Showing results: 181 - 195 of 5294 items found.
-
550 -
Tokyo Electronics Trading Co., Ltd.
Charged Device Model (CDM) is to simulate a discharge to metal from any metal terminal of a charged electronic component or from metal tool held by a charged human body to metal terminal of an electronic component. CDM discharge causes very fast charge transfer, and then component is damaged by the stress. The CDM test system analyzes the robustness of component against CDM stress.
-
Mistral -
Engineering Solutions Inc. (ESi)
The Mistral Keypad Test System has been designed to be the least expensive, easiest to use full featured tester for membrane switch assemblies. The idea is to combine a small, smart "pod" with a PC running software that makes full use of the Windows® graphical interface. Make it as easy to set up and use as possible yet include all the features you need.
-
Keysight Technologies
Keysight offers a wide range of innovative test-and-measurement solutions to accelerate the progress of next-generation high-bandwidth optical networks. Keysight's mission in the optical market is to shorten time to market and reduce cost of test for customers in R&D and manufacturing. In addition, Keysight enables new technologies that include 40 Gb/s optical components, network elements and systems, and all-optical fiber networks.
-
USB Explorer 260 -
Ellisys Sàrl
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
-
TS8980 -
Rohde & Schwarz GmbH & Co. KG
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
-
4012 -
Barth Electronics, Inc
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
-
LXinstruments GmbH
Our turnkey systems offer a holistic solution, including DUT adaptation, RF signal connection and cutting-edge instrumentation by the market leaders for RF measurement technology, Keysight Technologies and Rohde & Schwartz. Developing a suitable calibration concept is another integral task in our scope of work.The LXinstruments drawer adapters support functional assembly testing, including coupling and decoupling of RF signals via aerials in the test adapter. We employ cutting-edge absorber technologies in combination with optimized test cell geometries in order to minimize reflections and standing waves. Our drawer adapters offer unrivalled outbound shielding attenuations of more than 60dB at frequencies of up to 3 GHz.
-
PC-114 -
Com-Power Corporation
Perform Radiated & Conducted EMI pre-compliance testing at your facility up to 1 GHz. Com-Power PC-114 EMI emissions test system is a ideal solution performing pre-compliance EMC testing from 9 kHz - 1 GHz.. It has essential equipment needed for radiated and conducted EMI emissions measurements. The system includes a spectrum analyzer, antennas, near field probes, a preamplifier, LISN and a non conductive antenna tripod. Pre-compliance testing in EMC is a commonly used term not easy to define. In general, it implies testing done prior to formal testing for legal compliance. Formal legal compliance is performed at a facility designed and equipped with test instrumentation that is fully compliant with the applicable EMC standards. Such facility and instrumentation is capital intensive and can be expensive even to rent and not easily available. Compliance testing is performed per exacting requirements of the Standards and other reference documents adhering to the test methods and last detail. In addition, the test facility may require to be accredited by an accreditation body such as NVLAP, A2LA. Often it is desirable to know prior to compliance testing at such facility, whether a product is close to compliance and also how close. Pre-compliance testing is specially useful for specifications such as FCC, Part 15, EN 55022 or EN 55011 (CISPR 22 or CISPR11). Pre-compliance testing usually means using the full compliance methods but making a few educated compromises in use of site or equipment to reduce costs and testing time. Here are some benefits of pre-compliance testing.
-
3-axis -
Shinken Co. LTD.
This small 3-axis vibration test system has been developed in response to many customers' request for ?gcompact and easy to handle & use h multi-axis VTSs without sacrificing performances, featured by its small installation area of W900mm by D850mm, relatively quiet due to employment of small fans insterad of bolower(s), a displacement of 25mmp-p for each axis and max. transient acceleration of over 98m/s2<10G>*,
-
T5511 -
Advantest Corp.
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
-
EMC Technologies Inc.
Highly flexible test solutions that are cost effective offering basic tests that easily adapts to high product volumes and complicated tests. Mobile computer based test stations provide a wide variety of test solutions at efficient costs.
-
MICRONIX
An electric product might cause the malfunction to other electric appliances by discharging the emission noise from it, or is oppositely caused the malfuction by the emission noise from other electric appliances. The former is checked by the EMI test and the latter is checked by the EMS test. The international standard like the CISPR standard is provided so that such an accident should not happen, and the manufacturer must declare by themselves beforehand that their product meets the standard. The generic name of the EMI test (Electro-Magnetic Interference) of the emission measurement and the EMS test (Electro-Magnetic Susceptibility) of the immunity
-
ModuLab XM MTS -
Ametek Scientific Instruments
I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials) High-speed pulse (used to activate charge carriers in electronic and dielectric materials)Staircase and smooth stepless analog ramp waveformsImpedance, admittance, permittivity / capacitance, electrical modulusC-V capacitance - voltage, Mott-SchottkyAutomatic sequencing of time domain and impedance/capacitance measurements
-
HORIBA, Ltd.
What counts in development processes is the speed at which new vehicles and new technologies are made ready to go into production. For vehicle testing, this means that complex test problems must be solved. HORIBA develops vehicle test stands that simulate the realities of driving in the most varied situations both precisely and economically.
-
ZERA GmbH
Correct contactingcharging cable detectionsecurity questionExtensive range of accessories for on-site measurements in a separate caseCharging cable with additional measuring lines (Sense)Convenient control through guided test procedure via WinSAM and tabletElectromechanical locking
