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Fully Manual Systems
SPS-1000, SPS-2000, and SPS-2200
The SPS-1000, SPS-2000, and SPS-2200 systems are MicroXact’s premier manual probe stations designed to be flexible and easy to use. The high level of performance and affordability of these manual probe systems put them in a class of their own.
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Cloud-Based One System Platform
VeSion
VeEX''s VeSion is a Cloud-Based, One System Platform, representing the next step in innovation for Network Monitoring. VeSion integrates RFmonitoring systems (Return and Forward), advanced DOCSIS Monitoring, DOCSIS Burst Demodulation, Sweep, Ethernet, MPEG, and Workflow and Asset management system, all under one umbrella. VeSion''s one system concept reduces network troubleshooting and problem resolution time significantly.
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Single-Port Tunable Laser System Source
N7711A
The Keysight N7711A and N7714A tunable lasers are single-port and four-port sources, available with C-band or L-band wavelength coverage. The narrow linewidth and offset grid fine-tuning capability make them ideal sources for realistic loading of the latest transmission systems. All models can reach any wavelength point within their specified wavelength range just like all other Keysight tunable lasers. In this mode, code compatibility with existing test setups based on Keysight's range of full-size and compact tunable lasers is a great asset. In system loading applications, it may be preferable to grid-tune the lasers like system transmitters, simply by changing the channel index. The channel grid is adjustable to standard ITU-T grid spacing like 50 GHz, and to arbitrary grids. Likewise, the zero frequency (base channel) of the chosen grid is adjustable. A 12 GHz fine-tuning range allows de-tuning the frequency.
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System and Collection Tester
SysColl
For certification in many markets, performance of the complete factory made system (for example thermosiphon systems) plays an equally important role as collector performance. Our SysColl test stand is a combined test facility for performance testing of both solar collectors and solar thermal systems. This allows you to take advantage of a flexible two in one test solution.
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High Voltage Switching Test System
The advanced development of new technologies, such as SiC and GaN, have opened the opportunity for more efficient and higher voltage/power performance in switching and power management circuits. Their high cutoff frequencies, low on-state resistance, and very high breakdown voltages can increase power supply power handling densities approaching hundreds of watts/inch. Reliability of these new technologies and techniques is critical for realizing practical applications. While Silicon devices have a rich history of proven reliability, these newer compound semiconductor technologies are too new to have a reliability history and have not been well proven. Further, process variations, even in well-controlled lines, yield widely varying results. This has driven the need for additional testing and to burn-in devices prior to delivery.
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Leak Test System
NorCom 2020
The NorCom 2020 batch inspects up to 500 devices per cycle for both gross and ultra-fine leaks. The system incorporates a patented full field interferometer that produces reliable, repeatable leak test results. The system eliminates the need for helium mass spectroscopy or krypton testing for fine, and bubble leak testing for gross leaks.
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Three-phase Fully Automatic Test System
TS41
Calmet Smart Calibration Devices
The Calmet TS41 test system consists of a three-phase reference meter of accuracy class 0.02% (or 0.04%) and an integrated three-phase current and voltage source up to 3x120A/600V. It makes possible automatic testing of electricity meters in meter test stations
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Advanced Monitoring and Control System
SEL-734B
Schweitzer Engineering Laboratories, Inc.
The SEL-734B with low-energy analog (LEA) inputs provides advanced monitoring and control capabilities for applications, such as capacitor bank control and feeder monitoring. LEA sensor compatibility allows safe, fast, and inexpensive installations. Advanced communications report data to SCADA systems and allow remote operations from a control center.
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PCI Extender Card for cPCI Systems
DP-cPCI-7497
The DP-cPCI-7497 is highly flexible PCI Extender card, which can be used to extend PCI / PCI-X bus from one system to another system over an optical fiber medium upto 500m distance. A PCI-X to PCI-e Bridge is used to convert the PCI / PCI-X protocol to x4 PCI Express protocol operating at 2.5Gbps.The PCI-X to PCI-e Bridge is connected to four optical transceivers (x4 PCI- e link) which can transmit optical signals upto 2.5Gbps speed.A x4 copper medium connection option in lieu of optical transceivers is also available.
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Fully Automatic Rubber Tensile Testing System
Compactly Integrating Functions Required for Quality Control of Rubber Shimadzu Fully-Automatic Tensile Testing System This system provides full automation, from measurement of specimen dimensions, supply to the testing machine, and fixing of chucks to measurement of extension between standard lines and data processing. The system can be used for continuous nighttime testing, which helps save labor costs.
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Reflex Reflector Measurement Systems
Photometric Solutions International Pty Ltd
The measurement setup involves using a projector to illuminate the test item, and then measuring the luminous intensity of the light reflected from the test item. The ratio of the luminous intensity emitted by the reflector (in candelas) to the illuminance on the reflector (in lux) is the coefficient of luminous intensity or CIL (cd/lx).
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Robotic Vehicle Gap / Flush Measurement System
Automation
LaserGauge® Automation is a robotic system for measuring vehicle gap/flush on a moving assembly line. It is cost-effective, fast, flexible, and delivers LaserGauge® accurate measurements. Utilizing the Cross-Vector scanning and Blue Laser Technology, the system provides more assembled-panel surface information than any other robotic laser profiler.
