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Current Probes
PMI® introduces the convenience of flexible current probes (Flex CTs)! These 5,000A probes come in 12″, 24″, 36″, and 48″ lengths that allow you to easily surround multiple conductor bundles. They are available in sets of two, three, or four for use with different recorders. The Flex CTs are powered from recorder voltage and DO NOT require a battery pack for operation.
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BTP-25 Bead Probes
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Energy Probes
RjP-400 Series
The RkP-400 Series probes consist of a compact detector assembly, or head, and a preamplifier housed in a separate enclosure. The external dimensions of all the 400 Series Probes are the same, with identical detector planes, allowing for easy interchange of probes in an experiment. The heads have both ¼-20 and M6 tapped holes, a built-in 1" (25mm) filter holder, and a side-mounted BNC connector. Probe specific data, including spectral response curves and calibration dates, is stored in the preamplifier for access by the instruments.
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Probe Card
VS Series
Japan Electronic Materials Corp.
*Vertical contact Probe Card with Spring*Suitable for Area array Bump Test
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Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74E
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Alternate 0.66 (19.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-62H-6-S
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Brute High Current Probe
P4301-2F
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Standard 0.70 (2.00) - 1.70 (4.80) General Purpose Probe
P2662AG-1R1S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1V-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Scanning Probes
3D Laser Scanning Probes for your existing CMM are options for full-time or part-time use. Laser Design’s broad range of scanning probes ensures a perfect fit between the scanner and the size and detailed features of your parts.
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Custom Probe
When your application demands a unique set of physical attributes, Everett Charles Technologies’ team is ready to provide a custom solution. ECT has been providing custom spring probes for over 50 years. By leveraging this vast experience ECT can effectively work with you to understand your requirements and translate them into a targeted solution.
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Probe Systems
These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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Structure-borne Probe
T20
The structure-borne ultrasonic probe T20 is used for condition monitoring of machines, systems and processes, given that they generate detectable structure-borne sound in the ultrasonic range. Changes in the sound signals indicate a change in the condition and/or process of the plant. The detection of these changes forms the basis for condition monitoring in predictive maintenance.
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Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2F-1
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Probe Card
Tile-on-Card™
Celadon’s uniquely robust and repairable patented probe-in-ceramic crash resistant probe cards reduce maintenance headaches while increasing tester utilization. Celadon’s TOC™ probe cards are known for achieving 10 million+ touch downs before rebuild on test floors worldwide.
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Filter Probe
350
AINES 350 NFP is a professional noise filter probe to use in a demanding environment. It is designed to make a technician's job easy while tracing a wire from a bunch of wires with electrical interferences. The 350 NFP is the best option for technicians compared to other available products in the market. Combined with the AINES 140 or 240 Tone Sets, the 350 NFP makes a formidable combination to identify a cable pair quickly and conveniently in a normal environment and in locations with electrical interferences as well.
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Elevated 1.68 (4.00) - 7.00 (198.00) Bead Probe
BTP-1HL-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Flying Probe
GATS-81TDR
STep & Repeat, panels up to 20X24, single and differential measurement, DC-18GHz.
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Standard 1.00 (28.00) - 3.20 (91.00) General Purpose Probe
P2550-0
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1A-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Probes, Clamp-On
EM-6981 | 9 KHz – 110 MHz
Current probes enable you to measure conducted current without direct connection to the circuit under test by clamping around the conductor, current carrying wire or structural member being tested.
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Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25I8-6.5
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 3.12 (88.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-72J-8
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Probe Series
CAPELLA Series
MPI Photonics Automation is the industry leading provider of turnkey test solutions for the LED / Mini LED manufacturing industry. With more than 10,000 MPI probers installed worldwide, the CAPELLA series of probers have a proven track record of superior performance and reliability. The CAPELLA series probers support electrical and optical characterization of all LED product types (Vertical chip, Lateral chip, Flip-chip) from wafer to packaged die level. Whether you need a high-performance, cost-effective or specialty prober system, MPI PA has the most comprehensive range of LED wafer/chip probers to meet your exacting requirements.
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TSP157 Switch Probes
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 157Test Center (mm): 3.99Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 984Overall Length (mm): 25.00Switch Point (mil): 67Switch Point (mm): 1.70
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Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72H-6
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Differential Probe
DP-02VF
*150MHz High Frequency*MAX. Input Voltage:*±40V DC or 80V p-p or AC 28V rms*Bandwidth: DC-150MHz*Input Impedance 1MΩ // 7.5PF*X2, X20 Attenuator*To Ground MAX. Voltage: 40V*Output Impedance 50Ω
