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Aviation Engine Test Cells
1.Design, manufacture and installation: ● Thrust stand components: thrust measurement system, adapter, superstructure etc. ● Facility subsystems: DAQ, supply systems (fuel, oil) etc.2.Civil construction works: site survey, building works etc.3.Contracting: ● Turn-key – MERA is able to supply a “turn-key” test cell including civil works, thrust stand, DAQ, all necessary facility subsystems, specialized software, throttle control level and etc. ● Joint – MERA is capable to supply specified items such as thrust stand with DAQ and software. The Customer is able to procure necessary items such as test nacelle directly from OEM. 4.Project management in accordance to EPC (Engineering, Procurement, Construction, FIDIC) 5.Certification in accordance to international and local standards and rules (SAE 5305) Engine types: PD-14, PS-90, RD-93, RD-33MK, AL-31FN
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PPE High-Voltage Testing
TMD is a founding member of the North American Independent Laboratories (NAIL), the only high-voltage testing accreditation and procedure-certification organization in the United States. With its test lab located at its headquarters in Waco, Texas, TMD has been employing the highest standards of quality and safety testing since 1973 and has served some of the largest utilities and Fortune 500 companies in the nation
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Mobile Test Systems
The systems include A+A+A+ LED solar simulators, high-resolution electroluminescence testers and various other tests that you can easily integrate into your transport of choice or directly into a container on site.
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Electronic Transformer Test System
UI2000-ET
• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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Non-Destructive Testing
Piezoelectric ceramic materials are the active component in nondestructive testing transducers. The material is driven with an ac signal to generate an ultrasonic sound wave that is coupled into an object. The ultrasonic wave is reflected back to the transducer when it encounters a change in density in the material caused by a crack, porosity, or other object with a different density.
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Continuous Testing Platform
TOSCA
Tricentis Tosca is a Continuous Testing platform that accelerates testing to keep pace with Agile and DevOps. With the industry’s most innovative functional testing technologies, Tricentis Tosca breaks through the barriers experienced with conventional testing tools. Using Tricentis Tosca, enterprise teams achieve unprecedented 90%+ test automation rates—enabling them to deliver the fast and continuous feedback required for Agile and DevOps.
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Cable Test Van
The desire for faster and more efficient cable fault location as well as cable testing and diagnostics demands the ergonomic installation of equipment into vehicles. To be able to satisfy the customer's particular requirements, each system is factory-fitted into a vehicle of their choice. The size of vehicle will dictate the equipment at the planning stage. Ergonomics, taking into account the customer's needs, is paramount.
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Optics Test Systems
F Number Meter
Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
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Complete Testing Solutions
System includes a lamp and monochromator for a tunable light source, which is coupled to a high sensitivity source meter with measurement software. This user-friendly system is the most powerful Spectral Response system currently on the market, but its true power is the ease of upgrading from the base PTS-1 to the more powerful PTS-2-QE (Quantum Efficiency) or PTS-3-CPM (Constant Photocurrent Method). Designed for researchers who have limited budgets but want to start work immediately, this allows the ability to do baseline studies until additional funding for the full QE or CPM system becomes available.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Hign Speed Bare Board Test System By Non-Contact Test Technologies
SX-750SUPERⅣ
Suitable for a wide range of applications. Can be connected to a wide range of machines: from hand press to reel mechanism and in-line mechanism. We offer docking with our customers own machines. Compact main tester simplifies integration via installation inside a mechanism. If requested, we will perform a study to decide which functions should be added.
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Virtual Test Methodology
TVT
With TVT, you don''t have to wait for the physical device to start validating your ATE test patterns, or verifying the device interaction with the tester.
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Test Equipment Calibration Services
Custom Calibration Solutions, LLC
Custom Calibration Solutions assists customers in meeting or exceeding individual business goals by striking the ultimate balance between quality objectives and cost. We can optimize any existing test equipment calibration program by combining the use of our proprietary procedures in conjunction with the most appropriate standards for each calibration task.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Non-destructive Testing Instruments
Coating thickness gauge is a kind of portable measuring instrument, can take fast, intact, precise measurement of coating thickness. It can not only be used in engineering field, laboratories, but also meet the demand of multiple measuring by using different probes. It is used widely in manufacturing, metal processing industry, chemical industry, commodity inspection field, etc. As an essential instrument in material protection industry.
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Cartridge Testing
Print Quality Text and Graphics. Seal Evaluation. Toner Hopper Seal Performance. Remanufactured and Recharged Cartridges. Machines and Multifunctional Products
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Board Test Fixture Probes
Offering a wide range of standard spring contact probes to meet your testing requirements and has long been recognized as the world’s largest probe manufacturer. With over 60 different probe series ranging from 0.02" (0.51 mm) to 0.187" (4.75 mm) pitch with multiple length, travel, ICT, lead free and rotator options, we provide a full portfolio designed for general purpose test on bare boards, loaded printed circuit boards and surface mount assemblies.
