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Product
Semiconductors
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Meets SDIO card v2.0 specificationSupports SDIO SPI, 1-bit, and 4-bit SD modesHost clock rate from 0-50 MHzSingle SDIO function interfaceSD commands processed in hardwareReset output on completion of initializationIndication of high speed and high power enabling to application logicMaximum block size supported is 1024 bytesThree I/O mode selection pinsCRC7 and CRC16 modulesSupports direct R/W (IO52) and extended R/W (IO53) commandsAPB bus interfaceParallel bus interfaceStandard 8051 split bus interfaceGeneric 8051 bus interfaceUART interface
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Product
High Performance Bench Meter for Universal pH Applications
Starter 5000
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Backed by OHAUS' century-old commitment to providing precise measurement, Starter 5000 provides accurate pH and ORP measurement for high-level experiments and research. Enhanced features, advanced technology, and high performance have been combined to support complex laboratory tasks requiring pH measurement. Starter 5000's performance is propelled by a 1000 item library, 10 sensors for calibration storage, 8 predefined and 1 self-defined buffer groups, 3 endpoint modes and GLP mode.
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Product
Web Application Firewall
WAF
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Your website security solution needs to keep up with the changing cyber threat. Protect your website with Cloudbric’s cloud WAF to block unknown and modified attacks.
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Product
Semiconductor Electrical Test
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We conduct electric property test (final test) of the completed (packaged) LSI products. We will support testing of analog devices, logic devices, other electronic parts, modules, application products and so on. We will test according to customer's specification regardless of evaluation, trial production, mass production, by know-how cultivated with long-time mass production results. Test initial examination ~ From consistent correspondence up to selection and evaluation, individual correspondence such as design only is accepted.
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Product
Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
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Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Product
Radar Distance Sensors: Applications & Products
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Powerful radar distance sensors are needed to measure accurately and reliably even in complex industrial environments. With its unique measurement precision and real-time measurement rate, OndoSense distance radar sensors are ideal for automation in industrial applications with harsh conditions.
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Product
Application Specific LC System
Reducing Sugar Analysis System
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The Nexera reducing sugar analysis system uses Shimadzu’s unique post-column boric acid-arginine fluorescence derivatization method. Unlike the refractive index detectors and evaporative light scattering detectors (ELSD) commonly used for sugar analysis, this system reduces the effects of impurities and offers both high sensitivity and a wide dynamic range. As a result, sugars contained in samples can be analyzed simultaneously, without dilution even when there are significant concentration differences.
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Product
Semiconductor Technology, Micro Scriber + Flatness, Bow, Warp, Curvature, Glass Thickness
FLATSCAN
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Optik Elektronik Gerätetechnik GmbH
Non contact automated 2D- or 3D measurement of warp, bow, slope and surface curvature with software module for calculation of thin film stress (wafer stress) of wafers and glass substrates.
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Product
EMI Measurement Application
Fsx-k54
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The EMI precompliance application (K54 option) for Rohde & Schwarz signal and spectrum analyzers is the ideal extension for EMI analysis during product development and to prepare for a smooth product certification process. Typical fields of application include commercial, automotive, avionic and military product developments (CISPR, EN, FCC, DO-160 and MIL-STD-461 standards).
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Product
10G Ethernet/IP Network Infrastructure Testing Application
GENEM-X
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GENEM-X is a high-capacity network infrastructure testing software application for network equipment manufacturers, data centers, service provider telco cloud and 5G backhaul. It runs on Siama’s carrier-class PROVA-X hardware appliance. GENEM-X allows you to verify, monitor and troubleshoot Ethernet/IP network equipment and data center applications to ensure network services can accommodate the demands of your customers. Ideal for QA test, Service Providers migrating to a DevOps model can use GENEM to validate service turn-up and modifications in the production network. GENEM is equally at home in a lab environment. It bundles wire-rate traffic generation and analysis capabilities with a network emulator and packet capture/replay function in a single software license.
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Product
Automated Discrete Semiconductor Tester (ATE)
5000E
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Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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Product
Mobile Application Testing
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UpDoer Technology has the most innovative test automation tools and skilled experts to ensure your application is ideally tested as a certified mobile app testing organization. We are one of India's best Mobile app Testing companies that offer full-cycle testing from the planning to the post-launch phase.
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Product
Laser Applications
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Quantum Composers offers a diverse family of lasers, laser systems, and modules, including DPSS, Nd: YAG, and pulsed lasers. Our MiniJewel and MicroJewel lasers are now available in 2 different energy options to allow customers to tailor the laser to their specific applications.
