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C-Mic Interface
BK2015
The BaKo Type BK2015 is a C-microphone interface system designed to work with equipment you already have. It provides power for the microphone and returns the C-mic signal to the connected equipment. If you are setting up an in house mic testing system, the BK2015 can be an integral part.
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Optical Pickup
1037-DTS
TESCO introduces a new optical pickup (Catalog No. 1037-DTS) for one way meter communication through the calibration LED found on most solid state meters. The pickup senses infrared pulses from ANSI compliant meters for complete, automatic testing.
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Voltage Breakdown Testing Machine
DRK218
Shandong Drick Instruments Co., Ltd.
DRK218 breakdown voltage tester is controlled by the computer, through a new smart digital integrated circuits developed by my company and software control system to make the step-up rate is truly uniform, accurate, and be able to accurately measure the leakage current data. Real-time rendering test curve accurate judgment and it can save, analyze and print test data.
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Turns Ratio Testing
Weshine Electric Manufacturing Co., Ltd
1. Full three-phase sinusoidal inverter power output, output voltage is automatically adjusted, with soft start and soft stop functions, so the test speed is fast and the accuracy is high.2. The instrument has single-phase, three-phase, Z-type transformers, voltage transformer ratio, group, polarity test functions.
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Manual Test Press Fixture
750/752 Series
RTI's manual test presses are compact, portable, all-inclusive, and easy to use. Single lever operation and 100% vertical compression makes the manual test press an ideal solution for PCB, hybrid module, and high pin count device-level testing when complex test requirements cannot be met with a test socket and breakout board alone.
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NI-5781 , 40 MHz Bandwidth, RF Adapter Module for FlexRIO
781267-01
The NI‑5781 is an analog dual-input, dual-output FlexRIO adapter module optimized for interfacing with baseband to RF upconverters and downconverters. When you pair the NI‑5781 with a PXI FPGA Module for FlexRIO, the resulting NI‑5781R is an FPGA-enabled reconfigurable I/O (RIO) baseband transceiver that you can use to implement custom RF modulation and demodulation, channel emulation, bit error rate testing, or spectral monitoring and jamming. Additionally, you can use the low latency and high throughput of FPGA‑based processing for ultra‑high‑speed control and inline processing applications.
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Immunity Testing Systems
CIS Series
The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
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Wafer Testing
Trio Vertical
SV TCL's TrioTM is a reliable solution for advanced wafer testing challenges, specifically full array and parallel probing. We offer a complete line of vertical probe card products, each designed for your unique application.
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LXI Reed Relay Matrix - Single 32x16 Plugin, No Direct Y Access, 3 Analog Buses
65-225-102
The range includes four plug-in models covering matrices of up to 1,536x4 in increments of 128 (model 65-221), 768x8 in increments of 64 (model 65-223), 384x16 in increments of 32 (model 65-225), and 192x32 in increments of 32 (model 65-227). Users can specify as many or as few plug-in modules (up to six) required and can field upgrade the chassis to extend the matrix when necessary. Another important feature is that over 1,500 relays can be closed simultaneously for specific conditions for parametric testing.
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External Load Expansion Connector Accessory for USBHub3c
Used for connecting external electronic loads to the USBHub3c for VBUS load testing. It features separate screw terminals for VBUS passthrough from each USB Type-C port (0 through 5). While this board provides a physical wiring interface to access each VBUS channel, the USBHub3c External Load Feature is required to enable VBUS outputs on the USBHub3c.
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Combustion Analysis
The Phoenix family provides combustion analysis solutions for both in-cell and in-vehicle testing.
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Tire Testing Machines
A&D’s tire testing machines incorporate our model-based sensor technology and high-accuracy measurement capabilities to provide valuable insight into tire performance and behavior.
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Test Hook Probe
CX-S11
Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Used on enclosures prior to accessibility testing. The test hook is ¨hooked〃 into vents and seams in the enclosure & then pulled with a force (usually 20N).
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Web Application Testing Services
With every new line of code, the chance of a bug appearing increases. If you don't find and fix that bug immediately, it will get much costlier to fix it in the future. According to IBM Systems Sciences Institute, the cost of fixing bugs after product release is up to 5 times higher than during the design phase, which makes it clear why you should start testing early. As a web application testing company, we are involved in every stage of your product development lifecycle. We help you ensure your app's quality while reducing maintenance costs.
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SMT Surface Mount MEMS High-G Shock Accelerometers
Piezoresistive MEMS high-amplitude shock accelerometers represent state-of-the-art industry technology for miniature, high amplitude, DC response acceleration sensors. This series is capable of measuring long duration transient motion as well as responding to and surviving extremely fast rise times, typical of a high-g shock event as found in explosive, gun and impact testing. Both packaged and OEM configurations are offered, to fulfill a variety of installation requirements.
