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Eddy Current Test System
CIRCOGRAPH® Product Family
Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Mixed Signal Test Systems
MTS1000i
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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USB Protocol Verification System
Voyager M310e
The Voyager M310e is Teledyne LeCroy's flagship USB protocol verification system designed for USB 2.0, USB 3.2, Type-C, and USB Power Delivery. Offering the industry's highest fidelity probe design, flexible traffic generation, and a range of turnkey Compliance packages, the Voyager M310e is the most complete platform for cradle-to-grave USB design verification.
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Short Range Detection Systems
The EFM-100 kit comes complete with a high accuracy short range detector, inverted mounting hardware, cables and adapters. It is designed to provide a real time reading of the electrical field in the atmosphere with a time vs e-field graph displayed on a computer along with lightning strike distances accurate to within one mile.
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MXI X-Plane System
X-Plane technology provides high resolution, high magnification CT functionality anywhere on the board - without cutting the board.
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Three Axis Helmholtz Coil Systems
Macintyre Electronic Design Associa
he MEDA turnkey closed loop magnetic field sources cancel the local ambient field as well as generate accurate and uniform magnetic fields in a control volume. The sources use Helmholtz coils driven by control currents to produce stable magnetic fields from 1 nT to 100,000 nT. The accuracy of the field in the control volume is better than 0.05% of the setting.
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SABRE Rugged Systems
The SABRE family from Diamond Systems offers an attractive combination of features, ruggedness, and economy. These systems feature full IP67 rating and MIL-STD-810G compatibility and are ideal for vehicle and other harsh environment applications. Standard configurations offer quick turn solutions based on proven designs, while the system architecture supports quick and low-cost customization with the addition of PC/104 and PCIe MiniCard I/O modules.
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Optical VisionInspection System
NIDEC-READ's inspection systems serve to locate open/leak circuits on printed substrates forming different conductor patterns within inner/outer layers. These vision inspection systems are also used to measure the shape of via holes and solder bumps and to find scratches and stains on them.
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Instrumented Pendulum Impact Testing System
JB(INSTRUMENTED)
Jinan Testing Equipment IE Corporation
JB-450I/750I Instrumented Pendulum Impact Testing Machine is equipped with high precision instrumented strain-gauged striking edge & high-speed data acquisition system. This instrumented test system can measure the force of a test specimen during an impact event. Then, the instrumented test data can be used to calculate the energy absorbed by the test specimen. In addition, the crack initiation and arrest loads can be used in fracture mechanical models.
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Harmonics And Flicker Measuring System
ProfLine Series
The Teseq ProfLine system is a complete and cost effective Harmonics and Flicker measurement test system which compiles to the latest IEC/EN standards, including IEC 61000-3-2 and IEC 61000-3-3. The programmable power generation capability of up to 45 kVA (90 kVA and 145 kVA sources comprise multiple 45 kVA units) provides more than ample power to cater for a wide range of Equipment Under Test (EUT).
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Indoor Gunshot Detection And Response System
Pre-SenseShot
Information System Technologies Inc.
ISTI offers a new detection system to the facility security and safety industry to quickly neutralize an active shooter and more quickly secure and protect occupants. When confronted with an active shooter situation first responders and safety personnel face immediate tactical disadvantages. Beyond rushing towards ensuing chaos, 9-1-1 calls and eye witness reports are often disjointed, inaccurate, and lack precise location information required to make real time responsive decisions as they arrive on scene. Likewise within the building, the crisis triggers panic and chaotic scrambles towards exits and assumed safe havens. However unorganized and uniformed retreats may actually be leading evacuees back into harm’s way.
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Radar solution for launder systems level
The precise level measurement of molten metal in the launder system guarantees a controlled, reliable filling of casting pits, casting ladles and casting molds. Our radar sensors measure the level of liquid steel, copper or aluminum in open or closed launder systems, channels or troughs with a measurement accuracy in the sub-millimeter range – even at a metal temperature of up to 1600 degrees Celsius.
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Automotive Test Systems
Ono Sokki Automotive Test Systems - flow meter, non-contact speedometer, engine tachometer, crank angle detector, and more
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High Speed Data Acquisition Board
MS 1800
*Bus Interface:- 64 Bit PCI Bus with PMC Interface*Virtex-4 FPGA based design*32 channel digital I/O signal*RS232 & RS485 Interface*32MB Flash*2MB Static RAM for data storage*Analog Inputs:- 2 Channel*Input Resolution:- 14 Bits*Sampling rate up to 80MSPS*Filter:- Low Pass Filter for all channels*Two Analog Outputs*14 bit Resolution*Driver interface for Windows2000/XP/VISTA and LINUX OS*Self Test future
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Automated Potentiometer Systems
Measurements International Ltd.