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Product
Custom IoT Application Development Services
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Our innovative approach has been successfully delivered top-quality enrich IoT solutions for connected devices to our clients. Our expertise IoT team always follows best practices of the IoT ecosystem for delivering high-speed IoT applications with seamless connectivity with multiple 3rd party systems.#text-1076059564 { font-size: 1.35rem; text-align: left;}
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Product
Phase Noise Measurement Application
N9068A
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One-button measurements for analyzing phase noise in frequency domain (log plot) and time domain (spot frequency)Compatible with phase noise measurement personality in Keysight PSA and ESA spectrum analyzers Runs inside the PXA, MXA, EXA signal analyzers and MXE EMI receiver
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Product
Industrial CANopen And CANopen FD Module For Digital I/O Applications
PCAN-MicroMod FD DR CANopen Digital 1
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The PCAN-MicroMod FD DR CANopen Digital 1 is an I/O module for use in CANopen and CANopen FD networks. The modern CANopen FD® standard makes it possible to cope with the constantly increasing need for data transmission from sensors, machines and complex production systems. The module has a CAN FD interface as well as 8 digital inputs and 8 digital outputs. With the DIN rail housing and the support of the extended temperature range, the module is suitable for use in an industrial environment.
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Product
Semiconductor Testing Equipment
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We provide you with various inspection equipment mainly for the semiconductor post-production process. Also, "inspection boards", "measurement control" and "test applications" are available for you to meet your various needs.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Equipment & Vision Systems for Surveillance & Defense Applications
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Photonis equipment systems are designed with Photonis sensors and cameras, while providing ease-of-use for in-depth image capture and analysis. These low light imaging systems are specifically developed with Night Vision, Observation & surveillance, Situation Awareness in mind.Two main equipments are proposed: the TacFusion is a handheld binocular combining low light camera core and thermal imaging sensor and the SR750 is a long range surveillance camera with powerful zoom and adapted ergonomics for rapid deployment. Both devices can be used for surveillance applications (police law-enforcement, borders and infrastructure surveillance) as well as SAR operations.
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Product
Semiconductor Test
Ismeca NY20
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20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as Intelligent Features that enable extended autonomous operation and productivity.
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Product
X-Series Measurement Applications for Signal/Spectrum Analyzers
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The X-Series applications are proven, ready-to-use measurements for signal analysis. Simplifying complex tasks and delivering repeatable results, the applications let you see and understand the performance of your cellular, wireless and aerospace/defense devices and designs.
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Product
Spread Resistance For Slanting Polished Sample Of Semiconductor By Tow Kinematically-mounted Probe Contacting .
SRS-2010
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*Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles
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Product
Solution for High Density I/O Applications
BitBox
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The BitBox is BitFlow''s new solution for high density I/O applications. Many machine makers require a large number of computer managed I/O signals for continuous control of the system state. This means controlling devices such strobes, solenoids, actuators, indicators etc. as well as gathering inputs from photo-detectors, switches, encoders and triggers. In general, BitFlow frame grabbers come with a fairly large number of inputs and outputs, but for some system this is simply not enough. Most customers end up purchasing another device to manage the I/O, which adds expense, requires another slot, another driver and SDK, another manual, etc. The BitBox has been designed for just this situation. It is controlled completely from the frame grabber, uses the same API, driver and manuals as the frame grabber. This saves time, money, space, and learning curve.
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Product
Semiconductor Test
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Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
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Product
Custom, 9-Slot, Front to Rear Cooling, AC Supercomputer Application
Barracuda 324 CS7510
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Supercomputer application.
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Product
Semiconductor
DieMark
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DieMark Inking Systems are available in Electric and Pneumatic models and utilize convenient, disposable DieMark Ink Cartridges to streamline and optimize the process of marking defective die. With models available for nearly every test platform and configuration, Xandex inking systems are in operation daily in every corner of the world where wafer sort is performed.
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Product
Analog And Digital Sensor Measurement Data For CAN Applications.
K- AN8 KIT
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This K-AN8 (8 analog + 4 digital input) kit contains everything needed to get the K-AN8 set up and tested on a work bench.To help with connecting sensors to the analog and digital ports the K-BoB enables easy connection with BNC connectors.Influx K-Cal is easily connected via the Kvaser LeafLight interface and Kvaser T-CANnector. (Using the Kvaser T-CANnector to power up the K-AN8 (at the desk) and terminate the CAN bus).
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Product
Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
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The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
