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Showing results: 2761 - 2775 of 2956 items found.

  • 3U CPCI To PCI 4 Slot Adapter

    PCI EmbeddedComputer Systems

    The PCI-Adapter is a carrier board, allowing the operation of any standard (desktop) PCI card in a CompactPCI® system. The PCI-Adapter acts as a PCI bridge, providing an electrically and mechanically optimized interface between PCI and CompactPCI® system. Our adapters include a PCI Bridge. Some competitor products do not provide a PCI bridge, thus reducing adapter costs by tolerating a violation of the PCI specs. Overall PCI compatibility however is a must in order to achieve total system reliability. Please bear these facts in mind, when comparing prices of PCI-Adapters. All modern operating systems can treat a PCI bridge in a plug and play manner meaning that the bridge remains virtually transparent, as if the PCI component(s) behind the bridge on the secondary PCI bus were part of the primary PCI bus. Using the PCI-Adapter/bridge allows standard PCI boards to work in a CompactPCI® system is both a reliable technical solution, and a smart economical decision. The PCI-Adapter frees the system integrator from the need of a redesign of PCI cards already available to the CompactPCI® standard. This is a great advantage, especially when time to market is critical, or the number of systems to be built is limited, or the function to be implemented has fast innovation cycles.

  • TySOM Embedded Prototyping Boards

    Aldec, Inc.

    TySOM™ is a family of embedded system prototyping boards. Depending on the board, one of three FPGAs will be at its heart: a Xilinx Zynq® UltraScale+™, a Xilinx Xilinx Zynq-7000 or a Microchip PolarFire SoC. The boards are compatible, through industry standard interfaces (FMC or BPX), with Aldec’s wide range daughter cards, making Aldec’s TySOM embedded prototyping boards ideal for the rapid development of applications that include automotive (and ADAS, in particular), artificial intelligence (AI), machine learning (ML), embedded vision, embedded-HPC (including edge-processing), IoT, IIoT and industrial automation.

  • Hipot Wire Harness Testers

    NX Hipot - Dynalab Test Systems, Inc.

    * 50 to 1500VDC Hipot Testing* 50 to 1000VAC (optional) * 5Mohm to 1Gohm Insulation Resistance * Simple 4-button user interface * Tests for continuity and shorts * Tests a variety of components * Precision resistance measurements * Continuous high speed scanning for real time complete status information of harness assembly progress * Keyed security access and control * Built for rough industrial environments * 2 serial ports for connection to printers and scanners * Standalone operation * Uses a high capacity memory card * Available from 64 to 1024 test points * Networkable

  • cPCI / PXI / PXIe Crates

    W-IE-NE-R, Plein & Baus GmbH

    CompactPCI ratified as PICMG 2.0 in late 1995 is an interconnect bus standard for industrial computers, combining a 3U or 6U Eurocard-type card and PCI signaling / protocols via a passive backplane with metric connectors. PXI (PCI eXtensions for Instrumentation) is the application of CompactPCI for measurement and automation systems. PXI uses commercial PC-based PCI bus technology while combining rugged CompactPCI modular packaging with timing and synchronization features in order to provide an optimized basis for complex, rugged, modular instrumentation systems. The PXI standard is governed by the PXI systems Alliance (PXISA)

  • PXI Simulation Modules For Sensor Simulation

    Pickering Interfaces Ltd.

    PXI simulation solutions for sensor simulation, including PXI Programmable Resistors—ideal for the simulation of resistive sensors and PXI Thermocouple Simulators—these provide multiple low-voltage sources ideal for simulating the operation of a thermocouple. Take a look below for all of our PXI Simulation Solutions, we also offer some of these in PCI format as well . All of our PXI simulation cards are supplied with comprehensive software drivers for Windows® XP/Vista/7/8, Lab Windows / CVI and LabView. The Pickering IVI drivers also fully support National Instruments' Switch Executive.