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Test Cell Measurement
Accurate Technologies’ long history in powertrain development provided insight into the day-to-day issues that were occurring during engine testing at a time when electronic devices were being introduced to monitor performance instead of traditional mechanical means. Outside of the harsh physical environments, devices used in these applications need to perform difficult high-voltage signal conditioning and high-speed synchronous pulse processing. ATI developed unique products that satisfy specific test cell or dynamometer challenges. These highly accurate products measure engine timing (IGTM) or speed (SmartTach) in convenient ways to provide information that otherwise may not be available.
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Multistandard Test Pattern Generator
TRF-950
TRF-950 is universal multistandard equipment suitable for analog TV systems and digital video. This generator supports all analog standards (PAL, SECAM, NTSC) and substandards. Digital output offer DV601/656 signal. Generator is installed in low profile case suitable for desktop use as well as for use in Rack 19" stand.
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Universal Testing Systems
Instron universal testing systems are versatile, high-accuracy platforms (available in electromechanical and hydraulic variants) designed to perform a wide range of static mechanical tests, such as tension, compression, bend, peel, shear, puncture, and more, on virtually any material. They support force capacities from fractions of a newton up to thousands of kilonewtons, with precision load measurement, high data acquisition rates, and compatibility with thousands of accessories, including a wide range of extensometers, grips, fixturing, and automation solutions to meet demanding quality and throughput standards.
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EFI Test Light-GM SCPI
3414
Peaceful Thriving Enterprise Co Ltd
*Simply for testing: Disconnect the fuel injectors, plug in a Noid.*Quickly determines if the electrical signal present at the fuel injectors.*Light and crank the engine, a flashing Noid light indicates normal pulsing voltage.
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AC Test Transformer
Yangzhou Power Electric Co., Ltd
The AC test transformer are especially designed for testing high voltage products and components, such as cables, power transformers, gas-insulated switchgears, bushings and arresters. It is also suitable to test insulation materials. They are used to generate testing high voltage and function as part of the complete system. These systems are particularly suited for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load is inductive (inductive voltage transformers).
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Transformer Ratio Meter
TRM 1000
AJIT Transformer Ratio Meters are the most modern turn's radio meters widely used to test the turn's ratio of high voltage windings, to low voltage windings, of Transformer. These meters are accurate, compact & light in weight.
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Surge Arrester Testing
Weshine Electric Manufacturing Co., Ltd
This instrument can be widely used in equipment maintenance of substations and power plants, and to measure insulation resistance, absorption ratio and polarization index of high-voltage electrical equipment such as transformers, reactors, capacitors, and circuit breakers. The leakage current of the low-voltage arrester of the power distribution cabinet is automatically tested.
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Temperature Test Chamber
Temperature Test Chamber is designed for testing the capability of heat-endurance, cold-endurance, dryness-endurance, and humidity-endurance, suitable for quality control of the industries of electron, electrical equipment, vehicle, metal, foodstuffs, chemistry, building materials, luggage, adhesion tape, printing, packaging, etc.
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Portable Converged Networks Test Set
TX Series
The VeEX TX product series offers a complete test solution for Next Generation of Transport, Metro and Carrier Ethernet Testing. Color graphical display assisted with touch panel enables users tapping through the test configuration and accessing complex overhead bits and bytes. Features include APS, TDM, pointer adjustment, pulse mask analysis, G.821/G.826/M.2100, histogram, and overhead access.
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Line / Hood Test Equipment
The units will test any length, class, or style of hose in today's market.
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AOI & SPI Test Systems
Xceed AOI
Most defects in the circuit-board assembly are due to the solder paste or the process of printing solder paste. Since the transition to lead-free soldering, a whole new spectrum of problems has emerged in older paste printing and its due processes. Incomplete coalescence of ball grid array (BGA) spheres and solder paste deposits are failure modes that have increased in frequency since the transition to lead-free soldering. The Xceed enables true 3D measurement and provides the most accurate and repeatable inspection results with the minimum false calls. It’s designed with Advanced Signal Processing which gives results in noise-less, clear, and accurate 3D images.
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APU Test Cells
Atec is a leader in test cell design and construction for aircraft auxiliary power units (APUs). We are licensed and experienced for work with all major OEMs, DoD, and US Allies. Our Phoenix™ APU Cells feature common configuration, modular utilities, and fast installation and startup.
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Power Calibrator And Protection Relay Test Set
CP11B
Calmet Smart Calibration Devices
Single phase, class 0.02 and 0.05 power quality calibrator up to 120A and 560VAC with programmable power quality parameters. It makes possible to make automatic test of electricity meters, measurement transducers, current transformers and protection relays.
