Semiconductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: iJTAG
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Panel-mount Type Resistivity Meter (Four-Wire Transmission, 2-channel)
HE-960RW
HE-960RW connects resistivity sensor(ERF sereies) and measures resistivity and temperature in the sample water.This resistivity meter is ideal for such applications as the high-precision water monitoring employed at ultra-pure water plants used in semiconductor manufacturing.They utilize newly designed, high-precision, high-stability temperature measurement circuitry and a vastly improved temperature compensation function, an important element for measuring the resistivity of ultra-pure water.
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Bow and Global Film Stress Measurement
128 Series
Bow and Global Film Stress Measurement.Non-contact full wafer stress mapping for semiconductor and flat panel application.Dual Laser Switching Technology.
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Thermalyze Extension for Steady State Analysis
Lock-In
Steady-state thermography is limited to detecting hot spots that heat up a minimum of 100 mK (0.100°C). This may be useful for locating shorts on high-power devices, but is inadequate for detecting low power defects such as semiconductor device leakage current or short circuit with very low or very high resistance. Steady-state thermography also suffers from poor spatial resolution as the heat from localized hot spots diffuses rapidly, blurring the location of the heat source.
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Linear Positioning
KAOS OEM
A speedy, slim positioning stage for two-axis applicationsBased on cog-free linear motors, KAOS two-axis positioning stages combine a differential-motion carriage and a primary carriage on a single rail. This patented design results in a fast, compact stage well suited to semiconductor, electronics assembly and pick-and-place applications.
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IC/BGA Tester
Focus-2005
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltag...show more -
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RF & Microwave PXI Switch Modules
These switching systems are used for design validation, reliability and production test including 5G, SD radios, S parameter testing for RF cables, antennas, radar and semiconductor verification.
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Supercontinuum White Light Lasers
SuperK series
The SuperK series is an industry-leading range of turn-key supercontinuum white light lasers used by the most innovative companies within bio-imaging, semiconductor inspection, sorting, device characterization, and scientific instrumentation. The sources are robust and reliable, built for intensive use, and can replace multiple single-line lasers as well as broadband sources like ASE sources, SLEDs and lamps.
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Semiconductor
With state-of-the-art manufacturing facilities in the U.S., Europe and Asia, local sales offices throughout the world, and on-site applications support, FUJIFILM Electronic Materials is your global partner.
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Field-installation Type Simplified Fluoride Ion Concentration Meter(Four-Wire Transmission)
HC-200F
HC-200F is connected to a fluoride ion electrode (1009) to detect free fluoride ions in the sample water.(Total fluorine is not detected.) It is suitable for fluoride ion monitoring in effluent from factories, e.g., those of semiconductor FPD and glass manufacturers.
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Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Device Interface
Providing flexible, dependable services for device interface design, development, ordering, production, and support. The importance of the device interface has greatly increased, as high speed, high density semiconductor devices are more rapidly developed, and as customers more severely demand high accuracy, high reliability, and high productivity of testing.
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Wafer Defect observing instrument
HS-WDI
Application■Semiconductor wafer■Solar wafer■Solar Cell■Thin-film Cell
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Semiconductor Solutions
Bruker's suite of technologies for semiconductor manufacturing address critical metrology and process needs across the broadest range of applications from R&D to process improvement. 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation products.
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Capacitance Manometer
VG-200S
Absolute pressure measurement is crucial for most of vacuum processes in various industries including Semiconductor, FPD, HDD, PV and Coating. A capacitance manometer determines the total pressure from the deformation of the diaphragm that occurs when a pressure difference is applied to both side of the diaphragm.
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Biased and Unbiased HAST Testing
Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.
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13MP 4K Camera Module
e-CAM131_CUMI1335_MOD
e-CAM131_CUMI1335_MOD is a high performance, 13 MP 4K camera module with S-Mount lens holder and it has better low light performance. This small form factor 4K camera module is based on 1/3.2” AR1335 CMOS image sensor from ON Semiconductor® and has a dedicated, high-performance Image Signal Processor (ISP) that performs the entire Auto functions like auto white balance, auto exposure control in addition to complete image signal processing pipeline that provides best-in-class images and video and the optional MJPEG compression.
