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subatomic or minute speck of matter

See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection

Showing product results. 301 - 315 of 357 products found.

  • Fiber Inspection Probe


    FIP-920 Fiber Optic Inspection Probe combines a 3.5” high definition TFT LCD display, provides a detailed image of fiber end-face, zoom in/out feature make it easy to identify the smallest particles, scratches. With the attached SD card memory, you can capture/record the live end-face image, the image file can be reviewed/transferred via SD card reader or USB cable. Up to 8hrs battery working make it possible to inspect the fiber end-face at any time and any place.

  • Suspended Sediment Sensor

    LISST-StreamSide - Sequoia Scientific, Inc.

    Laboratory grade laser particle size analyzer compliant with ISO-13320-1 – same laser diffraction technology as in our other LISST lasers5 mm optical path length for high concentrations (read this article to compute how high concentrations the LISST-StreamSide can handle)Records detailed size distribution AND concentration in 32 size classesBuilt-in clean water delivery system for automatic clean water background collection5-inch graphics touch panel display for configuration and size distribution displayBuilt-in compact flash memory (128Mb standard, expandable to 4Gb)Size and volume distribution is computed on board and saved as ASCII file compatible with ExcelNominal 12VDC power (110VAC or 220VAC optional)Sealed NEMA-4X housing with clear cover and lockSpecially designed 12V sealed pump is available and recommended for use with the LISST-StreamSide

  • Piezobalance Dust Monitor

    3520 Series - KANOMAX USA, Inc.

    The Kanomax Piezobalance Dust Monitor 3521/3522 is a unique respirable aerosol monitor, providing direct mass concentration of particulates using PIEZOBALANCE technology; ideal especially for oil mist monitoring. The Kanomax 3521 is equipped with 4 and 10µm impactors while the 3522 is equipped with a 2.5µm impactor. Unlike conventional dust meters, which count particles, a piezobalance dust meter like the 3521 or 3522 “weighs” mass concentration of particulates. As an air sample enters the system, it travels through the impactor, which captures and removes larger particulates away from the sample. Smaller particulates become electrically charged and deposited on the piezo-crystal. The total mass of the deposited particulates affects the piezo-crystal’s frequency. Since the change in frequency is proportional to the mass of the particulates, the actual weight of the particulates is obtained.

  • BET Flowing Gas Surface Area Analyzers

    SA-9600 Series - HORIBA, Ltd.

    The surface area of a material is, in many cases, as important as the chemical properties. As particle size decreases, surface area increases. Porosity of materials - from micropores to macropores - contribute even more to the total surface area. The interface at the surface is what defines how a solid reacts to other substances, be they gases, liquids, or solids.Surface area can impact shelf life, stability, dissolution and efficacy of pharmaceutical powders and tablets. Likewise, surface area can affect the rheological properties and hiding powers of pigments, paints, and coatings. It has a significant impact on the ability for materials like catalysts, adsorbents, filtration materials and air separation products to react in the designed application. Ceramics used in applications ranging from; dinner plates, to dental implants, to electronics, all are affected by surface area.

  • Defect Inspection and Review

    KLA-Tencor Corp

    KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.

  • Digital Dust Monitor

    3443 - KANOMAX USA, Inc.

    The Kanomax Digital Dust Monitor – Model 3443 measures aerosol concentrations corresponding to PM10. The intake isolates the aerosol sample so that the optics chamber is kept sterile for improved reliability and low maintenance. The unit measures 0.1 to 10µm particle size aerosol contaminants such as fumes, dust, smoke and mists. It is battery-operated, data-logging, light-scattering laser photometer that gives you real time aerosol mass readings. It is also suitable for clean office settings well as harsh industrial workplaces, construction and environmental sites, and outdoor applications.

  • Electron Multipliers

    Hamamatsu Photonics K.K.

    Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.

  • Electronic Components Test

    Lisun Electronics Inc.

