Showing results: 331 - 345 of 1738 items found.
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Y1243A -
Keysight Technologies
Y1243A Cable Kit for M9301A local oscillator (LO) distributes 4 LO output signals from the M9301A PXIe synthesizer to up to 4 channels within one chassis.
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787893-33 -
NI
PXIe, 2.7 GHz Dual-Core or 2.6 GHz Quad-Core Processor PXI Controller - The PXIe‑8840 is an embedded controller for PXI systems. You use it for processor-intensive, modular instrumentation, and data acquisition applications. The PXIe‑8840 includes two 10/100/1000BASE‑TX (Gigabit) Ethernet ports, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive, serial port, and other peripheral I/O.
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782377-01 -
NI
6 GHz, 80 MHz Bandwidth, RF and Baseband PXI Vector Signal Transceiver—The PXIe‑5645 combines a vector signal generator and vector signal analyzer with FPGA-based real-time signal processing and control into a single device, also known as a VST. Because of this software-designed approach, the PXIe‑5645 offers the flexibility of a software defined radio architecture with RF instrument class performance. The PXIe‑5645 features a high-performance, differential or single-ended baseband I/Q interface. This interface allows the PXIe‑5645 to address many additional applications, such as testing both the upconverted RF and downconverted baseband signals of a device with a single instrument.
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783131-01 -
NI
PXIe, 6½-Digit, ±300 V, Onboard 1.8 MS/s Isolated Digitizer, L and C Measurement Support, PXI Digital Multimeter—The PXIe‑4082 is a high-performance 6½‑digit, 300 V DMM that provides the measurement capabilities found in two common test instruments: a high-resolution DMM and a digitizer. As a DMM, the PXIe‑4082 delivers fast, accurate AC/DC voltage, AC/DC current, 2‑ or 4‑wire resistance, frequency, period, and basic L and C measurements, as well as diode tests. In the high-voltage, isolated digitizer mode, the PXIe‑4082 can acquire waveforms at sample rates up to 1.8 MS/s.
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Keysight Technologies
Get both signal generation and analysis in one PXIe module with real-time field-programmable gate array (FPGA)-accelerated measurements for faster throughput. The PXIe vector transceiver is perfect for manufacturing test of wireless devices, RF power amplifiers, and front-end modules.
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M983xA Series -
Keysight Technologies
Keysight’s M983xA PXIe vector network analyzer (VNA) combines all your measurements into a single instrument, enabling multisite, multi-DUT, multiport system characterization with faster speeds and greater flexibility.
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780992-02 -
NI
PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument—The PXIe‑6544 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXIe‑6544 can sample digital waveforms at up to 100 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6544 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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780992-03 -
NI
PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument—The PXIe‑6544 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXIe‑6544 can sample digital waveforms at up to 100 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6544 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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783486-01 -
NI
Kintex 7 325T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module—The PXIe‑7822 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7822 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7822 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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783485-01 -
NI
Kintex 7 160T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module—The PXIe‑7821 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7821 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7821 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in-‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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783484-01 -
NI
Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module—The PXIe‑7820 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7820 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7820 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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AMETEK VTI Instruments
The EMX-75XX Series adds to AMETEK VTI Instruments' growing PXI Express (PXIe) Core Automated Test Equipment (ATE)TM family as a high-current, high-density digital input/output line of modules. Unlike many static I/O PXIe modules on the market today, the EMX-75XX Series can sink or source up to 300 mA on each channel. Delivering beyond just 2 V and 5 V, engineers can program the cards to support a wide range of voltages and more—on every channel, for both input and output.
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HSS-8324-DSP -
Conduant Corporation
The Conduant HSS-8324 FPGA board provides a user programmable hardware platform that is able to sustain full-duplex high-bandwidth transfers through its 8-lane Gen3 PXI Express (PXIe) interface and its two 12-lane HSS interfaces while performing complex calculations. The PXIe interface provides a theoretical maximum throughput of 8 GBps (simultaneous in and out) while each HSS port (12 lanes up to 16 Gbps per lane) supports a full duplex transfer at theoretical rates over 190 Gbps.
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784224-01 -
NI
PXIe, 100 MHz, 4- or 8-Channel, 14-Bit, Kintex-7 325T or 410T FPGA Reconfigurable PXI Oscilloscope—The PXIe 5172 high-density PXI oscilloscope has eight simultaneously-sampled channels with flexible settings for coupling and voltage range. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 250 MS/s or 100 MHz of analog bandwidth and advanced PXI synchronization.
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81011-03 -
NI
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
