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Showing recent results 1 - 7 of 7 products found.

  • Automated X-ray Inspection (AXI)

    TR7600X SII - Test Research, Inc.

    Built for maximum inspection performance, TR7600X SII series offers ultimate performance 3D X-ray inspection for the largest server, networking and power PCBs. With advanced ultra-high-speed cameras, the TR7600X SII series combines TRI’s unique shadow-free 3D inspection of multi-layer boards with 2/3-layer PoPs, µBGAs, QFNs, Press-fit connectors with fully automated programming and multi-resolution programs help maximize production yields on any production line. - See more at: http://www.tri.com.tw/en/product/product_detail-12-2-23-1.html#sthash.sVL14SCV.dpuf

  • Automated X-ray Inspection (AXI)

    TR7600 SII - Test Research, Inc.

    Featuring advanced automated 3D X-ray inspection of PCBAs, the TR7600 SII high speed scanning with multiple resolutions in a single program. Automatic Pass/Fail determination uses 2D + 3D images provided using 6-axis control and ultra-high-speed multiple angle cameras with automatic board warp compensation. TR7600 SII is ideal for inspection of fine pitch 01005 components, BGAs, PoPs, LGAs and other bottom termination components on both sides of the PCBA, including complex Pressfit connectors.

  • Automated 2D & 3D X-ray Inspection Systems

    X Line - GOEPEL electronic GmbH

    Inspect SMD/THT Assemblies Inline or stand-alone. The X Line 3D is an inline AXI system for high-end inspection in mass production. It is used for quality assurance in complex and high-quality. The X Line 2D allows high-speed inspection of assemblies populated on one side. The intelligent 2D technology is completely free from typical.

  • Compact and Low-Weight X-ray System

    XT V 130 - Nikon Metrology, Inc.

    Compact XT V 130 QA-system for affordable X-ray visualization and automated inspection

  • X-Ray Inspection Systems

    Scienscope

    Scienscope’s X-Ray inspection systems division offers state of the art X-ray cabinet systems with the highest performance to price ratio in the industry today. Scienscope has over 16 years of experience selling solutions as a leading NDT (non-destructive test) supplier of x-ray inspection equipment into the electronic, medical device, materials, and biological markets. Our advanced x-ray systems feature high power micro-focus x-ray sources up to 130kV, high resolution digital detectors, large inspection stages with 350° degrees rotation, oblique angle inspection, and all of the manual and automated s/w tools you expect in an advanced system are included.

  • X-Ray Inspection Systems

    Sciencescope International

    Scienscope’s X-Ray inspection systems division offers state of the art X-ray cabinet systems with the highest performance to price ratio in the industry today. Scienscope has over 16 years of experience selling solutions as a leading NDT (non-destructive test) supplier of x-ray inspection equipment into the electronic, medical device, materials, and biological markets. Our advanced x-ray systems feature high power micro-focus x-ray sources up to 130kV, high resolution digital detectors, large inspection stages with 350° degrees rotation, oblique angle inspection, and all of the manual and automated s/w tools you expect in an advanced system are included.

  • AXI Platform Offline / Inline

    XT-Series - Matrix-FocalSpot, Inc.

    High-resolution manual x-ray inspection system designed to address fast intuitive operation, low volume production capacity, and advanced failure analysis for SMT production inspection and quality control protocols. This system addresses more complex SMT solder-joint and semiconductor inspection and analysis. It is easy to learn and easy to use by all production floor operators, technicians, and engineers. The small footprint allows passage through a standard door width. This system offers exceptional image quality and together with the MatriX Image Processing Software (MIPS) provides industry leading analyzing and automated inspection for BGA, QFN, and Pin-in-Paste or Through-Hole Barrel Fill detection.