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EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Adapter/Nickel
WADP-NMSF
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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PXIe-5820, 500 MHz, 1 GHz I/Q Bandwidth, Baseband PXI Vector Signal Transceiver
783967-01
500 MHz, 1 GHz I/Q Bandwidth, Baseband PXI Vector Signal Transceiver—The PXIe‑5820 is the baseband model of the second-generation vector signal transceiver (VST) with 1 GHz of complex I/Q bandwidth. It combines a wideband I/Q digitizer, wideband I/Q arbitrary waveform generator, and high-performance user-programmable FPGA in a single 2-slot PXI Express module. You can use the VST for a variety of applications including baseband I/Q test of wireless and cellular chipsets; envelope tracking of digitally predistorted waveforms for power amplifiers; and the generation and analysis of new wireless standards such as 5G, 802.11ax, and LTE-Advanced Pro.
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Millohm & LCR
Help prevent failures in motor windings, generators and transformers with a quick and easy resistance test using an Amprobe milliohm meter. To efficiently inspect and verify electronic components for quality control, choose an Amprobe LCR tester.
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Soft Board Dedicated Automatic Testing Machine
U690FPC
1. CCD automatic alignment, the alignment accuracy reaches ± 15μm2. Support layout test, displacement function3. Up and down jig fine adjustment function4. Soft board stretching function5. Automatic marking function
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Grips and Fixtures for Test Stands
AMETEK Sensors, Test & Calibration
Our comprehensive range of grips, fixtures, jigs and probes cover most test applications within a wide range of industries. Below you will find a selection of our most popular grips, fixtures, jigs and probes. If you cannot find what you are looking for, please contact us for a presentation of our full range.
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Bare Fiber Aligner
1120
The Photon Kinetics 1120 Bare Fiber Aligner makes it possible to reduce test setup time to seconds, thereby reducing overall testing cost. Just strip the fiber, scribe and break it (or use a more precise fiber cleaver, if desired) and then insert the prepared end into the 1120. In an instant, the fiber is coupled to your OTDR or chromatic dispersion test system with low optical loss and low reflectance. The 1120's compact, ergonomic industrial design is well-suited for low to moderate volume fib...show more -
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Camera Test System
FS 8681 / SR
FS8681/SR is software for evaluating images* and making pass/fail judgments in camera mass production inspections. It consists of the "Editor FS8681" application that sets the inspection content and the "Sequence Runner FS8681SR" application that executes the set inspection.
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6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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3U I7 Core 2.3 GHz CPCI Controller
GX7937
The GX7937 is a single-slot embedded cPCI 3U controller for use with Marvin Test Solutions' GX7300 PXI chassis. The GX7937 features a 2.3 GHz i7 Quad Core processor. When combined with the embedded storage peripherals of the GX7300 Series chassis, it is the ideal solution for an integrated, high performance PXI chassis / controller configuration.
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Boundary Scan / JTAG Test Development System
onTAP Development
The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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NI FlexRIO Adapter Modules
High bandwidth and high resolution AWGs help you to generate with confidence complex signals like digital modulations and RF stimuli for functional and performance tests.
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PXI Resistor Module 2-Channel 2R to 16.3k with SPDT
40-293-131
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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High Precision Angular Positioning Calibration and Geometry Inspection
LabStandard
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.Designed for horizontal and vertical applications with self-locking worm gearing and a high accuracy angular encoder ensures sensitivity and fine positioning for metrology and precision testing.
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LFA-3000 Light Flicker Analyzer
Hangzhou Everfine Photo-E-Info Co., LTD
LFA-3000 can simulate flickering measurement and analysis under various voltage fluctuation conditions, and the system has built-in standard voltage waveform database, one operation can complete the test and analysis of IEC 61547-1, convenient and fast. Meet the lighting product design, quality inspection and application of flickering test analysis needs.
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Radio Link Simulator
RLS-2100
Square Peg Communications Inc.
It is the most comprehensive, with unparalleled impairment simulation, real-time multi-satellite orbit calculation, full motion support and integrated GPS simulators. It is the most flexible, providing end-to-end or single link simulation of wideband terrestrial and satellite networks, satellite selection via open standard interfaces, and facilities to enable seamless integration into more complex test beds if required. It supports the highest bandwidth and has an intuitive, user-friendly interface. And it does it all in one box.
