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Test Cord Kits
Tescom is a distributor of Westek's professional test/patch cord kits. These kits are designed to meet the testing requirements of Air Transport Specialists and System Management Engineers nationwide.
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Interoperability And Field Tests
Interoperability and field tests are carried out to determine the behavior of a device under test in a qualified test environment or in connection with specially selected, qualified products. Our interoperability and field tests are based on many years of experience with wireless technologies and our close cooperation with the leading manufacturers and network operators in the telecommunications industry.
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Tan Delta Test System
Diagnostic test that indicates the degree of cable insulation degradation. Rather than using only a VLF instrument to perform a go/no-go proof test, the Tan Delta, used in conjunction with a VLF hipot, permits the user to grade the deterioration level of many cables in order to prioritize replacement, rejuvenation, or to determine what additional tests may be useful.
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Test Cells
Our test cells are built using a modular system. This means that the usable space size and shape can be specifically adapted to the required conditions.
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Laser Diode Life Test
Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
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NI's Wireless Connectivity Functional Test Solution
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Cleaner for Test Probe
EQOmat
We have developed EQOmat, a cleaner exclusively for test probes that removes dust such as flux and solder debris adhering to the tip of the test probe. The structure and thinness built with the user's convenience in mind are important items that have sufficient functionality and are indispensable for long-term use of the probe. * EQOmat is an abbreviation for Ecological Qualified Octopus Mat.
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PC Based Comprehensive Test Setup for Luminaires
Our zest for innovation has resulted in continuous upgrades in the existing line of products. Till now we used to manufacture 3 different equipments for Driver, MCPCB and Luminaires Component testing. We at SCR Elektroniks have developed our comprehensive tester to incorporate all the 3 systems in a single bench. Here in this tester one can test all the three DUT in a single bench. Since all the 3 testing procedures have many tests in common, we have incorporated all the tests in a single bench such that testing of Luminaire driver, Luminaire PCB and Final Luminaire set is performed in single test bench. Only these tests are performed over the DUT else other are disabled for them.
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Distortion Test Sets
DTS-C
Matrix Test Equipment Incorporated
The Model DTS Distortion Test Sets combine Matrix products with those of other manufacturers. When properly equipped, a Model DTS can measure virtually any parameter important to the CATV industry. Controlled completely through the (GPIB) IEEE-488 bus interface, a Model DTS allows rapid, repetitive, and objective readings in a production-type environment.
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METES - Meter Test Systems
Dramatic advances in the field of measurement technology and the use of state-of-the-art micro-electronics have led to the development of a new generation of electricity meters which are far more accurate than their predecessors of just a few years ago. As well as measuring the exact amount of energy used, a high level of integration enables electronic meters to perform a number of additional functions. As a result, these meters are also more sensitive to network irregularities. This means that regular testing is the only way to ensure that a meter functions correctly, both during final factory tests and during the entire life span of a meter.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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JTAG External Modules (JEM) DIMM/SODIMM Socket Cluster Test
The primary function of the JTAG External Modules (JEM) for the DIMM/SODIMM Socket Cluster Test is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system and to strengthen the memory-independent JTAG testing for the assembly correctness of the almost full spectrum of the modern socket types, particularly (according to JEDEC_Std.21-C):
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PSE Conformance Test Suites
2-Pair 802.3bt / 802.3at PSE's
*Robust 2-Pair 802.3at (Type-1, 2) / 802.3bt (Type-3) PSE Conformance Testing*Fully Automated Port Sequencing and Statistics*Greater than 95% 802.3at PICS Coverage from 23 Fully Automated Tests*Pop-Up Excel Reports Covering 1 to 24 Ports*Widely Used by PSE System and Silicon Manufacturers World Wide
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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PAT Test Service
Plugtest Ltd, is a UK wide specialist PAT Testing (Portable Appliance Testing) company. We provide a simple and cost effective solution, enabling all companies & organisations to comply with the Electricity at Work Regulations.
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Air Data Test Calibrator
ADC-2522
The ADC-2522 is built on TestVonics ADC-2550 series platform. It is designed for rackmount use and features a large 10.4" display with resistive touchscreen. The calibrator has the ability to emulate the Sperry / Honeywell ADT-222B IEEE-488-1975 communications. This allows the calibrator to be a plug and play replacement for the aging Honeywell ADT-222B Air Data Test System and similar test sets, without the expense in having to modify existing communication protocols or software.
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In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988EL
The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.
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UL Rain Spray Test Device With Nozzle
CX-UL56
Shenzhen Chuangxin Instruments Co., Ltd.
UL rain spray test device with nozzle Size:500*800*2000mm((adjustable height 1000~2000mm)Nozzle water column intersection from the ground height 0-1400mm adjustable
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ScanWorks Boundary-Scan Test
ScanWorks Boundary-Scan Test
The Boundary-Scan Test (BST) Development Software is one of the several configurations of the ScanWorks boundary-scan (JTAG) test and on-board programming environment. Test engineers can quickly develop interconnect tests and device-programming actions for use on first prototype board to accelerate the board bring-up process. Then tests can be exported for use in manufacturing and repair facilities.
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RF/Microwave Test Capability
Teledyne Labtech have extensive microwave alignment and microwave testing facilities. This includes the ability to test noise figure, S-parameters and harmonics. This ensures that Teledyne Labtech can supply a fully compliant product and provide a complete turnkey microwave assembly and test solution.
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Intraocular Lens Optical Test System
OptiSpheric® IOL R&D
The OptiSpheric® IOL R&D is specially designed for the analysis of single intraocular lenses in research and development. With the OptiSpheric® IOL R&D, important parameters of all types of lenses (monofocal, multifocal, trifocal, toric, aspheric and those with extended depth of focus (EDOF) – whether diffractive, refractive or sectors) can be measured and tested in air or in situ in accordance with ISO 11979.
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LP Test Kit w/ CD100A, EM152, and AC504 Case
LPKIT
UEi Test & Measurement Instruments
Essential instruments for LP technicians
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Test Set For Instrument Transformer
This modern Test Set For Instrument Transformer is used for measuring relative errors of Instrument Voltage and Current Transformers. This is developed for reading out the unbalance of any bridge circuit. It also calculates the burden associated to the test sample. In addition to this, it further converts it to ratio and phase error values for presenting them on a LCD screen. With high-tech microprocessor controller, it ensures to provide quick and correct measurements.
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Phase Noise Test System
N5511A
The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
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Horizontal Vibration Test Systems
G-3 Series
This series was used for the special structure of airbearing guide of inspection for Seismic Detectors andcharacterized is large displacement and high-accuracywaveform. In addition, the use of the Windows seismicdetector controller is easy to operate it.
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Vibration Test Systems
L.A.B.’s Vibration Test Systems help you design high quality, cost-effective products and shipping containers by accurately measuring sensitivity to vibration.
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Flat Panel Display Test Solutions
Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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Test Systems
Computer Gesteuerte Systeme GmbH
The system is pin and software compatible to the larger test systems LB302 / 303. Due to the fewer needed I/Os, the tester features the compact G6 receiver (Virginia Panel Cooperation) compared to the larger G12 of the other tester versions. The LB301 is equipped with a 2kW power supply and can control one load box.
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Java Apps Test Software
JRebel
Supports Wildfly and TomEE 1.6.0 Supports EJBs on WebSphere 8.5.5 and JBoss 6EAP, 7.1, 7.2 Supports Spring 4 and PrettyFaces Adds remoting for standalone applications And many more improvements
