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Software
Srive-Level Capacitance Profiling (DLCP) Measurement
Materials Development Corporation
Drive-levelcapacitance profiling is an extremely useful technique to characterize amorphoussilicon or other semiconductor material with large concentrations of deep band gap states.
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Six Synchronized Full HD Cameras For NVIDIA® Jetson TX1/TX2
E-CAM30_HEXCUTX2
e-CAM30_HEXCUTX2 (HexCamera) is a multiple camera solution for NVIDIA® Jetson TX1/TX2 developer kit that consists of six 3.4 MP 2-Lane MIPI CSI-2 camera board and an adaptor board (e-CAMHEX_TX2ADAP) to interface with the J22 connector on the Jetson TX1/TX2. Each camera is based on the camera module e-CAM30_CUMI0330_MOD, 1/3" AR0330 color CMOS image sensor from ON Semiconductor® and integrated high performance Image Signal Processor (ISP). All these six cameras are connected to the e-CAMHEX_TX2ADAP adaptor board using 30 cm micro-coaxial cable.
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Laser Systems
We offer a full line of complete laser micro-machining heads for semiconductor applications. These systems feature an integrated DPSS Jewel ND:Yag laser incorporated into a uni-body all-in-one form factor. They also have a robust mechanical and optical design for manufacturing and repair applications. Our three models of micromachining heads are diverse enough to adjust to a variety of applications including: ablation, semiconductor FA, TFT/LCD, CF and cell LCM, and OLED repair.
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The Lorlin© Impact Series
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Benchtop Discrete Component Tester
Imapact 7BT
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
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Generators and Sources
For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional. The integration of source and measurement into a single unit greatly simplifies the test process. Semiconductor devices, sensors, displays or batteries etc can therefore be quickly and easily characterized.
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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IC/BGA Tester
Focus-2005
As a screening checker to detect defective devices(mainly electrostatic destruction)which are returned from fields before failure analysis process of IC/LC in the quality assurance division of semiconductor manufacture.As a screening checker to detect defective devices before acceptance inspection by IC/LSI expensive tester at semiconductor company(trading, manufacture)Short/Open checker for semiconductor sensor device.It is possible to measure two kinds of measurements which are constant voltag...show more -
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High Current SMU 600/1200/2400 A
AXC85xx
Generate extremely short, fully regulated current pulses in 4 ranges. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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Panel-mount Type Resistivity Meter (Four-Wire Transmission, 2-channel)
HE-960RW
HE-960RW connects resistivity sensor(ERF sereies) and measures resistivity and temperature in the sample water.This resistivity meter is ideal for such applications as the high-precision water monitoring employed at ultra-pure water plants used in semiconductor manufacturing.They utilize newly designed, high-precision, high-stability temperature measurement circuitry and a vastly improved temperature compensation function, an important element for measuring the resistivity of ultra-pure water.
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Software Options
Sonix offers powerful microscopy analysis software to enhance packaged semiconductor imaging, accelerate production and adapt systems based on the ECHO platform to customer-specific requirements.
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Semiconductor Test
Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
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Semiconductor
With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Deep Ultraviolet Observation System for Microscope
U-UVF248
Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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Power Module Test Cells
SPEA’s Power Module Test Cells are the complete industrial equipment oriented to the production test requirements of IGBT semiconductor power modules for consumer, transportation, energy production, industrial applications.SPEA’s Power Module Test Cells provide a turnkey solution for the automated handling, contacting and testing of these products, with the capability to force and measure the very high current (up to 1000 A) and voltage (up to 2500 V) values required for a complete, reliable test.
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LED
Scientific Computing International
A light-emitting diode (LED) is a semiconductor device that emits light when current flows through it.
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Remote Plasma Sources
Semiconductor and Electronic Thin Film applications use plasma sources to generate low-energy ions and radicals to react with material surfaces and chamber walls to remove contaminants and act as a precursor to aid in material deposition. MKS provides multiple options for radical generation including Toroidal and Microwave based Remote Plasma Sources supporting Fluorine, NF3, oxygen, nitrogen and hydrogen process chemistries.
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PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Semiconductor Functional Verification Tools
Trek5
Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
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Cleanroom Monitoring System
CRMS
The Kanomax Cleanroom Monitoring System offers turnkey solutions for monitoring needs required by various industries such as pharmaceutical, medical device, aerospace, semiconductor, and automotive.
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LED
light-emitting diode (LED) is a two-lead semiconductor light source. It is a pn junction diode, which emits light when activated. When a suitable voltage is applied to the leads, electrons are able to recombine with electron holes within the device, releasing energy in the form of photons.
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Metrology Systems
VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
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Atlas DCA Semiconductor Analyser
DCA55
Intelligent and flexible semiconductor analyser. Connect any way round! The DCA55 then displays the following on its backlit alphanumeric display:- Component type (such as NPN transistor, P-Ch MOSFET, LED, diode etc)- Pinout information (such as Base, Emitter, Collector etc)- Parameter measurement (hFE, Vbe, Vf, leakage current etc)
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Semiconductor Curve Tracer
CS-10000 Series
This optional unit minimizes parameter variation on devices causedby heat. Pulse rise time can be configured for 1, 3, or 5ms; pulse duration from 1ms to 20ms; and pulse interval from 100ms to 2 seconds. This option is installed at the factory. Any changes desired after purchase will require return the unit back to IWATSUfactory.
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Ultra-minute Photoelectric Sensor
EX-Z
Panasonic Industrial Devices Sales Company of America
At a thickness of 3mm, the EX-Z Series is one of the world's thinnest Photoelectric Sensors with a built-in amplifier which was achieved by utilizing a new Semiconductor packaging technology that does not use wire bonding. The compact design now makes it possible to install the sensors in narrow spaces that, in the past, could fit only a conventional fiber sensor head.
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Reliability & Qualification Testing Services
Integra Technologies is an industry leader in providing qualification, design verification and reliability testing services to semiconductor manufacturers and military/space/aerospace and automotive OEMs. Integra offers a full range of qualification services as well as the technical guidance to define a qualification plan that meets your requirements.
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Power Supplies
Excelitas Technologies designs and manufactures high-performance, custom-tailored power supplies and systems for leading OEMs in diverse markets including: Medical, Dental, Semiconductor, Industrial Manufacutring, Defense, Aerospace and Safety and Security. Our broad product portfolio, which leverages the latest advances in power conversion technology, is based on field-proven designs.
