Showing results: 16 - 23 of 23 items found.
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HALT HASS Chamber -
Thermotron Industries
AST applies stresses (such as temperature and vibration) to products well beyond its normal use environment. This type of testing is done to determine product operating and destruct limits. These stresses are applied as the product is functionally tested and continuously monitored for failures.Highly Accelerated Stress Testing (HALT) and Highly Accelerated Stress Screening (HASS) are two types of accelerated stress testing. These types of tests are commonly used to eliminate design problems, helping to develop a robust, mature product prior to market introduction. It can also be used to screen out infant mortality issues prior to shipment.
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HALT And HASS Testing -
TetraTek Products, Inc.
Our VibraTek TM Division manufactures precision machined, magnesium, and aluminum vibration fixtures with stainless steel and aluminum hardware. These fixtures feature TetraTek developed clamps, retainers, connectors, circuit boards, and cable sets to provide you with the ideal testing arrangement for your products while they are tested for HALT (Highly Accelerated Life Testing) and HASS (Highly Accelerated Stress Screening) response.
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JUNG-FLUIDTECHNIK GmbH
The Magnet Tester invented by JUNG locates magnetic fields and notify it with its integrated lamp: compact, simple and fast!Easily check switch conditions with zero set-up time and no need to halt operations. The magnetic field test stylus is an indispensable tool for countless companies and toolboxes. Its light-function also makes it as an ideal flashlight.
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ESS -
ESPEC North America, INC.
Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of your product.
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National Technical Systems
Highly Accelerated Life Testing (HALT), Highly Accelerated Stress Screening (HASS), and Accelerated Weathering are three methods utilized for early determination of potential problems your products may encounter during the course of their lifetime. These methods are conceptually similar to fatigue testing, as they attempt to wear out test materials or products at highly accelerated rates.
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ACMAS Technologies Pvt. Ltd.
The extremely accelerated stress environment is defined by high temperature, high humidity and high pressure. WEIBER provides humidity resistance evaluation test for electronics components through customized Extremely Accelerated Stress Test Chamber. This chamber provides high performance test in minimal amount of time according to international IEC 60068-2-66 standard. This chamber also known as Accelerated Stress Test Chamber, Halt and Hass Test Chamber, Halt Test Chamber and Hass Test Chamber.This chamber reduces the time taken for humidity testing in electronic components. 2 types of tests saturated and unsaturated extremely accelerated stress test can be performed. In saturated test the temperature is maintained at 1210C at 100%RH, and for unsaturated temperature of 110, 120, 1300C is maintained at 85%RH. Normally for electronic components unsaturated type test is done.
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USB Multilink ACP -
P&E Microcomputer Systems
P&E’s USB Multilink ACP is a debug probe which allows a PC/laptop access to JTAG/SWD on ARM Cortex devices from several manufacturers (see complete list below). It connects between a USB port on a Windows machine and the standard debug connector on the target. The product photos to the left of this page show how the headers can be accessed by simply flipping open the plastic case. Ribbon cables suitable for a variety of architectures are included. By using the USB Multilink ACP, the user can take advantage of the debug mode to halt normal processor execution and use a PC to control the processor. The user can then directly control the target’s execution, read/write registers and memory values, debug code on the processor, and program internal or external FLASH memory devices.
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Xpedition -
Mentor Graphics Corp.
As the industry’s market share leader in PCB design software, the Mentor Graphics® Xpedition product augments mechanical analysis and physical testing by introducing virtual accelerated lifecycle testing much earlier in the design process. This is the industry’s first PCB-design-specific vibration and acceleration simulation solution targeting products where harsh environments can compromise product performance and reliability, including the military, aerospace, automotive and industrial markets. Traditional, physical HALT (highly accelerated lifecycle testing) is conducted just before volume manufacturing, and requires expert technicians, which can result in costly schedule delays. Bridging mechanical and electronic design disciplines, the Xpedition product provides vibration simulation significantly faster than any existing method. This results in increased test coverage and shortened design cycles to ensure product reliability and faster time to market. The Xpedition component modeling library is the most extensive in the industry, comprised of over 4,000 unique 3D solid models which are used to create highly defined parts for simulation. The 3D library allows users to easily match geometries to their 2D cell database. Designers can assemble the parts models on board and automatically mesh them for performance analysis, including stiffeners and mechanical parts. The system modeling tool is ultra-fast since it can model over 1,000 components per minute.
