Showing results: 16 - 30 of 124 items found.
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2115 -
DIT-MCO International
The Model 2115's compact size makes it the ideal choice for many benchtop or portable test applications. The small size does not mean you sacrifice any functionality. The 2115 delivers a full 1500 volt isolation and 2 amp continuity test stimulus. With the optional AC breakdown test providing 1000 VAC test stimulus, you will meet all test requirements.
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S960707B -
Keysight Technologies
The S960707B modulation distortion software application provides nonlinear DUT behavior tests (EVM, NPR, and ACPR) under modulated stimulus conditions.
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DP-VME-5031 -
Data Patterns Pvt. Ltd.
DP-VME-5031 is a Resolver to Digital and Digital to Resolver Converter module. This module has four resolver to digital converters as measurement channels and six digital to resolver converters as stimulus channels.
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Copernicus Technology Ltd
The Mobile Vibration System from Copernicus Technology is a new and affordable system for applying vibration stimulus during testing work, with a range of features that make it highly adaptable and fully configurable by the user.
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Integrated MEMS -
SPEA S.p.A.
The best technical performance, cost optimization, one-shot factory integration.A single unit integrates the modules for the handling, contacting and complete testing of MEMS devices, including the physical stimulus for functional test, and the tri-temp thermal conditioning.
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406A -
Testronics Inc.
The 406A is designed to target the highest number of assembly failures for the least amount of capital equipment cost, programming time, and maintenance costs. The precision Stimulus Measurement Unit provides AC/DC analog measurements that are accurate, stable, repeatable, and reliable.
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DP-cPCI-5031 -
Data Patterns Pvt. Ltd.
DP-cPCI-5031 is a Resolver to Digital and Digital to Resolver converter module. This module has four S/R to Digital converters(measurement channels) and two Digital to S/R converter(stimulus channels). This module is programmable for simultaneous acquisition and generation of the Resolver signal.
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Wave Gen Xpress -
Byte Paradigm
A digital pattern generator is an essential stimulus source for almost every type of digital device: digital and mixed-signal ASIC, FPGA, microprocessors and microcontrollers. The digital pattern generator can be used early in the design cycle to substitute for system components that are not yet available.
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Solo C3 -
Detectortesters
Many multi-sensor fire detectors detect carbon monoxide (CO) as well as smoke and / or heat. Under international codes and standards the CO cell needs to be functionally tested with a CO stimulus from the protected area through the detector vents to the sensor.
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Cohu, Inc.
For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.
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ArbIQ -
Arbitrary Resources, S.L.
The ArbiQ Software package allows wireless design and manufacturing engineers to use the most flexible signal generation tool, the Arbitrary Waveform Generator, to solve almost all their wireless test stimulus needs at baseband or IF/RF levels, no matter if the required signals of analog or digital.
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NoiseCheck Software -
Listen Inc
NoiseCheck is essentially SoundCheck without a stimulus editor, as it is designed for manufacturing the noise made by your product. It is a powerful piece of software, ideal for both R&D and production line acoustic measurements of fans, blowers, motors, gears, bearings, pumps and other electromechanical products.
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Teseda Corporation
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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JT 5112 MIOS -
JTAG Technologies Inc.
The JT 5112 MIOS JTAG/Boundary-scan mixed signal I/O with analog output module , simply add mixed-signal stimulus and measurement capabilities to your current JTAG test system.
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ULTRA L -
FocusTest, Inc.
The ULTRA L is a high performance “Lab” system that provides thermal conditioning, mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.