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Semicon

active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.


Showing results: 1 - 5 of 5 items found.

  • Semicon Test Probes

    Equip-Test Kft.

    Fine pitch, 0.20 mm [8 Mil] - single & double ended - non-rotating - kelvin - RF - high performance.

  • Wafer Edge Profile Measurement

    WATOM - KoCoS Messtechnik AG

    WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.

  • Chemical Resistant Chilled Mirror Sensor

    X3 - Edgetech Instruments

    Edgetech Instruments NEW X3 Chemical Resistant Chilled Mirror Sensor exploits the latest advancements in optical sensing and is specifically designed for demanding Process and Laboratory applications. It also offers the advantages of low dew point detection and rapid response. Available in multiple configurations to accurately measure dew point in aggressive background gases including. Ammonia, HCl, SemiCon Gases, Peroxides, Medical Gases, and other reactants.

  • OES Spectrometers

    HORIBA, Ltd.

    OES Spectrometers (Optical Emission Spectrometers for OEMs) optimized for SEMICON applications including plasma monitoring/end-point detection and reflectometry (with the addition of a flash lamp). The OES-Star features unmatched throughput and SNR, spectral coverage and < 1 nm resolution). Our new OES Family, OES-Star, VS70-MC and InVizU all include our latest “Multi-Communications interface” electronics (MC= EtherCAT, Ethernet, USB-2). The Invizu integrates both a linear CMOS sensor for UV-VIS and a TE-Cooled INGAAS sensor, which extends the spectral coverage to 1700 nm.

  • Nand Flash Tester

    NplusT - Saniffer

    NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.

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