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Laser Head
5517C
The Keysight 5517C is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Option 009 allows a larger angular range of measurement by providing a 9 mm beam diameter for use with three-axis interferometers. Please contact Keysight for custom requirements.
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Laser Head
5517B
The Keysight 5517B is used primarily in VME and PC based laser interferometer systems where the velocity of motion is slower, such as machine tool applications. Please contact Keysight for custom requirements.
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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Laser Heads
The laser head is the source of the laser beam used in all laser motion and position measurement systems. The primary difference between laser heads is in the velocity, reference frequency and optical output power. Other considerations are size, heat dissipation, and input power requirements. Which laser you choose depends primarily on the application in which it will be used. For example, semiconductor lithography systems typically have faster moving parts (stages), and therefore need higher velocities than machine tool applications.
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Wrench Heads
Mountz offers a range of imperial and metric wrench end fittings for various the Mountz wrench handles. Open ends, box head ends, flare ends, ratchets and blank ends can be supplied in metric or imperial to suit almost every application. Other sizes may be available. For sizes not displayed please contact Mountz Inc.
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WLCSP Probe Heads
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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Attitude Heading Reference System
(AHRS) TRAX2
Using its unrivaled magnetic sensor expertise , PNI fuses its proprietary magnetic sensors and sensor fusion algorithms, delivering accurate AHRS heading without the need for GPS.
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Silicon Optical Power Head
81620C
The new 81620C optical power head provides a 5 mm detector area and allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The 81620C accepts parallel beams with up to 4 mm diameter, standard SM fiber and MM fiber with max. 100 μm core diameter, NA ≤ 0.3. A wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
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Doppler Sensor Heads
Designed for long range motion/speed/directional detection where the sensitivity is essential.
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Laser Head Cable, 20 m
10882C
The 10882C 20-meter Laser Head Cable is used to connect the 5519A/B Laser Head to the E1735A USB Axis Module for the 5530 Laser Calibration System.
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7-Meter Laser Head Cable
10882B
The 10882B 7-meter Laser Head Cable is used to connect the 5519A/B Laser Head to the E1735A USB Axis Module for the 5530 Laser Calibration System.
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IQ4 Rectangular Search Head
The IQ4 Rectangular Search Head Metal Detector is designed to be integrated within production lines or conveyor systems.
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Hydrostatic Head Tester
TF163
TESTEX Testing Equipment Systems Ltd.
Hydrostatic Head Tester, used for determining the resistance of fabrics (canvas, coated fabrics, cover cloth, rainproof clothing fabrics, and geotextile materials) and films to water penetration under pressure while firmly clamped in the test rig of standard area.
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Heading Reference Directional Gyroscopes
4000HR-series
The 4000HR air-driven directional gyro offers some of the best features of our other popular models. It inherited all of the functionality and reliability of the industry standard 4000B upon which it’s based, and it picked up a heading reference bug from the 4000C autopilot model.
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Laser Head
5517FL
The Keysight 5517FL is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Please contact Keysight for custom requirements.
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Wafer Probe Heads
WLCSP test is the applying final test conditions at Wafer Level. WLCSP testing is driven in lowering the cost of test of devices through economical methods of manufacturing and testing.
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Test Contactor/Probe Head
cBoa
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Constant Pressure Dual Head Pump
ReaXus HF Series
The HF Series pumps are specifically designed to meet the requirements of Preparative Liquid Chromatography (HPLC) and high pressure Process/Metering applications. The Stainless Steel fluid path will withstand the toughest applications.
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Air-Cooled Nanosecond DPSS Laser Head
BH9206-80
The BH9206‐80 laser series is a compact, air‐cooled nanosecond DPSS laser designed for industrial, scientific and military applications. Utilizing diode pumped, air‐cooled technologies, the BH9206‐80 is capable of producing 80mJ at 1064nm with repetitions rates up to 30Hz with a 6ns pulse width.
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Test Head Manipulators
Cobal 250
The Cobal 250 offers the best-in-class range of motion for universal manipulators with seven degrees of motion. Separate linear movements make it easier for the operator to dock, undock, and redock the test head in seconds. In combination with inTEST EMS docking, the Cobal 250 is compatible with testers for both Wafer Sort and Final Test, minimizing the time and cost when moving a tester between Sort and Final Test.
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3-meter Laser Head Cable
10882A
The 10882A 3-meter Laser Head Cable is used to connect the 5519A/B Laser Head to the E1735A USB Axis Module for the 5530Laser CalibrationSystem.
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Scanning Head For Energy Meter Test
PACB108
PACB08 is the accessory device to perform the energy meter test, which can work together with PONOVO’s relay test sets to test energy meter by using Energy Meter Module in Powertest software.
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Process Industry Head Thermometers
Rough environmental conditions, hazardous areas, space-saving installation and flexible assembly are only some examples of the skills of our daily proven and reliable temperature sensors. With direct sensor output or 4 to 20 mA HART, PROFIBUS, FOUNDATION Fieldbus or WirelessHART communication, including device configuration with LCD display. Available without thermowell or with welded or drilled thermowell for sensor protection. Available also for non-invasive temperature measurements with high precision.
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Probes With Industrial Heads
Used in industrial applications for process temperature measurement, these probes come in a variety of protection head styles for easy connection wiring to your extension cable
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Test Contactor/WLCSP Probe Head
ACE
ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have the electrical properties of BeCu with the non-oxidizing properties of a precious metal. The short signal path, sharp tips, and large contact area between plungers provide high current conductance and reliable contact with less force.
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Channeling Decoder, Nav/Comm/Control Head
RCD200
Designed to provide the Avionics shop a simple and expeditious method for testing general aviation radio tuning. Provided are front panel mounted LED's as well as a digital display to provide the quickest code recognition while testing. With this simple method of testing you will soon find yourself testing all your radios and finding those troublesome intermittents. This unit also decodes altitude and ARC 1000 serial data. Click on picture for larger view.
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Attitude And Heading Reference Systems
AHRS
Beginning in 2001, Inertial Labs began manufacturing its MEMS-based, IP-67 sealed, MIL-STD-810G qualified, multiple interfaces and COM ports Attitude and Heading Reference System in response to the need for an inclusive and price competitive Antenna Pointing, Aiming, and Stabilizing applications. Each INS contains an Inertial Labs-developed tactical or industrial-grade inertial measurement unit (IMU) and an Inertial Labs-manufactured high-precision Fluxgate magnetometer.
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Kelvin Test Contactor/Probe Head
Gemini
At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
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chromatic Confocal Sensor Heads
ENDO
Sciences et Techniques Industrielles de la Lumière
STIL introduces ENDO series, a new range of chromatic confocal sensor heads with an exceptionally small size.With a mechanical diameter from 4 to 8 millimeters and a straight or radial beam of 90°, ENDO series is ideal for non-contact measurement applications in reduced space environments.