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PCI-4462, 204.8 kS/s, 118 dB, 3.4 Hz AC/DC Coupled, 4-Input Sound and Vibration Device
779309-01
The PCI‑4462 is a high-accuracy data acquisition module specifically designed for sound and vibration applications. It provides simultaneous four-channel dynamic signal acquisition with six programmable gain settings for making high-accuracy, frequency-domain measurements. The PCI‑4462 also includes software-configurable AC/DC coupling and integrated electronic piezoelectric (IEPE) conditioning to ensure precision measurements with microphones, accelerometers, and other transducers that have ver...show more -
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PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Programmable Electronic Load
Shenzhen UYIGAO Electronic Technology Co., Ltd
UYIGAO DC electronic loads provide you with the flexibility to test a wide range of power sources. Perform both static and dynamic tests to ensure that your devices can handle the steady state and occasional transient loads. The 16-bit voltage, current, and power-measurement systems provide accuracy analysis.
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Impedance Matching Pads
Surface mount and coaxial 50 Ohm / 75 Ohm impedance matching pads for CATV systems, broadband networks, test setups and more!
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In-Circuit Test Applications
With decades of experience developing test fixtures, we are the recognized industry leaders for solid and reliable quality as well as our outstanding customer service. We fully support our products locally and worldwide for maintenance, repair, and ECO work. Also, 100% wiring verification is part of our Quality Control process, by utilizing automated verification machines for GenRad/Teradyne and HP/Agilent fixture.
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Full test development environment
XJDeveloper
XJDeveloper is a graphical application that allows you to quickly and easily set up and run tests on your circuit. With XJDeveloper you can reduce your time to market by reusing your test scripts all the way through the product design process and then in manufacturing.
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Advanced Power System - Dynamic DC Power Supply, 9 V, 200 A, 2000 W
N7970A
The N7900 Series dynamic DC power supplies are designed for automated test equipment (ATE) applications where high-speed dynamic sourcing and measurement is needed.
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PCI Express Host Interface SSD/Drive Decode Support
Teledyne LeCroy provides NVM Express, SATA Express and SCSI Express protocol decoding, analysis and test equipment to SSD storage companies worldwide. It works closely with the following organizations providing equipment to its members and conformance programs.
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Standard 1.10 (31.00) - 3.85 (109.00)General Purpose Probe
SPA-64-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3: 0,365″; Tip 8: 0,385″; Tip ,9,10: 0,363″
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DFT Consulting
SiliconAid Solutions provides expert consulting services for all aspects of semiconductor Design-for-Test (DFT) development and implementation. Staffed by experts with proven track records from major semiconductor manufacturers, SiliconAid focused expertise provides you resources when and where you need them the most.
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Digital Controller
SPARC Controller
SPARC Brake is a digital controller optimized for Inertia Brake Dynamometers. As a member of the SPARC family of universal controllers, SPARC Brake is using a modular design to enable more flexible configurations to fulfill any specific test environment.SPARC Brake uses sophisticated control algorithms and provides superior and intelligent control of brake actuators with highest control accuracy to cover the wide range of brake test applications. From simple static brake testing to high dynamic simulation procedures, it is able to meet the highest demands for today’s and tomorrow’s brake test requirements, for example GM-TIP.
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Single Function MIL-STD-1553 Test & Simulation PCIe Card
ASE1553M-x
Single Function MIL-STD-1553 Test and Simulation module for PCIe with 1, 2 or 4 dual redundant streams.
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10 MHz to 55 GHz Noise Sources
CNS346 Series
The Spanawave CNS346 Series is designed for precision noise figure measurement applications. The superior VSWR characteristics reduce multiple reflections of the test signals and significantly increase the measurement accuracy of most noise figure set-ups. The CNS346 Series noise sources have broadband coverage and extremely good temperature and voltage stability, for the finest noise figure meter-compatible laboratory standards. Outputs of 6, 15.5 and 22 dB ENR are available, allowing the units to accurately measure noise figures up to 20 ,30 and 36 dB respectively.
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Automated Bondtester
4600
The 4600 Bondtester is a benchtop system designed to automatically perform complex test procedures without needing operator input. The system can automatically complete shear and pull test patterns with different orientations of bonds, while recording failure mode images upon completion.
