Showing results: 16 - 19 of 19 items found.
-
EIIT, S.A.
Control develops and supplies fixtures and test accessories :*For a vast field of applications - ICT (In-Circuit Test), functional test, Flash programming, EoL (End-of-Line) test systems, etc.*For all handling systems currently used in the market: online or offline, mechanical, pneumatic or vacuum operation*From simple mechanical fixtures, with a few hundred probes and low production volumes, to highly complex accessories with thousands of probes, double-sided probes, double acting, etc.
-
LXinstruments GmbH
Manufacturers of electrical or electronic products are required by law to carry out an electrical safety test before placing them on the market. This final test takes place at the end of the manufacturing process and is therefore also referred to as an EOL test (end-of-line). Depending on the prescribed standard and directive, the following parameters are tested:- Leakage current and discharge current- Insulation resistance or the insulation strenth- Dielectric strength or electric strength- Correct installation of the protective conductor (ground continuity and ground bond test)- Faultless functioning of the product under the conditions defined for intended use (function or run test
-
UTP 6010 RF -
NOFFZ Computer Technik GmbH
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
-
CATR Radar Test System UTP 5069 -
NOFFZ Computer Technik GmbH
Modern driver assistance systems must recognize increasingly complex traffic scenarios and convert them into appropriate vehicle reactions with the help of artificial intelligence (AI) and specific algorithms. Imaging radar sensors with a higher spatial resolution, so-called imaging radar sensors, are therefore required. These can better distinguish larger from smaller objects and, due to the larger antenna apertures, also require larger dimensions of the test environment or larger far-field distances. Testing these sensors in the direct far field ( UTP 5065 ) would therefore require very large absorber chambers up to ten meters in size and more.Our efficient test system UTP 5069 offers exactly the right solution:By using CATR technology (Compact Antenna Test Range), 4D, imaging and other radar sensors with large far-field distances are calibrated with high precision in a small footprint. With the extremely low-reflection NOFFZ absorber chamber, the system is very well suited not only for validation, but also for EOL tests.
