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HDMI Assembled Test Connector
HDMI Testplug with plug (1000 mm cable), HDMI Testplug with female socket (1000 mm cable), HDMI Testplug with 19-pin connection board. Applications in video and audio systems.
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Explosion Resistant Oven
All standard Gruenberg Ovens can be modified to be explosion-resistant. Explosion-resistant ovens incorporate design features that allow the oven to be operated within a volatile atmosphere defined as Class I, Group D, or Class II, Group E, F or G. Ideal for heating and drying processes.
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Power Performance Test
The performance index of power product is decide the product quality, so it is very important to accurately test performance index in every stage to make sure that the product performance is conform to design index. Energy efficiency index includes power factor, input power, input voltage and etc.
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CREST Penetration Testing
CREST is a not for profit organization that serves the needs of a technical information security marketplace that requires the services of a regulated professional services industry.
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Winding Resistance Tester with Demagnetisation Circuit
WRT-10D
The WRT-10D is a high performance winding resistance tester designed for power transformer and large motor applications. It is equipped with a bright LCD display, a rugged high quality cable set, a built-in printer, a full QWERTY keypad and a demagnetisation circuit.
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Test Gauges
The Ashcroft 1082 test gauge is a precise instrument acclaimed for dependability, safety and performance. Used for test and validation, its manufacture is continuously monitored to assure uncompromising standards and material integrity. An ideal choice for satisfying most applications and installation requirements needing highly-reliable precision instruments.
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Probes & Test Leads
The Di-LOG range to test leads are designed and manufactured to the highest quality and meet all safety standard as stipulated in BS EN 61010
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Rain Test Chambers
Shanghai Morningtest Environmental Chambers Co.,Ltd.
Rain test chambers for ingress protection testing simulates rain/water test as per IEC 60529 and DIN 40050-9((IP Code standard)) test standard. • IPX1 Protection against vertically dripping water• IPX2 Dripping water ± 15° from vertical• IPX3 Protection against spraying water• IPX4 Protection against splashing water• IPX5 Protection against low pressure jetting water• IPX6 Protection against high pressure jetting water• IPX7 Protection against temporary immersion• IPX8 Protection against continuous immersion• IPX9K Extremely high pressure jetting water
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Insulation Testers
AD-902
The instrument is designed for the direct measurement of insulation resistance of cables and electrical equipment especially in the telecommunications and communications. It can also serve as a tester for example go. Circuits or connectors.
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Rapid Antenna Testing Services
At JEM we understand the challenges facing antenna, microwave and communication system engineers, and we realize that accurate measurement of antenna electrical performance is critical. That’s why we offer a range of rapid antenna testing services from 50 MHz to 40 GHz.
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Wire Damage Test Device For Pull Testing
IEC60884 FIG11
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 FIG11 Wire damage test device for pull testingThe wire damage test device is a special test instrument designed and manufactured according to the requirements of IEC884 Figure 11, , etc. It is mainly used to judge whether the screw-clamp type terminal is in design and structure.
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C++ Test Framwork
Google Test
a unit testing library for the C++ programming language, based on the xUnit architecture. It can be compiled for a variety of POSIX and Windows platforms, allowing unit-testing of C sources as well as C++ with minimal source modification.
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Aviation Engine Test Cells
1.Design, manufacture and installation: ● Thrust stand components: thrust measurement system, adapter, superstructure etc. ● Facility subsystems: DAQ, supply systems (fuel, oil) etc.2.Civil construction works: site survey, building works etc.3.Contracting: ● Turn-key – MERA is able to supply a “turn-key” test cell including civil works, thrust stand, DAQ, all necessary facility subsystems, specialized software, throttle control level and etc. ● Joint – MERA is capable to supply specified items such as thrust stand with DAQ and software. The Customer is able to procure necessary items such as test nacelle directly from OEM. 4.Project management in accordance to EPC (Engineering, Procurement, Construction, FIDIC) 5.Certification in accordance to international and local standards and rules (SAE 5305) Engine types: PD-14, PS-90, RD-93, RD-33MK, AL-31FN
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PPE High-Voltage Testing
TMD is a founding member of the North American Independent Laboratories (NAIL), the only high-voltage testing accreditation and procedure-certification organization in the United States. With its test lab located at its headquarters in Waco, Texas, TMD has been employing the highest standards of quality and safety testing since 1973 and has served some of the largest utilities and Fortune 500 companies in the nation
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Mobile Test Systems
The systems include A+A+A+ LED solar simulators, high-resolution electroluminescence testers and various other tests that you can easily integrate into your transport of choice or directly into a container on site.
