Spring Probes
Spring loaded electrical conductor contacting elements. AKA: Pogo Pin
See Also: Pogo Pin, Test Fixtures, Bed of Nails
- Optomistic Products
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Small Aperture Fiber-Optic Probes
Small-aperture Fiber-optic Probes are best for testing closely-spaced LEDs. With an aperture of 1mm, and a diameter of 1.2mm/0.050 inches, they can test LEDs spaced as close as 0.050 inches on center. Small-aperture Fiber-optic Probes are available with straight or right-angle stainless-steel tips as shown below. This allows for precise customization to your mechanical constraints.
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Test Probes
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Changeable Cassette
230356/1 – CMK-07
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Linear Testfixture (Cassette Not Included), UTT 306 x 248 mm
MG-02
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 306 x 248 mm (wxd)• Outer dimensions: 470 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
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Standard Pitch Spring Probes
Other than spring probes with gold plating, we have spring probe with anti-solder migration coating and plating that were developed by KITA. We also have anti-solder migration material for plunger tip. These are all included in “MARATHON” series. They have wide range of tip type for various use for every popular total length.
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Linear Testfixture (Cassette Not Included), UTT 586 x 248 mm
MG-03
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 586 x 248 mm (wxd• Outer dimensions: 750 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
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Linear Testfixture (Cassette Not Included), UTT 194 x 170 mm
MG-06
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 194 x 170 mm (wxd)• Outer dimensions: 400 x 354 x 70 x 140 mm (wxdxh1xh2)• Designed for changeable cassette
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Ultra High 1.16 (33.00) - 9.70 (275.00) Long Travel Bead Probe
BPLT-25HL-9.7
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Circuit Tester "Light and Sound" Hook Probe
TE6-0708C
Hangzhou Tonny Electric & Tools Co., Ltd.
*Tests 6/12 volt circuits with POWER ON.*Interchangeable tips allow tool to be used as a probe- or pierce-type tester.*Retains wire for perfect pierce with one hand.*Hook grabs hard-to-reach wires.*Durable insulated clip and heavy-duty cord for professional use.*Spring loaded strain relief prevents cord pull out and damage.*High intensity glow for under hood and under dash visibility.*Easy-to-hear buzzer provides quick circuit test confirmation.
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BGA Sockets
Our BGA socket platform takes advantage of the H-Pin®, a high-performance stamped spring probe pin, to provide a pure vertical contact system that meets all BGA design challenges at an enabling cost.
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CMK Mechanical Kits
Columbia has created a unique mechanical click system using ball bearings and guiding sleeves. The UUT is connected to the spring contact pins that are connected to the testing environment in a completely linear fashion. Connecting the UUT to probes can be approached both from the top and the bottom and, optionally, even from the side. The ergonomic housing provides generous space for additional measuring electronics. The back and bottom of the housing can be adapted to the various test system interfaces.
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Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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Fingernail Test Probe
CX-Z11
Shenzhen Chuangxin Instruments Co., Ltd.
The Fingernail Test Probe is used to test to IEC 60335 and UL standards. It checks the security of parts that snap together. The spring loading in the handle can be calibrated to the force necessary to use the instrument. This probe is made of stainless steel with specially hardened tip and a Delrin?handle. Handle has a threaded hole for use with force gauges.
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High 0.75 (21.00) - 8.00 (227.00) Long Travel Bead Probe
BPLT-25HF-8
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Semiconductor
You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
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Heavy Duty Circuit Tester
28400
A heavy duty circuit tester for lifetime use. The probe, handle, cord and clamp are reinforced for extra durability. Comes with a strain relief spring on the cord. Cord is 49".
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IEC60335 Nail Test Probe
CX-Z12
Shenzhen Chuangxin Instruments Co., Ltd.
The Finger Nail Probe is indicated to test IEC 60335 and UL requirements. Used to check the security of parts that snap together. The spring gauge assembled in the handle can be calibrated to the necessary force for using the instrument. This probe is made of stainless steel with appropriated hardened tip and a handle in insulating material. Handle has a special adaptor M5 for use with 50N force gauges.
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Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 1000 units, Max UUT 335 x 250 mm (wxd)
CMK-02
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Spring Probes
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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16 Channel, Single Slot, Bench Data Acquisition Unit with 6.5 Digit DMM
T3DAQ1-16
÷10 HiZ 500 MHz Passive Probe for WaveSufer 400 Series Oscilloscopes. Includes Spring Tip, tip protector, and standard accessories package.
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Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 1000 Units, Max UUT 450x330MM (wxd)
CMK-07
Linear click system with ball bearings, using gas springs. 10 mm ESD-proof top cover with aluminum reinforcement bars. Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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High Force Type Spring Probes
Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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Manual Fixture Kit
230373 – CMCSK-04-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Linear Testfixture (2 pcs. Cassette Included), UTT 105 x 170 mm (2pcs)
MG-05
FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (1000N) 650 units for each cassette• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 105 x 170 mm (wxd) each cassette• Outer dimensions: 550 x 400 x 50 x 140 mm (wxdxh1xh2)• Designed for 2 pieces changeable cassette
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Standard Type Spring Probes
From for bare board to for ICT, we have variety of spring probes for PCB. In addition to variety of tip type and total length, we also have receptacles that match the best to spring probes. We can also attach lead wire to the receptacles.
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LTP-25 High Performance Long Travel Probe
LTP-25
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 400Full Travel (mm): 10.16Recommended Travel (mil): 317Recommended Travel (mm): 8.05Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Full Travel for LRP-25TJ: 340 (8.6) and Full Travel for all Ultra High springs: 350 (8.9)
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Manual Fixture Kit With Changeable Cassette, Max number of probes (2N) 1000 units, Max UUT 580 x 400 mm (wxd)
CMK-04
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Screw Pins
C.C.P. Contact Probes Co., LTD.
CCP's Screw Pin is an extremely smart way to utilize a pogo pin as a connector as well as a mounting part.
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Manual Fixture Kit
230353 – CMK-04
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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IEC60068-2-75 Ik08 Spring Impact Hammer
CX-IK08
Shenzhen Chuangxin Instruments Co., Ltd.
The spring Hammer consists of three principal parts: the body, the striking element and the release system. It's used to test the mechanical integrity of product enclosures. After applying the impact with the hammer, the product is examined with accessibility probes to determine access to shock, energy, and injury hazards. Built in exact accordance with IEC/EN, UL/CSA and other international standards.
