Showing results: 1 - 15 of 27 items found.
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FilmTek 2000M -
Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.
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FilmTek 4000 -
Scientific Computing International
Fully-automated wafer metrology optimized for photonic integrated circuit manufacturing. Delivers unmatched measurement accuracy, with a 100x performance advantage over the best non-contact method and 10x that of the best prism coupler contact systems. Designed to enable optical component manufacturers to increase functional yield of their products, reliably and at lower cost.
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FilmTek 2000 -
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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OTDR600 -
PFO
The OTDR600 is an optical time domain reflectometry (OTDR) system for the measurement of attenuation and length of optical fibers. The OTDR600 is specifically designed for use in factories and laboratories where high linearity and productivity on factory spool lengths are crucial.
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FilmTek 2000 PAR -
Scientific Computing International
A low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. Utilizes patented parabolic mirror technology to measure wavelengths from DUV to NIR with a spot size as small as 13µm. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter.
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EOTPR 3000 -
TeraView Ltd
The EOTPR 3000 system is configured with a manual probe station to meet today’s tough FA environment which requires to isolate fault location in minutes rather than hours or days, while maintaining the EOTPR’s world leading sub-5 μm fault isolation accuracy.
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Greenlee Tools
Reflect a pulse.through the cable measuring length (time domain reflectometry).
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Platinum Tools
The Fault Trapper is a new class of tester using Spread Spectrum Time Domain Reflectometry (SSTDR) to monitor energized circuits.
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Psiber Data Systems
The CableTool uses TDR (Time Domain Reflectometry) technology to quickly identify an open or a short from 0 to 2,500 feet within a foot of the fault.
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MM-HTDR MediaManifold -
Crestron Electronics, Inc.
The Crestron MM-HTDR MediaManifold Cable Analyzer is a portable handheld device used to determine the length and integrity of RG6 cable runs. Using "time domain reflectometry," the MM-HTDR can measure cable lengths up to 1099 feet.
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PicoSource PG900 Series -
Pico Technology Ltd.
The fast-transition pulse can stimulate a transmission path, device or network with a broad spectrum signal in a single instant. Such a pulse is very useful for many of the high-speed broadband measurements that we need to make; for instance in time-domain reflectometry, semiconductor test, gigabit interconnect and port test and in radar.
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TE SERIES -
TrewMac Systems Pty Ltd
The TE SERIES Interactive Software provides a powerful set of formats and charts for fast analysis, and interfaces with a simple USB. Features include smith charts, multi series plotting, difference plotting, curve smoothing, annotations, cursors, time domain reflectometry and interference spectrum scanning.
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SL-200B -
HORIBA, Ltd.
Sludge Level Detector SL-200B measures the sludge level accurately using ultrasonic reflectometry, and supports more efficient operations, such as remote control and automation.The display section displays the sedimentation state visually and easily understandable using a color graph display. It contributes to sludge removal work.
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SE 500adv CER -
SENTECH Instruments GmbH.
* The SE 500adv combines ellipsometry and reflectometry, * Eliminates the ambiguity in layer thickness determination for transparent films, * Extends thickness measurement to 25000 nm. # Laser wavelength 632.8 nm# Spectral range of reflectivity from 450 nm to 920 nm wavelength# Spot size 80 ?m