Showing results: 1 - 4 of 4 items found.
-
EL–MT01M -
Chinup Technology Co., Ltd.
Application off-line PV module quality inspection. Type Manual loading/ unloading. 2/3-inch CCD camera Resolution up to 1.3 Mega Pixels
-
EL-CT01A -
Chinup Technology Co., Ltd.
Most power-lose of PV panel is caused by the internal cell crack. The EL-CT01A is usedto take the EL image of solar cell. By reviewing the EL image, user can judge the cellquality as easy as looking at a X-ray picture.
-
SolarWIS Platform -
ASM Assembly Systems
Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
-
k-Space Associates, Inc.
The kSA Emissometer is designed to quickly and easily generate high-resolution diffuse and specular reflectance and total emissivity maps of MOCVD carriers. Carrier emissivity variation means temperature non-uniformity, which can lead to reduced device yield and possibly complete growth run failure. With the kSA Emissometer, emissivity changes can be tracked to determine carrier end-of-life, without wasting growth runs. The kSA Emissometer also detects unwanted residual deposits after baking, and easily identifies carrier surface defects, scratches, microcracks and pits that are not visible to the eye.