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Non-Destructive Testing
Piezoelectric ceramic materials are the active component in nondestructive testing transducers. The material is driven with an ac signal to generate an ultrasonic sound wave that is coupled into an object. The ultrasonic wave is reflected back to the transducer when it encounters a change in density in the material caused by a crack, porosity, or other object with a different density.
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Continuous Testing Platform
TOSCA
Tricentis Tosca is a Continuous Testing platform that accelerates testing to keep pace with Agile and DevOps. With the industry’s most innovative functional testing technologies, Tricentis Tosca breaks through the barriers experienced with conventional testing tools. Using Tricentis Tosca, enterprise teams achieve unprecedented 90%+ test automation rates—enabling them to deliver the fast and continuous feedback required for Agile and DevOps.
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Cable Test Van
The desire for faster and more efficient cable fault location as well as cable testing and diagnostics demands the ergonomic installation of equipment into vehicles. To be able to satisfy the customer's particular requirements, each system is factory-fitted into a vehicle of their choice. The size of vehicle will dictate the equipment at the planning stage. Ergonomics, taking into account the customer's needs, is paramount.
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Optics Test Systems
F Number Meter
Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
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Complete Testing Solutions
System includes a lamp and monochromator for a tunable light source, which is coupled to a high sensitivity source meter with measurement software. This user-friendly system is the most powerful Spectral Response system currently on the market, but its true power is the ease of upgrading from the base PTS-1 to the more powerful PTS-2-QE (Quantum Efficiency) or PTS-3-CPM (Constant Photocurrent Method). Designed for researchers who have limited budgets but want to start work immediately, this allows the ability to do baseline studies until additional funding for the full QE or CPM system becomes available.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Hign Speed Bare Board Test System By Non-Contact Test Technologies
SX-750SUPERⅣ
Suitable for a wide range of applications. Can be connected to a wide range of machines: from hand press to reel mechanism and in-line mechanism. We offer docking with our customers own machines. Compact main tester simplifies integration via installation inside a mechanism. If requested, we will perform a study to decide which functions should be added.
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Insulation Tester
Cambridge Instruments & Engineering Co.
'CIE' Insulation Tester is a compact portable unit incorporating most modern features used for direct reading of electrical operating machines, Rotating Plant equipment, Stationary apparatus, Insulation Control switching equipment, Distribution networks, Communication cables, Insulators, Transformers, Industrial Installations, Cable, electrical components, wiring and other devices capable of carrying the rated voltages.
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Virtual Test Methodology
TVT
With TVT, you don''t have to wait for the physical device to start validating your ATE test patterns, or verifying the device interaction with the tester.
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Test Equipment Calibration Services
Custom Calibration Solutions, LLC
Custom Calibration Solutions assists customers in meeting or exceeding individual business goals by striking the ultimate balance between quality objectives and cost. We can optimize any existing test equipment calibration program by combining the use of our proprietary procedures in conjunction with the most appropriate standards for each calibration task.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Non-destructive Testing Instruments
Coating thickness gauge is a kind of portable measuring instrument, can take fast, intact, precise measurement of coating thickness. It can not only be used in engineering field, laboratories, but also meet the demand of multiple measuring by using different probes. It is used widely in manufacturing, metal processing industry, chemical industry, commodity inspection field, etc. As an essential instrument in material protection industry.
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Cartridge Testing
Print Quality Text and Graphics. Seal Evaluation. Toner Hopper Seal Performance. Remanufactured and Recharged Cartridges. Machines and Multifunctional Products
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Board Test Fixture Probes
Offering a wide range of standard spring contact probes to meet your testing requirements and has long been recognized as the world’s largest probe manufacturer. With over 60 different probe series ranging from 0.02" (0.51 mm) to 0.187" (4.75 mm) pitch with multiple length, travel, ICT, lead free and rotator options, we provide a full portfolio designed for general purpose test on bare boards, loaded printed circuit boards and surface mount assemblies.
