Showing results: 46 - 60 of 198 items found.
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Evans Analytical Group®
EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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7500 -
Tokyo Electronics Trading Co., Ltd.
ESD test based on Human Body Model (HBM) and Machine Model (MM) is the most important reliability test among the Electro-static Discharge (ESD) test of the semiconductor device. Latch-up test, on the other hand, should not be omitted from the reliability test of the CMOS devices.
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7000 -
Tokyo Electronics Trading Co., Ltd.
ESD test based on Human Body Model (HBM) and Machine Model (MM) is the most important reliability test among the Electro-static Discharge (ESD) test of the semiconductor device. Latch-up test, on the other hand, should not be omitted from the reliability test of the CMOS devices.
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Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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FocusTest, Inc.
The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
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Avtech Electrosystems, Ltd.
are particularly suitable for certain semiconductor test requirements, but other models may also be of interest. Our knowledgeable application engineers can guide you to the most suitable model.
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STAr Technologies, Inc.
STAr provides complete and advanced semiconductor reliability test systems to industry customers, comprising of design for package-level and wafer-level reliability characterization qualification to meet defacto standards.
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U2941A -
Keysight Technologies
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Teradyne, Inc.
Teradyne test solutions are at the forefront of the 5G test era. Why? We work with the leading semiconductor manufacturers and provide optimized test coverage for the major wireless standards. From emerging millimeter wave devices to the traditional sub-6GHz, our test solutions are already leading the way.
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Astronics Corporation
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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STAr Technologies, Inc.
STAr is the leading parametric test system integrator, with over 20 years of experience and many successes for total parametric test solutions serving customers within the semiconductor wafer fabs, flat panel display, LED and PCB industries.
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Reedholm Systems
We make DC test systems used by semiconductor manufacturers to make measurements on electrical test structures and simple devices. Because of the broad application of test structures, our test systems help assure quality and reliability in process development, wafer acceptance testing, reliability evaluation, and dc final test.
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Nidec-Read Corporation
MEMS Spring Probe is developed by NIDEC-READ original ultra-fine 3D processing technology and enables our customer to supply advanced and innovative test solutions at PCB & semiconductor testing market.
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CloudTesting™ -
Cloud Testing Service, Inc.
All-in-one platform for semiconductor test and measurement Extensive test and measurement library Microcontroller, Memory, Analog and more. CloudTesting™ Service is the test and measurement system that you can build your own environment by selecting and combining Testing IPs. Fees for Testing IPs are paid monthly.
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Titan -
Teradyne, Inc.
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.