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MXI X-Plane System
X-Plane technology provides high resolution, high magnification CT functionality anywhere on the board - without cutting the board.
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Phase Noise Test System
PN9000 System
Noise eXtended Technologies S.A.S.
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a NIST tested instrument.
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PCI Express System Timer (USB Interface)
SKU-032-01
The MiniPCI Express System Timer uses a standard USB interface to synchronize IP signals. This system timer provides accurate clock timing for Asterisk® open-source PBX software.
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Power Bank Battery Testing System
BTS4000
Shenzen Neware Electronic Co LTD
Battery testing system for power banks(BTS-4000-6V4A-CCDC-USB) is based on Neware BTS4000, it shares all the main feature of BTS4000, such as 0.05%FS accuracy, 10Hz data acquisition frequency, based on Ethernet communication, etc.
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Handset Noise Under RF Test System
BK8021
If you need to evaluate the resistance of cellphones to RF interferance, the BaKo Type BK8021 Handset Noise Under RF Test System is what you need. It performs four tests to evaluate the Sending Noise, Sending Sensitivity, Sending Loudness, Sidetone Masking, Receiving Sensitivity and Receiving Loudness. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When testing is complete, you can print the data as an MS Excel report or save it for comparison and analysis.
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Windows Server Simulation Software For BACnet Systems
BACSim
BACsim is the industry's first easy-to-use BACnet device simulator for Windows. BACsim runs under Windows 7/8/10 and Server 2012, and provides a robust set of basic simulator features tailored to the needs of BACnet designers and testers.
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Industrial Communication System
PROFIBUS Network
PROFIBUS is the leading industrial communication system for manufacturing automation in Europe with strong growth in many other markets. PROFIBUS is supported by Siemens and is promoted by the PROFIBUS User Organization. Profibus products are certified by the PROFIBUS User Organization (PNO), guaranteeing worldwide compatibility.
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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Walking Test System Kit
PGA-710
The PGA-710 Walking Test System is a complete kit designed to perform the walking test per ANSI/ESD STM97.2 and IEC 61340-4-5. The system consist of several devices designed for portability and to perform several different tests which includes measuring the voltage on a person in combination with floor materials and footwear.The kit includes the PGA-710B Data Logger, the PFM-711B Field Meter, CPM-720B Charge Plate Monitor, the PCS-730B Electrostatic Charger, Hand Held Electrode and the Prostat Autoanalysis Software version 2.0.
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PCI System Timer
SKU-051-01
The PCI System Timer uses a hardware clock to synchronize IP signals. This hardware-based solution provides accurate clock timing for Asterisk® open-source PBX software.The timer supports variable clock timing intervals. You can configure the clock interval during startup. Currently, the PCI System Timer supports clock interval ranging from 1ms to 64ms.
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Power Monitoring Kit For SAR System Validation
PMK
Test labs have a daily requirement to ensure SAR measurements are highly accurate. SAR systems must be vigorously checked to ensure the measuring accuracy meets the system manufacturer uncertainty budget. The PMK features technologies usually found in more expensive equipment at an affordable price. The ability to measure the S11 parameter for dipoles and antennas while continuously monitoring their linear behaviour differentiates the PMK from other systems. The ART-Fi PMK is an all-in-one solution that requires only three connections to perform automatic, highly precise validations and verifications. The lack of moving parts also leads to improved durability and fewer bugs, faults, and workarounds.
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Magnetic Measurement System
Model 110
The Model 110 Magnetic Measurement System is a very high field version of our industry-standard MESA, designed specifically to measure high-coercivity samples. It uses powerful amplifiers and specially designed water-cooled solenoid assemblies to achieve the magnetic fields required by state-of-the-art material.
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Optics Test Systems
MTF Measuring Device For Endoscopes
Optik Elektronik Gerätetechnik GmbH
Manual MTF measuring device for endoscopes. The measurement setup is based on modular individual components that can be arranged on a breadboard according to the type of endoscope (angle between light entrance and eyepiece).
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Compact Timing Systems
NanoSync IV & NanoSync IV Low Profile
The NanoSync IV is a small form factor GPS Position, Navigation, Time (PNT) and Frequency reference system that provides multiple reference outputs and includes support for NTP & PTPv2 IEEE 1588-2008. The NanoSync IV has a Rubidium oscillator and is available with a civilian C/A GPS receiver or SAASM (Rockwell-Collins MPE-S GB-GRAM or Trimble Force 22E MRU GPS receiver) for military users. The NanoSync IV is packaged in a small, rugged enclosure ideally suited for embedded electronic warfare applications.The NanoSync IV-SA-Rb has been demonstrated to be compliant to the Joint Airborne SIGINT Architecture (JASA) Version 3.0, Annex 1, for Time, Frequency, Navigation and Geodesy (TFNG), making it suitable for Electronic Warfare (EW) COMINT and ELINT applications in fixed site, airborne and shipboard environments.
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Automated I-V/AOI/EL and Sorting System
OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Surface Defect Inspection System
Wafer for inspection of surface condition of specular flat substrate, glass substrate, others φ 100 ~ φ 300 compatible
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EUV Lithography Systems
Using extreme ultraviolet (EUV) light, our NXE and EXE systems deliver high-resolution lithography and make mass production of the world’s most advanced microchips possible
