Showing results: 856 - 870 of 927 items found.
-
D.L.S. Electronic Systems, Inc
EMC testing and consulting services to the Electronics, Medical Equipment, Automotive, Aerospace, Computer, Telecommunications, and other industries. We are a NVLAP certified test facility, capable of testing electronic equipment to today's high frequency requirements. Our 14 Test chambers and 3 Open Area Test Sites can perform full scan Immunity and Emission testing at frequencies up to 40 GHz. Please contact us for your specific requirements.
-
ITF -
Raytheon Company
The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
-
H-Series CATR -
Emite Ingeniería SL. Ed
The H-Series CATR chamber provide complete 3D performance assessment for 5G OTA devices and antennas including gain, efficiency, directivity, polarization and beam characteristics for frequencies from 3 up to 110 GHz, capable of supporting forthcoming 5G Sub-6 GHz (from 3 to 6 GHz) and mmWave (24 to 110 GHz) standardized testing including TRP/TIS, EIRP, EIS, IBB and emissions in accordance to 3GPP TR38.810 and TR37.842.
-
B6700 Series -
Advantest Corp.
B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
-
LTR600 Series -
Smartech Inc.
Level Test & Calibration Rig – a boon to Petrochemical Refineries & other process Industries – relies on state of the art simple design for Primary & Interface liquid level testing & calibration of various types / models of Level Measurement (& control) devices including Float / Displacer / Radar / Capacitance / Ultrasonic / Magnetic – for both In-built & External Chamber types. Available Ranges / Span are 1000mm / 1500mm & 2000mm (1 / 1.5 & 2 Meters).
-
N2797A -
Keysight Technologies
Testing devices over extreme temperature ranges is quite common these days. The N2797A single-ended active probe is the industry’s first low-cost high input impedance active probe with rugged probe tips for environmental chamber testing of ICs and devices. It gives the ability to probe signals at drastic temperature swings ranging from –40 °C to +85 °C. The probe provides 1.5 GHz of bandwidth and a 2 m long cable.
-
dB Technology Ltd.
We have a CTS C-65/100 Climatic Test Chamber available for hire at dB Technology.They have available:*Internal dimensions: 500 x 500 x 400mm (w x h x d)*Temperature range: -65°C to +180°C*Heating rate: 3°C/min*Cooling rate: 2°C/min*Climatic temp range: +10°C to +95°C*Humidity Range: 10 to 98% RH
-
LPDDR4 and LPDDR3 -
Triad Spectrum, Inc.
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
-
NMR-EA300 System -
Caylar
The NMR-EA300 system is the reference for calibrating magnetic sensors. It allows to generate an absolute magnetic field at <±10mG (0.1 uT) without temperature drift (<0.1ppm/C°) over a range from 14mT to 3T. This system is composed of an EA300 electromagnet with NMR poles, a MPU-16U ±150A ±70V current source of class 1ppm and a NMR20 Teslameter with a magnetic field controller (FR020).A thermostat chamber can be installed in the air gap (Optionally available on 50mm and 70mm gap poles).
-
Model T750 -
Teledyne Advanced Pollution Instrumentation
The Model T750 is a portable, microprocessor based calibrator for precision gas analyzers. Using highly accurate mass flow controllers combined with compressed sources of standard gases, calibration standards are provided for multipoint span and zero calibrations. The T750 is housed in a high-density, molded travel case which includes an integral handle and wheels for durability and ease of use in the field.The Model T750 can be equipped with an optional UV ozone generator for accurate, dependable ozone calibrations, and production of NO2 when blended with NO gas in the included, internal gas phase titration (GPT) chamber. An optional photometer allows even more precise control of the ozone generator giving accurate and dependable ozone calibrations and enhanced GPT. A number of calibration sequences may be programmed into the non-volatile memory of the Model T750, covering time periods up to a year.
-
LEM Series -
HORIBA, Ltd.
Our Real Time Interferometric Process Monitor provides high precision detection of film thickness and trench depth during the etching/deposition process.Depending on applications, LEM camera includes a 670 or 905 or 980 nm laser and when mounted on any dry etch/deposition process chamber with a direct top view of the wafer this generates a small laser spot on the sample surface.Interference occurs when monochromatic light hits the sample surface, resulting in different optical path lengths due to film thickness and height variations in the film.This allows the etch/deposition rate and thus thickness to be monitored in real time, also fringes counting or more complex analysis, providing enhanced process control Endpoint for a wide variety of processes. Additionally interfaces can be detected by their change in reflectivity.
-
EV Group
ith over 15 years experience in designing and manufacturing precision wafer bonding equipment, EVG wafer bonding systems are well recognized in setting industry standards for the MEMS production industry. Besides supporting wafer level and advanced packaging, 3D interconnects and MEMS fabrication, the EVG500 series wafer bonding systems can be configured for R&D, pilot-line or volume production. They accommodate the most demanding applications by bonding under high vacuum, precisely controlled fine vacuum, temperature or high pressure conditions. Multiple bonding methods including anodic, thermo compression, glass-frit, epoxy, UV and fusion bonding are covered. Based on a unique modular bond chamber design the EVG500 series allow for an easy technology transfer from R&D to high volume production.
-
Model 6200T -
Teledyne Analytical Instruments
The Model 6200T Total Sulfur Analyzer utilizes proven UV fluorescent technology to continuously detect sulfur found in inert gas streams. An internal, quartz catalytic converter is employed to convert the sulfur, when mixed with scrubbed ambient air, into SO2 via higher temperature oxidation. An internal vacuum pump is employed to draw both the sample and the ambient air into the converter. The converted sample gas is fed to the fluorescence chamber where it is then exposed to ultraviolet radiation.
-
EZT-570i -
Cincinnati Sub-Zero Products
The EZT-570i Touch Screen Controller offers a 7" (18mm) or optional 10" (25 mm) touch screen and the latest in test chamber programming for ease of use . The controller comes standard with data logging, data file access via memory stick or PC, Ethernet control and monitoring, alarm notification via email or phone text message, data file backup, full system security, online help & voice assistance in multiple languages and more.
-
ACTAS -
KoCoS Messtechnik AG
Portable and stationary test systems for performing fully automatic function tests on all types of switchgear devices, including the drive units of switch bays. ACTAS test systems provide precise information as to the condition of the chamber and drive unit without requiring them to be opened. The sheer number of parameters to be determined, the wide variety of different types of switchgear equipment in use and the harsh environmental conditions encountered during on-site tests place extreme demands on test equipment.
