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TAPs

network jump enabling undetectable data monitoring. AKA: Test Access Points

See Also: Network Monitoring, Network Taps, Aggregator Taps


Showing results: 76 - 90 of 95 items found.

  • Robotic Probing of Circuit Cards

    BCO, Inc.

    System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.

  • Outdoor Exposure Tester

    OET - PSE Instruments GmbH

    A comprehensive analysis of PV modules includes many different parameters. Determining the normal module operating temperature (NMOT), incidence angle effects and comparing soiling effects on different modules up to the initial degradation of PV modules are all parameters that can be analyzed with our outdoor exposure tester. The tester comes with up to twelve electronic loads installed in a 19" rack. The loads have two main functions: maximum power point tracking (MPPT) and IV curve tracing. For the advanced analysis, it is possible to change between these two modes within one test. In the normal operation mode, the electronic load keeps the module under MPP and each predefined interval an IV curve is traced. The entire tester comes with all necessary sensors such as temperature sensor, which can be attached to the module to determine the NMOT temperature like defined in IEC 61215 (MQT 05) and IEC 61853-2. The irradiation sensor is also included. In combination with our tracking system P2, it is also possible to determine incident angle effects of the PV module. It is also possible to connect other irradiation sensors for diffuse and direct irradiation, which helps to understand the behavior of the module in different irradiation conditions. An optional albedo meter is a powerful tool for the analysis of bifacial modules. The entire graphical user interface is web based and offers the possibility to access the system from the all computers in the network.

  • Design for Testability (DFT Test)

    Corelis, Inc.

    Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.

  • Boundary-Scan Interactive Analyzer & Toolkit

    ScanExpress JTAG Debugger - Corelis, Inc.

    Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.

  • 37 Pin Breakout Interface

    VSI-Breakout-37 - Viewpoint Systems, Inc

    The VSI-Breakout-37 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 100 Pin Breakout Interface

    VSI-Breakout-100 - Viewpoint Systems, Inc

    The VSI-Breakout-100 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 50 Pin Breakout Interface

    VSI-Breakout-50 - Viewpoint Systems, Inc

    The VSI-Breakout-50 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 25 Pin Breakout Interface

    VSI-Breakout-25 - Viewpoint Systems, Inc

    The VSI-Breakout-25 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 68 Pin Breakout Interface

    VSI-Breakout-68 - Viewpoint Systems, Inc

    The VSI-Breakout-68 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 9 Pin Breakout Interface

    VSI-Breakout-9 - Viewpoint Systems, Inc

    The VSI-Breakout-9 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • 15 Pin Breakout Interface

    VSI-Breakout-15 - Viewpoint Systems, Inc

    The VSI-Breakout-15 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.

  • Test Database Software Module

    LXinstruments GmbH

    The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.

  • 2.4 And 5GHz Handheld Wi-Fi Tester

    Vonaq Ltd

    *Supports 802.11 a/b/g/n and 2.4 / 5GHz frequency bands.*Quickly troubleshoot Wi-Fi problems using the 7” Inch colour touch screen*Screen resolution 800 x 480 (WVGA)*monitor intermittent line problems up to 20 days with the xDSL Histogram feature*One button configurable test / Automatic test script performs the following Tests:**Noise**WiFi Channel Utilisation**Access point login,**Ping Test**HTTP Download Test*Rapid Testing - Reports and statistics displayed in typically less than 3 minutes*Stores over 1000 Test reports in PDF Format*USB port for additional storage options

  • Halo Automatic Testing System

    Fortress Technology Inc.

    Our revolutionary Halo system is an automatic metal detector testing device. It is designed to automatically test ferrous, non-ferrous and stainless steel samples on all Fortress metal detectors. Automatic testing saves time, money, labor, along with removing the risk of human error and work place injury at critical control points on a manufacturing line while complying with industry standards. The Halo system is ideal for applications where manual testing of a metal detector is made difficult due to access, position, access to the product flow, environmental conditions, etc.

  • DIOS (Digital I/O Scan Module)

    JT 2122/MPV - JTAG Technologies Inc.

    The JT 2122/MPV DIOS (digital I/O scan module) increases the coverage and improves the diagnostic resolution of boundary-scan testing by extending test access to connectors and/or test points. JT 2122/MPV DIOS provides bi-directional parallel-scan access to up to 128 or 133 I/Os in a standard DIMM-168 module.

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