Showing results: 1 - 12 of 12 items found.
-
ZEN50 -
Peak Electronic Design Ltd.
The Atlas ZEN is ideal for testing Zener diodes (including avalanche diodes), transient suppressors, LEDs and LED strings.
-
QT-4000 Series -
PowerTECH Co,Ltd.
Discrete device test system is developed for Transistor Diode Zener diode MOS-FET J-FET Current Sence FET IGBT LDO(78XX 79XX Tl431 TL432 regular test) and 4 pin Photoelectric Coupler Wafer etc.
-
Rockwell Automation
Our signal interface products provide signal conversion and electrical isolation between sensors and other field devices and a control circuit. Intrinsic safety modules add Zener diodes, which limit the amount of electrical energy on intrinsically safe circuits.
-
FEC VF40CM -
Frothingham Electronics Corporation
The VF40CM is intended for testing VF, HALF CYCLE SURGE, and THERMAL RESPONSE/RESISTANCE on small- and medium-power diodes and rectifiers. It can also measure THERMAL RESPONSE/RESISTANCE on NPN and PNP bipolar transistors using an external user-supplied VCB supply.The VF40CM also is sometimes used to measure VZ of low-voltage zener diodes up to the compliance voltage limit of the tester. 20V at 20A is possible.
-
Renesas Electronics Corp.
These are the standard reference voltage source widely used by the feedback circuits of switching power supplies. Compared to the Zener diode, which is a discrete product, a shunt regulator has much better voltage precision because voltage control is carried out as an IC.
-
MOSTRAK -
ipTEST Limited
ipTEST's MOSTRAK tester is an Indexed-parallel parametric test system designed to test discrete devices. MOSTRAK can test static, thermal, avalanche and dynamic parameters on MOSFETs, Bipolars, IGBT's, Diodes, Zeners, SCR's, triacs as well as linear voltage regulators and TVS devices.
-
34XX -
FETservice, Inc
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
-
Analog Devices Inc.
Analog Devices offers a broad line of shunt precision voltage references that combine excellent accuracy and temperature stability with low noise and small packages. These devices operate in a manner that is functionally equivalent to a Zener diode. The bias current must be set higher than the sum of the maximum quiescent current of the voltage reference and the maximum expected load current. Since shunt voltage references are typically biased with a resistor, the voltage reference can operate on a wide range of input voltages.
-
TH2689A -
Changzhou Tonghui Electronic Co., Ltd.
TH 2689/TH2689A provides max. test voltage: 800v/500v, charge current: 0.5mA─500.0mA( if >100V, the max. power 50W can limit). It is mainly applied in capacitance leakage current, insulation resistance and aluminum electrolysis capacitance anode foil pressure test. Also it can be applied in the confirmation of annihilator, zener diode, neonbulb .etc and leakage current test. Standard Handler interface, stable and rapid test, to reach the sorting effect
-
36XX -
FETservice, Inc
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
-
Chroma 11200 -
Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.