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Adjustable Test Stab Set
The ETI adjustable test stab set may be used with your high-current circuit breaker testers to maximize efficiency and convenience for testing multiple breakers. Our stab system allows your technicians to test breakers in-place and avoid jacking breakers up or down for testing. By combining mobility and flexibility into one simple system, this stab set is a proven improvement over conventional designs. The components in the adjustable stab set are made of 120 pounds of 110 copper.
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7th Gen. Intel® Core™ Processor-Based Fanless Open Frame Touch Panel PC
SP2-KL Series
- 7th Gen. Intel® Core™ Proc- 10.1"/15.6"/21.5" PCAP touch screen- Wide input voltage range 9-36V DC- Full customization for fast integration with all form factors, kiosks, and all-in-one panel PC applications- Enhanced protection in case of sudden power outage with back-up battery (Optional)- Pre-compliance EMC testing and high ESD tolerance
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Point Universal Cable/Harness Tester
CableJoG 1024
The CableJoG 512 and CabeJoG 512 Plus provide a flexible testing system to suit individual customer requirements. The CableJoG 512 and CableJoG Plus 512 can test up to 1024 individual connections of all manufacturers of connectors.
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CAM/TRAC Test Kits
Series 43
The GR Series 43 CAM/TRAC®1 kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 43 provides interface compatibility by using a 12 position, GR2270 style I/O block interface. This interface accepts the industry standard I/O, power, and coax blocks.
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Breakout Box
T1000-15
T1000-15 breakout box with dual 15 pin D-Sub connectors for signal capture or monitoring. Dual connectors provide a total of 30 test points plus a ground jack. All test points use standard size 4mm banana jacks. Test points may be connected using shorting banana cable to allow signal continuity. Ideal for continuity measurements, isolation testing, and signal capture.
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PXI 3A Power MUX BRIC, 8-Channel, 6-Pole
40-571-401
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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802.11a,b,g RF Shielded Test Enclosure
JRE 0814-A
Testing tall devices? The 0814-A stands up to any test up to 18 GHz! Featuring a wide swing open door with durable latch handle, this enclosure is ideal for testing IEEE 802.11 a,b,g devices such as; WLAN, VoIP, access points and other RF devices.
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Automated Testing System
PV-LIT
Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects
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Flight Instruments & Gyro Department
Aero Instruments & Avionics, Inc.
The Flight Instruments & Gyro Department offers complete functional testing, repair and overhaul of most instruments & gauges located within the aircraft cockpit, and the associated computers that control them.
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PTL Impact Hammer
F22.50
Shenzhen Chuangxin Instruments Co., Ltd.
The Universal Impact Hammer is designed to perform impact tests for product durability. The F22.50 meets the testing needs of industry standards such as IEC 60068-2-75 and required by IEC 60065, 60335, 60598, 60601, 61010 and others. The hammer simulates mechanical impact to electronic products and electrical appliances.
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PXIe-6386, 8 AI (16-Bit, 14 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module
785926-01
PXIe, 8 AI (16-Bit, 14 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module - The PXIe-6386 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe-6386 is ideal for a variety of applications, such as IF digitizati...show more -
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Testing & Quality
The solar simulator, electroluminescence and hi-Pot testers are the main machines used to test photovoltaic modules. These machines can be positioned at the end of the production line and along the production chain to keep the quality and efficiency of the photovoltaic modules under control after the most sensitive production phases. Each machine uses the best technologies in order to guarantee the best and most accurate measurements.
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Portable Appliance Tester
PrimeTest 100
The PrimeTest 100 portable appliance tester is battery powered and handheld to allow for fast and efficient testing with clear PASS/FAIL indication and test result values. A simple range of tests are selected at the push of a button to test earthed equipment, double insulated equipment or mains cords and leads.
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Testing Aircraft Thrust Reversers
Custom Dynamometer Table. 2WB 115 Eddy-Current Dynamometer: with protective cover. DSP6001 High-Speed Programmable Dynamometer Controller. Customized Motor Fixture. RER 350 Cooling Unit
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10KV AC/DC Hipot Tester
2671A
Shenzhen Chuangxin Instruments Co., Ltd.
*High voltage, large current, high accuracy. *Leakage current, testing time, continuous arbitrarily, well-adapted. *Synchronized display measuring value( time, voltage and current). *Can choose manual or remote control test *High voltage breakdown protection, sound and light alarm, safe and reliable