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1.3 MP USB 3.0 Industrial Digital Camera (Full Color)
See3CAM_11CUG
See3CAM_11CUG - Industrial USB Camera is a 1.3MP Custom Lens Color Camera. These Industrial Cameras are based on the Aptina / ON Semiconductor AR0134 CMOS image sensor. This See3CAM_11CUG is UVC-compliant SuperSpeed USB 3.0 Camera that is also backward compatible with USB 2.0 host ports and does not require any special camera drivers.
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Device Parameter Analysis
bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrade...show more -
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2MP HDR Jetson TX2/TX1 Camera Board
E-CAM20_CUTX2
e-CAM20_CUTX2 is a 2MP HDR camera board for NVIDIA® Jetson TX2 /TX1 developer kit. It has an ability to stream seamlessly at wide temperature range (-40°C to 85°C). It enables an excellent low-light performance and can capture images even under 0.5 lux. e-CAM20_CUTX2 is based on 1/2.7" AR0230AT CMOS image sensor from ON Semiconductor™. It has S-mount (M12) lens holder which allows customers to choose and use the lens according to their requirement.
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5.0 MP NVIDIA® Jetson Nano™ Camera
E-CAM50_CUNANO
e-CAM50_CUNANO is a 5.0 MP 2-lane MIPI CSI-2 fixed focus color camera for NVIDIA® Jetson Nano™ developer Kit. This camera is based on 1/2.5" AR0521 CMOS Image sensor from ON Semiconductor® with built-in Image Signal Processor (ISP). This powerful ISP helps to brings out the best image quality from the sensor and making it ideal for next generation of AI devices.
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Failure Analysis
MicroINSPECT 300FA
The MicroINSPECT 300FA is an automated wafer inspection tool used for semiconductor wafer failure analysis. Its small footprint, high speed, and low cost relative to its rich features yield a superb cost of ownership and makes this an ideal tool for your fab or failure analysis lab. The MicroINSPECT 300FA combines advanced robotics, wafer sorting, an intelligent wafer inspection microscope together with SiteVIEW Software to produce an integrated failure analysis tool.
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Analytical Probe Station with Laser Cutting System
LCS- 4000 Series
The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All of these functions can be performed on a microscopic level, all on this one system which provides a high level of performance that is remarkably easy to use.
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Test Handler
Test Handler is an equipment that automates the final testing of semiconductor devices. It handles device transportation, controls temperature during semiconductor testing, and sorts devices based on test results.
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High Speed & Precision Pressure Insensitive Mass Flow Module
D700MG
Critical semiconductor manufacturing processes continuously desire precision gas flow control devices that enable both future innovation, and lab to fab transition of leading edge memory and logic device. HORIBA's propose the new pressure based MFC D700MG, the upper compatible model of the D500MG to support customer’s challenges.
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Liquid Flow Controller
Built upon field proven technology, the Turbo™ Liquid Flow Controller (LFC) 2950 was engineered to pair with MSP Turbo II™ Vaporizers to provide a reliable, high-performance liquid vapor delivery solution for semiconductor thin film deposition processes (including CVD, PECVD, ALD, and MOCVD). The diagram below shows how the LFC fits into the liquid vaporization system MSP offers.
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Function/Arbitrary Waveform Generators
Scientech Technologies Pvt. Ltd.
An Arbitrary Function Generator or an Arbitrary Waveform Generator has many applications like Embedded and Semiconductor Test Applications, RF Related Applications, Automotive Applications, Education-Related Applications, Medical Applications, Industrial Applications and Research Applications. Thus, Scientech Technologies has its customers from all disciplines and areas and thus it makes Scientech one of the biggest arbitrary function generator supplier.
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Wafer Analysis Systems
Tropel®
Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
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UV Meters
OAI’s UV Measurement Instrumentation are the standard for Semiconductor Lithography, MEMS, Sensors, Microfluidics, UV Curing, 3-D Printing, Sterilization, Water Purification and Solar/PVC industries. For over 45 years our meters have earned a reputation for accuracy, repeatability and dependability. We offer full calibration and support services worldwide.
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14/13/12th Generation Intel® Core™ Processor-Based Expandable Modular Industrial Computers
MVP-6200 Series
The MVP-6200 Compact Modular Industrial Computers powered by 14/13/12th Gen Intel® Core™ i9/i7/i5/i3 and Celeron processors. Featuring Intel R680E chipset and supporting up to 65W, the computers can also incorporate GPU cards in a rugged package suitable for AI inferencing at the Edge, and can be used for but not limited to smart manufacturing, semiconductor equipment, and warehouse applications.