    Parameters to be measured (absolute value): Measure hypo-class U, Iout, Hz, Hc, Br, Bm, Hm, Br /Bm, m, magnetic core loss, B-H curve, U curve and I curve Output capacity of the high frequency power: Uout: 1~300V, Iout: 0.05~5A, Pout: 300VA, frequency: 10~300kHz Accuracy: 2% With 12-bit high-speed A/D, sampling rate up to 40MHz, ensuring data precise and stable test result Supermaximal database, suitable for almost all kinds of magnetic material in market, such as: circle, E ,U , ETD-EER, JAR, RM , EP , PM , EL , ER, PQ, EFD, plane E, etc Perfect software interface enables observation of curve in detail Meet international test requirements for magnetic particle ASTM E1444, ASTM E709-08.

  • Produce Quality Meter

    F-750 - Felix Instruments

    The F-750 Handheld Brix & Dry Matter Meter uses near-infrared (NIR) spectroscopy to estimate quality metrics such as dry matter, Total Soluble Solids (TSS or brix), titratable acidity, and color. Working like a high-powered flashlight, the F-750 sends particles of light into a commodity, then measures the NIR light interactance with molecular components inside of the commodity to quantify user-selected traits. The F-750 has a wide range of applications, from determining optimal harvest timing by assessing fruit maturity, to providing an objective analysis of produce quality of fruit in packing houses and upon import. The F-750 is a handheld, fully integrated system, allowing users to operate it out in the orchard or inside the QA lab. Its simple, intuitive user interface makes it easy for anyone to use, while its model building software makes it customizable and versatile.

  • Vibrating Sample Magnetometer

    VSM - Dexing Magnet Tech. Co., Ltd

    The VSM (also named M-H CURVE Hysteresis Graph TEST SYSTEM ) can be used for the measurement of the basic magnetic properties of the magnetic materials. Such as the Hysteresis loops of the materials, Magnetization curve, Warming Curve , Warming /Cooling curve, Cooling curve and the changes of the temperature as time goes away , then we will get some Magnetic parameters such as the Saturated strength of the magnetization, the left strength of the magnetization , Coercive force, the Max of Magnetic energy product,the Curie temperature and the Magnetic conductivity(the Initial Magnetic conductivity is included ). It can also measure the magnetic materials such as the powder, the particles, the films, the liquid and the massive.

  • Sand And Dust Test Chambers

    Dongguan Amade Instruments Technology Co., Ltd

    Sand and dust test chamber is also referred as dust-proof chamber, which is able to simulate the sand storm by putting the test piece in the chamber to judge the damage of sand-and-dust weather to products. Equipment is mainly applicable to determination of sealing performance of product shells based on the IPX5 and IPX6 degrees. Testing machine features a flow of air carrying dust in a vertical circulation, resulting in cycle use of sand during the test. Sand and dust testing has great significance to master the specimen’s performance to defend the penetration of dust particles, to withstand the abrasion of sands.

  • Failure Analysis

    Pacific Testing Laboratories

    A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)

  • Capacitive Proximity Sensors

    SICK Sensor Intelligence

    Sometimes you need to know what is hidden beneath a surface. Behind a wall, for example, inside a storage container, inside a shipping container, or behind a cover. Capacitive proximity sensors are ideal for level and feed monitoring. From solid material, such as paper or wood, to granules or liquids, they can be relied upon to detect what is happening in the production process and during final inspection. Is there something behind that cover? Is the finished package really full? How much paint is still left in the tank? For capacitive proximity sensors, these are easy questions to answer. SICKs capacitive proximity sensors are never far from the action. Sensing ranges between 1 and 25 mm allow them to be used in nearly all installation situations, making them extremely adaptable for a wide range of applications. These sensors are also remarkably resistant to interference. Impurities, contamination, dust, and airborne spray particles have little effect on them, nor does electromagnetic interference. No wonder they are installed in a wide range of industries, such as food and automotive, or in storage and conveyor systems.

  • 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer

    PXIe-5763 / 785162-01 - NI

    The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.

  • 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer

    PXIe-5764 / 785171-01 - NI

    The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.

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