Intrinsically Accurate Self-Calibrating Ratio Divider, Best Accuracy < 0.05 ppm, Built-in 20-Channel Scanner, Arbitrary Voltages from 1 mV to 1200 V, Bipolar Voltage Measurements, Calibration of Fluke 5700A/5720A, Calibration of 3458A and 8508A, Calibration of Voltage Ratio Dividers (F752A, MI 1340A, G7520), Linearity Calibration of Digital Volt Meters (DVM), Traceability to 10 V Zener Reference.
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Industrial Microscope Systems
Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
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High Voltage Cable/Harness Test System
CKT1175-50
The CKT1175-50 is a high-voltage wiring analysis system that features a switching matrix that can be distributed around the workshop or in and around the assembly to be tested. This system is expandable in 100 or 150 test point increments to 96,000 test points, and is available with a variety of adapter cable interface connectors, with the standard being the CKT MAC interface system
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Integrated Tester for Aircraft Survivability Systems
ITASS
The Integrated Tester for Aircraft Survivability Systems (ITASS) verifies radar warning receivers (RWRs), missile warning systems, laser warning systems and other radio frequency (RF) systems onboard aircraft, providing operators the tools they need to confidently validate the operational status of the systems.
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Distributed Data Acquisition
Distributed Data Acquisition seamlessly networks all the components of your integrated monitoring system. The resulting synchronization decreases the quantity and lengths of communications wires between sensors and the data-acquisition system (DAQ).
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Data Acquisition & Control
SmartDAC+
With modular I/O you can scale your data acquisition system the way you want it with the ability to upgrade as your needs evolve. Access live data by using your browser, iPhone or iPad. Universal viewer allows users to access, print and analyze historical data.
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Ground Threat Emitter Sensor System
GTESS
The Ground Threat Emitter Sensor System (GTESS) is a modular test and training system capable of stimulating multi-spectral aircraft electro-optic sensor suites at long range. The GTESS system integrates Textron Systems’ ultraviolet (Mallina™), infrared (Phoenix) and/or laser (Phantom™) ranged stimulators with an automated tracking system to facilitate fast-moving test, training and evaluation exercises. A fully integrated camera system for effective after action review. GTESS can also work in conjunction with Textron’s radio frequency (RF) range stimulator systems (PRTS™ & HPRTS) for complete multi-spectral testing.
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Trailer Lighting System Tester
Scanner
A Scanner Trailer Lighting System Tester makes the job a lot faster and easier since it powers your trailer's lighting circuits in sequence. You check the operation of all lighting functions in a single walk-around instead of two or three.
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Flexible Test System Automation Platform
RF2000A
The Ranatec RF2000A is a flexible test system automation platform that helps you to integrate your complete test system into a single box. No more cables and discrete parts on your desktop!
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WDS Analysis System
Lambda
The Lambda™ Wavelength Dispersive Spectrometry (WDS) Analysis System combines the EDAX WDS software with state-of-the-art spectrometers for improved accuracy and precision, guaranteeing the best results for your materials analysis.
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Macro-Vickers Hardness Testing System
LV Series
LECO's LV Series Macro-Vickers Hardness Testing Systems offer an affordable testing system suitable for larger, heavier samples used in welding and other demanding applications. Models include analog and digital, with options to upgrade to automatic configurations.
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Module for VME & VXI Systems
EXC-4000VME/xx / EXC-4000VXI/xx
The EXC-4000VME/xx and EXC-4000VXI/xx cards for VME & VXI systems supports up to eight dual redundant MIL-STD-1760 channels using the M4K1553Px(S)-1760 module and is compatible with all common variations of MIL-STD-1760 (A, B). Each channel can operate simultaneously as a Bus Controller and up to 32 Remote Terminals and as a Triggerable Monitor. In addition, Checksum, SRQ bit and Header Words are supported on each channel.
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Titan Data Acquisition
DAQ
Titan Data Acquisition (DAQ) Systems offer universal signal conditioning, low power consumption, convenient SD card storage, and easy-to-use software. Systems can be purchased as a complete test kit, including custom cables and accessories. Titan products are designed and built in the US.
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Liquid Nitrogen Data Logging System
LNDS
MadgeTechs LNDS, Liquid Nitrogen Data Logging System, is an ultra-low temperature measurement system created specifically for the monitoring of temperature sensitive substances that need to be preserved at cryogenic temperatures.
