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Showing results: 286 - 300 of 515 items found.

  • Photomask Stations

    Probing Solutions, Inc.

    Fast, sensitive, economic, off-line photomask defect review. Our 300 series photomask inspection and review stations use long working-distance microscopy and a unique four-way lighting system to greatly speed up location and identification of micron- and submicron-sized defects

  • Multi-Functional Optical Profiling system

    7505-01 - Chroma ATE Inc.

    Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.

  • Laser Diode Characterization System

    58620 - Chroma ATE Inc.

    The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.

  • Digital Motorized BRINELL Hardness Tester

    900-355 - Phase II Plus

    Load Cell driven system provides precise control of test force application Direct digital reading Engineered to obtain highly sensitive and accurate readings Perfect for laboratories, workshops, tool rooms, inspection labs, etc. Measuring Range: 8-650HBW

  • Machine Vision Software

    AutoVISION® - Microscan Systems, Inc.

    Microscan’s AutoVISION is the easiest machine vision software available for basic to mid-range vision applications. Process and manufacturing engineers no longer need to become experts in machine vision in order to successfully deploy a system that meets their traceability, inspection and quality control needs.

  • Inspects MEMS and Wafer Level Devices

    NorCom 2020-WL - NorCom Systems Inc.

    The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.

  • Entry Level AOI

    iSpector - Marantz Electronic Ltd.

    The Mek iSpector series AOI machines are fully compatible with Mek’s Catch System for classification, repair and SPC, utilizing the same powerful 22X software that is used in the premier Mek PowerSpector series.  There is no compromise on the wide range of inspection algorithms and component libraries.

  • 3D Solder Paste Inspection

    TR7007 - Test Research, Inc.

    The TR7007 ultra-high-speed 3D Solder Paste Inspection adopts the Fringe Pattern Technology and dual light source, can solve the shadow and reflection problem simultaneously. It is equipped with a linear motor and linear scale that provides a highly accurate X-Y Table system.

  • Endoscopes

    PCE Instruments

    Originally designed for the medical sector, endoscopes are the ideal tool for inspection and maintenance today. Endoscopes offer new perspectives to viewing the insides of machines. Thanks to their flexible fibre optic cables and light weight enclosure, these extraordinary endoscopes are the ideal tool for inspection and maintenance. Endoscopes can locate problems and conflicts of the system very easily and quickly, allowing for preventative measures to be taken without the need to dismantle the machinery first. Complex dismantling of machines is usually very time and cost intensive. With the help of endoscopes, inspections in an industrial sector can therefore be organized considerably faster, more aimed and more cost-efficiently Endoscopes are used mainly by electricians, security personnel, specialists in the professional sector, and mechanics of all types. All of our endoscopes are ***Not for medical use***

  • Batch AOI Machine

    Sherlock-300B - Manncorp

    Compact Sherlock 300B batch PCB inspection (AOI) system provides manufacturers with the benefits of inline AOI—hands-off board handling, automatic good/bad board sorting and minimal operator interaction—in the convenience and flexibility of a standalone AOI station that can be located anywhere in the facility and used to process boards from multiple production lines, including production lines that aren't inline/automated, such as smaller and benchtop lines. With an average cycle time of 10 seconds per board (including transport), Sherlock 300B automated optical inspection (AOI) machine can be used for everything from first article to 100% inspection for increased quality and production yields. (Cycle time measured using a 7.3" x 5.1" (185 x 130 mm) PCB with 253 parts.)

  • Vision System

    Axiomtek Co., Ltd.

    Axiomtek's vision system series is designed to focus on vision inspection, guidance, measurement and identification applications. The products have already gone through a complete set of compatibility experiments to eliminate potential integration problems, significantly helping users reduce development and staffing costs as well as accelerate system deployment in factory automation environment.

  • ECHO VS System with Image Enhancement

    Echo VS - Sonix Inc.

    The ECHO VS system adds our Image Enhancement Suite to the ECHO platform to provide industry-leading image quality and defect identification capabilities. It’s our most accurate ultrasonic NDT equipment for development labs and for production environments that require the highest precision. The Echo system can be fitted with an optional chuck for manual wafer inspection.

  • LCZ LCR Meter

    SS1062 - Sanshine Electronis Co., Ltd.

    This (SS1061 / SS1062 / SS1063) LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they  are actually optimum test instruments for component incoming and production inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor, cable, wire, etc..

  • LCZ LCR Meter

    SS1061 - Sanshine Electronis Co., Ltd.

    LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they are actually optimum test instruments for component incoming and production inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor,cable,wire,etc.

  • microLED Testing System

    OmniPix-ML1000 - InZiv

    The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.

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