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Particle

subatomic or minute speck of matter

See Also: Nanoparticle, Airborne Particle, Particle Accelerator, Particle Counters, Particle Detection


Showing product results. 271 - 285 of 357 products found.

  • ±3 kV Electrostatic Chuck Supply

    Model 646 - TREK, INC.

    Trek’s Model 646 software-driven Electrostatic Chuck Supply offers an array of features that provide significant benefits while accommodating a variety of demanding applications. Model 646 incorporates Trek technology which has demonstrated increases in efficiency and throughput equal to three times that of other supplies. Virtual elimination of sticky wafer and wafer popping issues ensures better control over particle contamination. Given the versatility and performance of the Model 646, it can be used in multiple unique tools/processes, thus eliminating the need to specify a new supply for each unique tool/process in a facility.

  • 12-Bit, 6.4 GS/s, DC-Coupled, 2-Channel PXI FlexRIO Digitizer

    PXIe-5774 / 785647-01 - NI

    The PXIe-5774 provides up to 3 GHz of DC-coupled analog bandwidth and 12 bits of resolution. You can operate the PXIe-5774 in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The voltage ranges are software-selectable and include 200 mV peak-to-peak and 1 V peak-to-peak, with a selectable DC offset. The PXIe-5774 is ideal for time-domain measurements in areas such as scientific instrumentation, medical imaging, and particle physics. The FlexRIO driver includes support for finite acquisition, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA.

  • 12-Bit, 6.4 GS/s, DC-Coupled, 2-Channel PXI FlexRIO Digitizer

    PXIe-5774 / 785647-02 - NI

    The PXIe-5774 provides up to 3 GHz of DC-coupled analog bandwidth and 12 bits of resolution. You can operate the PXIe-5774 in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The voltage ranges are software-selectable and include 200 mV peak-to-peak and 1 V peak-to-peak, with a selectable DC offset. The PXIe-5774 is ideal for time-domain measurements in areas such as scientific instrumentation, medical imaging, and particle physics. The FlexRIO driver includes support for finite acquisition, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA.

  • DEFECT INSPECTION

    Semilab

    "Bulk Micro Defects," (BMD) is a term commonly used to refer to oxygen precipitates in silicon. In fact, many imperfections in the silicon lattice create defects, and BMDs could be any imperfections including oxygen precipitates, voids, inclusions, slip lines, etc. BMDs go by many names, referring to the problems they cause, how they were created, or their physical characteristics. Examples include COPs (Crystal Originated Particles) and Grown-In Defects.Dislocations can be formed during crystal growth but also at thermal processing of wafers, during CMOS device manufacturing like epitaxial layer growth and implant anneal steps.

  • 12-Bit, 6.4 GS/s, DC-Coupled, 2-Channel PCI FlexRIO Digitizer Device

    PCIe-5774 / 785648-01 - NI

    —The PCIe-5774 is a PCI FlexRIO Digitizer Device that provides up to 3.2 GHz of DC-coupled analog bandwidth and 12 bits of resolution. You can operate the PCIe-5774 in a dual-channel mode at 3.2 GS/s or in a single-channel interleaved mode at 6.4 GS/s. The voltage ranges are software-selectable and include 200 mV peak-to-peak and 1 V peak-to-peak, with a selectable DC offset. The PCIe-5774 is ideal for time-domain measurements in areas such as scientific instrumentation, medical imaging, and particle physics. The FlexRIO driver includes support for finite acquisition, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA.

  • Energy Dispersive X-Ray Spectroscopy (EDS)

    Rocky Mountain Laboratories, Inc.

    Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.

  • Alpha Spectroscopy

    ORTEC

    Alpha spectroscopy is used to identify and quantify radionuclides based on the alpha particles emitted in the decay process. Similar to Gamma Spectroscopy, energy spectra are generated with high precision detectors and electronics and analyzed with special software. Typically, samples are measured following chemical separation to isolate the radionuclides of concern due to the complexity associated with correcting for these interferences with spectrum analysis software as is common for many Gamma Spectroscopy measurements.

  • Camera Module Tester

    Evolusys Technologies Sdn. Bhd.

