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Reconfigurable Automatic Tester
Quick-Start Reconfigurable Automatic TesterCompact, Efficient Desktop Tester with Customer-Configurable PXI/PXIe Insert PXI/PXIe Insert – 8 Slots: 1 Controller, 7 Customer-Configurable PXI/PXIe Slots.
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4 Quadrant Dynamometer Test System
Magtrol’s 4 quadrant motorized dynamometers provides expanded testing flexibility over a typical braking dynamometer. With the ability to bring the motor under test (MUT) to synchronous RPM before beginning a test, repeatability is improved. Since the motor windings are at ambient temperature before starting a ramp test, wattage is more consistent.
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Automatic Power Factor Controller
Power factor controlling based on the capacitor bank switching historyCapacitor is automatically disabled when it is deteriorated beyond a certain levelAutomatically learns the number of capacitors connected and the value.Capacitance-based power factor correction takes care of variation in voltage and frequency.Controlling based on VAR parameter and availability of built-in alarms Flexibility for site programmability of CT ratio suitable for any load
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Battery Test Systems
The Intepro’s battery test systems are configurable systems designed to test the latest Lithium Ion batteries and other high power density batteries and chargers. Combining high resolution, high powered charge and discharge systems, Intepro IBT line of battery test systems link to the battery management through the bus communication and fail-safe external monitoring of key battery parameters.
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Autoinjector Testing System
Instron’s Autoinjector Testing System is designed to perform full functionality testing on a wide variety of drug delivery devices, including safety syringes and both needle shield and button-activated formats. Developed in collaboration with pharmaceutical manufacturers and CDMOs, the system captures essential performance requirements such as activation force, injection time, dose accuracy, needle depth, and click detection. It supports compliance with international standards like ISO 11608 and can be configured for integration with collaborative robots to enhance automation and throughput.
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Lifecycle Test System
Model 933
The Model 933A Life Cycle Test System is a low cost, generic test platform used to perform cycling of keypads, keyboards, membranes, switches, or any product requiring fatigue testing.
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HPA-64 General Purpose Probes
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Automatic Relay Test Set
DRTS 66
DRTS 66 is the most powerful diagnostic test set designed to perform accurate tests on protection relays, transducers, energy and power quality meters. This advanced test equipment is also thought to satisfy all the needs related to commissioning and substation maintenance. 6 Current and 6 Voltage generators simultaneously available.
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RMP Replaceable General Purpose Probe
RMP-22B
Current Rating (Amps): 2Average Probe Resistance (mOhm): 125Test Center (mil): 20Test Center (mm): 0.51Full Travel (mil): 79Full Travel (mm): 2.01Recommended Travel (mil): 52Recommended Travel (mm): 1.33Mechanical Life (no of cyles): 50,000Overall Length (mil): 598Overall Length (mm): 15.19
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Discharge Test System
The automated testing equipment automatically performs charge and discharge of energy devices such as the rechargeable batteries(cells, modules, packs) that are installed in PHV/ EV and mobile devices, while measuring the voltage, current, temperature, and impedance.
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Test System
2000/DATS
WesTest Engineering Corporation
The WesTest-2000/DATS features Teradyne's high performance Digital Test Instrument and state-of-the-art intrsuments from Agilent, Elgar and North Atlantic.
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Materials Test System
ModuLab XM MTS
I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials) High-speed pulse (used to activate charge carriers in electronic and dielectric materials)Staircase and smooth stepless analog ramp waveformsImpedance, admittance, permittivity / capacitance, electrical modulusC-V capacitance - voltage, Mott-SchottkyAutomatic sequencing of time domain and impedance/capacitance measurements
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Cleanliness Test Systems
CM Series
The Contaminometer (CM Series) test systems were originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s.
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Automatic Batteries with Filters with Thyristors
BATLVFS400
Lifasa - International Capacitors, SA
LIFASA automatic capacitor banks are used for centralized compensation of powerfactor in low voltage instalations.
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Flight Line Armament Test System
SST
The Stores System Tester (SST) is a ruggedized flight line armament test system that enables real-time diagnostic analysis. U.S forces need to perform alternate mission equipment (AME) troubleshooting and diagnostic analysis on the flight line. BAE Systems' SST provides this capability in a one-person portable package.
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Mixed Signal Test Systems
MTS1000i
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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CRPA Test System
The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
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Actuation Methods for Functional Test Systems
Functional test typically applies full operational power to a final product or a loaded printed circuit board in order to determine if the Product/ PCB performs functions as designed. This type of test often involves custom built test equipment and custom test fixturing. Circuit Check supports all forms of functional test strategies within its Signature Series functional test fixtures.
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Electrodynamic Vibration Test Systems
A-series
A wider range of test requirements and higher test specifications.A-series meets the needs for such a versatile test environment.Advanced automatic energy saving, high level of functionality and a protected test environment.
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Alternate 3.20 (90.00) - 6.90 (196.00) General Purpose Probe
EPA-4B-1
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Ultrasonic Fatigue Testing System
USF-2000A
The USF-2000A implements materials fatigue testing at 20 kHz. Consequently, it is possible to evaluate 109 to 1010 order fatigue strength, where it had been difficult to obtain data before. Also, data for 107 cycles can be obtained in about ten minutes.
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PXIe-5745, 12-Bit, 6.4 GS/s, 2-Channel PXI FlexRIO Signal Generator
785596-02
The PXIe-5745 enables direct RF generation up to 3 GHz with 12 bits of resolution. You can use it in a dual-channel mode at 3.2 GS/s for generation up to 1.5 GHz or in a single-channel wideband upconversion mode at 6.4 GS/s. The PXIe-5745 is ideal for applications that require high channel density IF signal generation with multichannel synchronization, including radar, electronic warfare, and communications. The FlexRIO driver includes support for generating predefined waveforms, and you can use the LabVIEW-programmable Xilinx Kintex UltraScale FPGA for dynamically creating waveforms, signal modulation/demodulation, and other custom real-time signal processing.
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Traction and Induction Motor Test Systems
Crest makes state-of-the art test systems for testing 3-phase AC motors used in traction and other industrial applications.
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Alternate 6.00 (17.00) - 2.50 (71.00) General Purpose Probe
P2262AG-1C2S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Automatic Transfer Of Measured Data
imc LINK
Around the corner, out in the garage, or across the globe, with imc LINK you can have full access to your data without the hassle and expense of traveling to your test site, or tracking down your test vehicles.
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HD Arbitrary Waveform Generator,8 Ch,350 MHz,16 bit,128Mpts/Ch,6 Vpp output,AFG/AWG, Wave Sequencing
T3AWG3358
HD Arbitrary Waveform Generator,8 Ch,350 MHz,16 bit,128Mpts/Ch,6 Vpp output,AFG/AWG, Wave Sequencing.
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Three-Phase Test System
TESTRANO 600
TESTRANO 600 is the world’s first portable, three-phase test system which supports all common electrical tests on single- and three-phase power and distribution transformers for routine and diagnostic testing on-site or during factory acceptance tests (FAT).
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Standard 0.79 (23.40) - 1.75 (49.60) General Purpose Probe
HPA-40B
Current Rating (Amps): 2Average Probe Resistance (mOhm): 35Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 660Overall Length (mm): 16.76
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Waveform Generators
Drive your test systems forward with PXI instruments from Astronics. Small size, power-packed, and cost-effective, these waveform generators provide the perfect upgrade for your test bench.
