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Beam Profiler
BladeCam Series
0.65" Thin! Portable, Port-Powered, USB 2.0, Beam Profiling for Windows XP & Vista, Intel-Mac.
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Beam Profiler
WinCamD series
CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Scanning Slit Beam Profilers
DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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UV-NIR Beam Profiler
CinCam
CINOGY Technologies CinCam is optimized to provide excellent sensitivity from the UV to NIR spectral range involving CCD/CMOS/InGaAs technologies. Thanks to its high resolution and its small pixel size, the CinCam ensures the highest accuracy in laser beam analysis of cw and pulsed laser systems. The plug and play design facilitates easy and flexible adaption to standard optical components.
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Large Aperture Beam Profilers
Modern laser applications seldom require large beam profiling, combined with high resolution. The BeamOn HR 1" is the perfect solution enabling both relatively large beam characterization, with a high resolution detector of 20 MP. By implementing a diffuser to present the beam to a smaller detector via dedicated optics, one of the largest beam profilers of 60 mm is offered, i.e BeamOn LA U3. Even further than that, for collimated beams the Laser Analyzing Telescope offers an input aperture of 100 mm combined with high resolution, attitude and divergence measurement of the laser beam.
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Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Profile Projector
Baty SM300
300mm screen vertical light path projector with multi-function readout unit and printer. Robust design with full geometric measuring functionality ideal for the shop floor. Features • Top quality profile projector highly versatile and easy to operate • Large travel range 150mm x 50mm (6”x 2”) as standard • Linear scale stage with 0.001mm resolution.
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Beam Bender
10726A
The Keysight 10726A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This bare optic requires a user-supplied mount.
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Ice Profiler
Estimate ice forces for design of offshore platforms and operational planningDetermine the extreme thickness of ice for pipeline installationsExamine in detail the underside of sea-iceUnderstand the dynamics and thermodynamics of the sea ice regime for scientific research.Climate change studies
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Profiling Systems
ICK profiling systems measure, detect, classify, count, and check vehicles in 3D. They determine the number of axles on heavy goods trucks for vehicle classification and measure vehicle dimensions to rectify loading errors. The systems recognize overheated vehicles approaching tunnels and other entrances and activate diversions. They also monitor external train contours. If a limit value is exceeded, the system triggers an alarm. All this contributes to safety on roads and railroads.
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Laser Beam Alignment
The alignment product line provides full solutions for applications such as: alignment of laser cavities, straightness measurement, machine alignment, wide-bed printers alignment and others. The AlignMeter system simultaneously measures incoming laser beam position (in µm) and angle (in µRad).It is a powerful compact device perfect for alignment monitoring, for testing the drift, centration and beam alignment relative to the outer housing or tube.
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Rapid Profiling
MIDAS SVP
Suitable for rapid profiling down to 6000m depth, the MIDAS SVP gives the most accurate Sound Velocity Profiles currently possible.
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Sub-bottom Profiling
The EdgeTech Sub-bottom Profiling System is a wideband Frequency Modulated (FM) sub-bottom profiler utilizing EdgeTech’s proprietary Full Spectrum CHIRP technology. The systems generate high-resolution images of the sub-bottom stratigraphy in oceans, lakes, and rivers.
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Soluble Salt Profiler
130 SSP
The Elcometer 130 Soluble Salt Profiler provides fast and accurate measurement of the level and density of soluble salts - over 4 times faster than other Bresle equivalent methods. The new Elcometer 130 Soluble Salt Profiler allows you to complete a Bresle equivalent test in just over two minutes. The multi-point conductivity sensors enable the Elcometer 130 SSP to accurately display salt concentration, showing exactly where the contamination lies and generating full colour salt density maps in 2D or 3D.