  • ISA Bus Dual Redundant MIL-STD-1553 A/B Simulator / Analyzer / Tester

    CIC101-4 - Andor Design Corp.

    Price: Request QuoteMIL-STD-1553 A, B Simulator/Analyzer/Tester ISA BUS Interface Card. The CIC101 can be used for Validation Testing,Production Testing, full bus simulation and monitoring, as ageneral purpose 1553 interface or a stand alone bus Analyzer. It provides precise message scheduling andmeasurements. Major and minor frame times areindependent of message sequences or retransmissions onerrors. The start of all command messages may be set to beindependent of message length, response time or length ofresponse. The CIC101 features a calibrated Message timingand low jitter RT responses.

  • AC Coupled, 14-Bit Digitizer For ExpressCard 54, 2 Channels 150 MS/s

    EC14150A - Wuntronic GmbH

    The EC14150A (EC) is an AC-coupled dual channel waveform capture board that provides a remarkable combination of high speed and high resolution sampling along with a very large memory capacity all in a very compact and low power consuming ExpressCard form factor. At 4.5 W, the EC represents one of the lowest power consuming digitizer cards ever created for its class. Signal frequencies up to 200 MHz can be accurately captured either in baseband or in higher order Nyquist zones using under-sampling techniques. Where DC-coupling is required, the EC14150D should be considered.

  • DC Coupled, 14-Bit Digitizer For ExpressCard 54, 2 Channels 150 MS/s

    EC14150D - Wuntronic GmbH

    The EC14150D (EC) is an DC-coupled dual channel waveform capture board that provides a remarkable combination of high speed and high resolution sampling along with a very large memory capacity all in a very compact and low power consuming ExpressCard form factor. At 4.5 W, the EC represents one of the lowest power consuming digitizer cards ever created for its class. Signal frequencies up to 200 MHz can be accurately captured either in baseband or in higher order Nyquist zones using under-sampling techniques. Where DC-coupling is required, the EC14150D should be considered.

  • Wafer Probe Loadboards/PIB

    Dynamic Test Solutions

    DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.

  • MEMS Device-Oriented Testers

    SPEA S.p.A.

    Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.

  • Memory Burn-In Test

    NEOSEM TECHNOLOGY INC

    The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.

  • Test And Repair

    Innovasys Pty Ltd

    If you are responsible for maintaining a system where faulty electronic modules are not readily replaceable. Innovasys can assist by providing cost effective repair services or by developing support tools to allow in-house repair.Our IPC J-STD-001 certified technicians provide test and repair of electronic modules and are backed by a team of electronics engineers. This gives us the capability to diagnose and repair complex circuitry.Innovasys provides test and repair services to the Defence Materiel Organisation. Our technicians are experienced in effecting repairs to meet strict quality requirements on complex multi-layered circuit card assemblies.

  • High Speed Data Logger

    9330 - Interface Inc.

    The Model 9330 displays 24-bit resolution and has an impressive 3750Hz update rate. Incorporating peak and valley capture, it can store up to 6 sensor calibrations and measurements from load cells or torque transducers can be logged at 1000Hz to a standard SD card. This data can then be downloaded to a PC via the built-in USB port and Windows compatible software for off-site analysis. Adding further versatility, the rechargeable battery can power up to 4 x 350 ohm sensors, but also offers up to 300 hours stand by time and up to 20 hours continue use.

  • Multi Protocol Boards

    Excalibur Systems, Inc.

    The EXC-4000 carrier board series was developed to meet the needs of avionic testers for multi-protocol integrated, digital bus testing. Modules may be selected out of a growing list which currently includes MIL-STD-1553/1760, MMSI, H009, ARINC-429, ARINC-708/453, Serial (232/422/485), Discrete and CAN bus. Additionally, an IRIG B decoder implements a global time stamp relative to the IRIG B pulses. The need for higher density, different protocols, and multi-channel on one integrated test card has made the EXC-4000 series very successful.

  • SoC Test System

    V93000 SoC / Smart Scale - Advantest Corp.

    Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.

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