    • Lens Focusing plus Far Field Sharpness Testing - CTF/MTF/SFR• Near Field Sharpness Testing - CTF/MTF/SFR• Flat Field Grey Image Testing - Optical center, Defect pixels, particles, blemish, shading, color shading, color ratio, SNR, etc.• Dark Field Image Testing - Hot pixels, dynamic range, SNR, etc.• Current Measurement - Active, standby

  • Electronic Moisture Analyzer

    MOC-120H - Shimadzu Corp.

    The moisture content of a variety of samples can be measured using an array of drying modes. The drying status can be seen at-a-glance with the fluctuation range display. Active in a variety of fields (cereals, starch, flour, noodles, brewed products, sea foods and marine products, meat products, spices, sweets, dairy products, dried foods, vegetable oils and other food articles; pharmaceuticals; ores; cokes; glass materials; cement; chemical fertilizers; pulp and paper; cotton; various fabrics and other industrial goods); enabling measurement of samples (cereals, foods, and chemical products) under various conditions (powder, particles, paste, and liquid).

  • Evaporative Light Scattering Detector

    ELSD-LTII - Shimadzu Corp.

    The ELSD-LTII utilizes a high-efficiency LED and enhanced digital signal treatment to minimize noise and deliver optimum sensitivity for trace analysis. An innovative cell design also reduces band broadening and allows sensitivity levels below 200 picograms. The high-performance optical detection system can also be used for combinatorial chemistry and high-throughput screening applications. The new Low Temperature Evaporative Light Scattering Detector (ELSD-LTII) is an easy-to-operate, universal detector that identifies analytes with uniform sensitivity regardless of their spectroscopic properties. It is not a spectroscopic detector. Instead, it removes the mobile phase through evaporation and then makes a light scattering measurement of the dried analyte particles.

  • FlowControl-Lab

    Sequoia Scientific, Inc.

    Periodically filtered measurements allow for high-accuracy differential measurements of particle propertiesElectrically-actuated three-way ball valve allows flow to be bypassed through submicron filter cartridge before instrumentationIncludes valve, power supply, controller, one paddlewheel flow sensor, cables, and Windows softwareValve position indicatorFlow sensor data indicates proper system functioning, filter fouling and are used for post-processing and QCRemovable flow sensor windows for flow visualization, cleaning and servicingSoftware allows for valve scheduling, manual setting of valve position and logs flow rates and system state to hourly ASCII filesRugged construction for use in laboratory, ship-board, or dock-side applications

  • NIM-Modules

    FAST ComTec GmbH

    The "dual channel" TDC'''' - Model 7072T - converts time directly to a digital output. They offer improved performance and linearity specifications compared to separate TAC and ADC modules. There is also the Wilkinson-type ADC, Model 7070 which is suitable for high resolution HPGe detectors. Our Constant-Fraction discriminators are still state-of-the-art even after a more than 20 Year history. The Differential CFD - Model 7029A - still offers the highest counting rate (>50 MHz) of any such devices. Our Pulse-Shape Discriminator - Model 2160A - can be used to separate neutron and gamma particles, alphas and protons, electrons and alphas etc depending on the detector used.

  • Thermal-Optical Analysis

    Elemental Analysis, Inc.

    As with other current organic carbon and elemental carbon (OC/EC) procedures, Thermal-Optical analysis is method-defined. However, this unit has been designed to specifically address some of the problems observed in other methods in assigning carbon to either the organic or the elemental fraction. By careful system control and continuous monitoring of the optical absorbance of the sample during analysis, this method is able to both prevent any undesired oxidation of original elemental carbon and make corrections for the inevitable generation of carbon char produced by the pyrolitic conversion of organics into elemental carbon. The OC/EC instrument utilized by EAC is used to analyze both bulk samples, and aerosol particles collected on quartz-fiber filters.

  • PCIe Gen3 High speed, compact Camera for Testing

    CB013MG-LX-X8G3 - XIMEA GmbH

    High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.

  • PCIe Gen3 High Speed, Compact Camera for Testing

    CB013CG-LX-X8G3 - XIMEA GmbH

    High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.

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