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Surface Profile Gauge
SRT-6223
Specially used to take accurate measurement of the peak to valley height of the surface profile of the surface profile of blast cleaned surfaces.specifications:display: 4 digits. LCDRange: 0um to 800um (0mils to 30mils)Accuracy: +5% or +5( whichever is the greater)resolution: 1um (0.1mils)Metric and Imperial switchablePC interface: RS232CMeasurement speed: >30readings per minuteweight: 280gdimensions: 162x65x28mm(6.4x2.6x1.1 inch)operating temperature: 0-50℃ , 80% RHCase: high impact ABSBatteries: 4x1.5v (AAA) Batterystandard accessories included:carrying case: 1 pcoperation manual 1 pcoptional accessory:cable and software for RS232C
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Beam Lead Capacitors
Beam lead capacitors have high insulation resistance, low dissipation factor, and low temperature coefficient, which allow for use in military and aerospace designs. Their robust performance and small form factor provide repeatable performance.
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Premier CTD Profiler
MIDAS CTD
The MIDAS CTD is Valeport's premier CTD Profiler. High accuracy sensors (including ±0.01% pressure) and robust titanium design allow reliable operation to 6000m depth, under the harshest conditions.
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Ion Beam Milling Systems
When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
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Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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Profiler
fastCTD Profiler
An evolution of the miniCTD, it has a conductivity cell designed for optimum flow-through, a fast response thermistor temperature sensor and a 0.01% pressure sensor synchronously sampling at 32Hz deliver the highest quality profiles in a lightweight and robust package. The package is completed with an integral fluorometer based on Valeport’s new Hyperion range and optional Bluetooth communications module.
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Digital Surface Profile Gauge
224
Measurement capability to ±5%Can be used in accordance with National and International StandardsTemperature stable measurementsStatistics are calculated and displayed in real timeLive and batch readings graph format for instant analysis
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3D Optical Profiler
Nexview™ NX2
Designed for the most demanding applications, the Nexview™ NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO's most advanced Coherence Scanning Interferometric (CSI) profiler.
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Narrow Profile Power Supplies
AC-DC Wide Adjust Output
Power supplies with the broad adjustment capability required for analog instrumentation and circuitry, electronic system development, basic research, and similar applications.
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Thermal Profiler
V-M.O.L.E.®
The V-M.O.L.E. is a full-featured compact thermal profiler that belies its sophistication in an easy-to-use 3-channel Mini-thermocouple configuration. Ideal for VERIFICATION of PCB profile performance, 3 channels give you Hot, Cold and Sensitive component data for verifying the correct oven settings.
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Profile Measurement System
GapGun
Third Dimension Software Limited
The GapGun is a laser gauge, profile measurement system that quickly and accurately quantifies local features such as gap and flush, step, weld and mismatch, radii, scratches, seals, dents, rivets and fasteners. It is a proven technology, used worldwide by most major automotive and aerospace OEMs, with over 1,000 units sold.
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35b profile VDSL2 Tester
TM600P
*TM-600 VDSL tester specially designed for xDSL line test (xDSL include: ADSL, ADSL2, ADSL2+, READSL, VDSL2 etc) and maintenance It provides xDSL test, PPPoE dial test, DMM test, Modem emulation, line voltage indication and so on.
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33% Beam Splitter
10700A
The Keysight 10700A beam splitter is designed for beam diameters of 6 mm or less. It reflects one third of the total incoming laser beam, and transmits two thirds. It includes a housing for standard mounting.
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Humidity And Temperature PROfilers
RPG's profiling radiometers are mainly used to derive vertical profiles of atmospheric temperature and humidity (RPG-HATPRO). The infrared radiometer extension allows to cloud base height and ice cloud detection.The radiometer series covers high-resolution temperature profiling of the boundary layer and low-humidity applications. All models of the series provide accurate total amounts of atmospheric water vapor and cloud liquid cloud. RPG radiometers are stand-alone systems for automated weather-station use under nearly all environmental conditions. A variety of retrieval algorithms (custom designed and global standard algorithms) can be selected.
