT Board Stiffener) is designed with ergonomic carrying handles for operator comfort. Each DBS is engraved with an individual Serial Number for traceability. The DBS can be anodized in any color ...more

There are 4 different high-speed Digital I/O cards in the UF2e-7000 range, with the choice of 16, 32 or 64 TTL port widths. Each group of 16 channels can be user programmed as either port input or output. Channel handshaking (changing signal direction online) is not possible. The cards are mainly used for digital recording or test pattern gene ...more

Reliability system capable of testing up to 1152 DUTs at once. Each system can run up to 36 separate experiments at once spread over 12 ovens. Test capabilities include measuring 2, 3, and 4T DUT resistance along with extrusion monitoring. Stress current is up to 100mA at 100V per experiment. Standard load boards and chambers are limited to 40 ...more

Scanner Module - Used by the RI-52 Metal Migration Analyzer to interface between the stress/test instrumentation and devices being monitored in a single experiment. Provides the connectivity from the stress current source to the series connected DUT string on the load boards (supports 1  32 DUT). ...more