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Battery Testing
BTS 200
This testing and maintaining battery system allows to perform measurement of battery voltage, discharging current test and testing of battery capacity. BTS 200 can be connected with external load unit ELU 200.
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Test Handlers
Boston Semi Equipment test handlers are designed for optimum production performance on your test floor.
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Test for Pacemakers
VXI-based functional test system for testing implantable medical electronic products. The system is equipped with a Virginia Panel Series 90 adapter interface and can be operated standalone as well as on handling systems. Based on the previously developed matrix-based standard architecture, a large number of systems were supplied. The system function can be verified at any time via an automated self-test.
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Functional Testing
We are flexible to match your approach, whether you are using Agile or traditional development methodologies. We can work with your requirements and test cases, or perform exploratory testing. We can provide 100% of your software testing, or supplement your internal team. Independence and creativity are key elements to find issues to help your software developers create high quality software.
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Standard 1.50 (42.00) - 3.30 (94.00) General Purpose Probe
P2663G-1W1S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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A to Z Testing
Elemental Analysis has the ability to analyze, and to test for all of the substances listed below, and many more. If you do not see the substance you need analyzed or tested for, please give us a call! We can test almost ANYTHING!
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Modular Testing
Modular testing requirements come in all shapes and sizes. It is therefore important that we are able to match your requirement with a suitable ATE System. At ATE Solutions, we have a range of modular test and test automation products to choose from, with a tester to suit every situation.
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Shipping Testing
We provide testing services independent of the companies that are designing and selling the packaging to you. Our services result in lower packaging costs and improved product "plug and play".
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Test Adapters / Aeroflex Test System
52xx / 5300
We develop and manufacture test adapters for your existing interface including documentation and test program
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AC Calibration Standard
1U647-001
The 1U647-001 is a low cost calibration standard used to determine if a 1U632-100 or a 1U663-100 DMU requires factory calibration. Its portability makes it ideal for field-testing. The standard generates signals that simulate the aircraft’s resolvers, rotary variable transformers (RVTs), and linear variable displacement transformers (LVDTs). The unit also generates a pulse width modulated (PWM) signal, and routes the output of an ARINC 429 source to the different DMU input channels. The calibration standard connects directly to the DMU and replaces the output signals of an active extender card. Discrete switch settings simplify testing. The unit is housed in a rugged aluminum case.
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Color Tests
LED-Check
LEDs are the standard light source in car cockpits. It is not sufficient to find out if a LED shines, or not. The LED needs to have precisely the specified brightness and color to fulfil its function.The FiberVision LED-Check system tests up to 250 LEDs in less than one second.
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Cloud Testing
Cloud-based platforms are increasing enterprises’ ability to reduce time-to-market drastically along with eliminating upfront costs. This has led to increased interest in the adoption of cloud-based solutions. However, it brings unique challenges related to data security, privacy, integration, and application performance. These require comprehensive cloud-based testing to ensure your cloud implementations are successful and you realize complete benefits from the cloud solution.
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Standard 6.20 (175.20) - 8.00 (226.80) High Frequency Probe
CSP-40A-015
Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Recommended Travel (mil): 133Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,231Overall Length (mm): 31.28Full Travel Remark: Shield: 275 (6.99) including travel of probes
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Test Probe Kit
69600
Kit includes 14 flexible test probes, long straight probe, piercing back probe, crocodile clip, 4mm circuit tester adapter and Deutsch spooned probe. The probes are designed to be used on popular Weather-Pack, Metri-Pack and Micro-Pack style connectors. The test probes are 5" in length and are flexible to help eliminate damage to the connector terminals that can result from testing with a standard test probe. The 4mm adapter allows conversion of some circuit testers to a 4mm banana connector, which provides a better connection. Kit comes in a pouch for storage.
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Standard 1.10 (31.00) - 2.50 (71.00) General Purpose Probe
HPA-1A
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Standard Mass Flow Meter
Series II
Offers outstanding value in a wide range of industrial and lab applications. Exceptional accuracy and repeatability with flow ranges from 0.014 cc/min up to 1670 l/min. and working pressures up to 6000 PSIA. Offers multi-gas and multi-range capability
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DHCP Tests
The Dynamic Host Configuration Protocol (DHCP) provides configuration parameters to Internet hosts. DHCP consists of two components: a protocol for delivering host-specific configuration parameters from a DHCP server to a host and a mechanism for allocation of network addresses to hosts. DHCP is built on a client-server model, where designated DHCP server hosts allocate network addresses and deliver configuration parameters to dynamically configured hosts. (Source: RFC 2131)
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Test & Inspection
Our test and inspection products support maintenance, product quality testing, diagnostics, and quality control. The extensive range of products covers almost any application need you to have.
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Testing solutions
From Manual Testing, to test automation Ideabytes Inc is a one stop shop for all testing needs. Among the specialities Model Based Testing that changes the approach to testing reducing cost and catching faults early. With our methodologies, automated test cases are ready just as the developers are releasing their code. Contact us for a free consultation!
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FPGA Testing
Silicon Turnkey Solution, Inc.
The secret to our success in the FPGA testing field is the STS hammer file, a proprietary test methodology based on our experience testing thousands of unique FPGA designs. The hammer file is designed to program the FPGA to its maximum combination and block configuration and then tests the completely programmed FPGA for full dynamic, DC and at-speed AC performance. Power and transient tests are also conducted under worst-case populated configurations. Application-specific usage configurations are also used to assist in generating the worst-case electrical specification limits at worst-case environmental use.
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Boresight Testing
CI Systems provides different types of boresighting capabilities, such asLine of Sight BoresightingMission Ready BoresightingMechanical to Optical Alignment
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Test Container
MTL 15 | VP 700006
Maschinenbau Haldenwang GmbH & Co. KG.
The MTL 15 test container works completely independently thanks to the optionally available, fully integrated power generator. Equipped with a hydraulic set-down device including cable remote control, the test system can be set up within 15 minutes and is therefore ideal for changing locations.
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High and Low Temperature & Low Pressure Chamber
LAP-100
It is according to GB10590 / GB15091 low temperature / low pressure test chamber requirements; GB11159 low pressure test chamber requirements; GB / T2423. 25-1992 low temperature / low pressure integrated chamber requirement; GB / T2423. 26-1992 High temperature / low pressure integrated chamber requirement; GJB150. 2-86 low temperature / low pressure test etc standards. It’s used to test the In aviation, aerospace, information, electronics and other fields, to determine the instrumentation, Electrical products, materials, components, equipment etc.
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Standard Voltage 37 Pin D-Type Connectors
The connectors below are not compatible with Pickering products, however, are offered for developing a connection solution for use with other products.
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Standard 2.00 (57.00) - 3.60 (102.00) General Purpose Probe
P2664G-1W1S
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 10Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 114Full Travel (mm): 2.90Recommended Travel (mil): 84Recommended Travel (mm): 2.13Overall Length (mil): 895Overall Length (mm): 22.73Overall Length Remark: Tip 1C: 845 mil (21.46 mm) Tip 2R: 935 mil (23.75 mm)
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Standard 2.00 (57.00) - 4.00 (113.00) General Purpose Probe
P2757G-3W1S
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-10
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Test Accessories
By combining the latest in LED technology with the unmatched illuminating dynamics of prismatic glass, this High Bay LED luminaire brings a superior, incomparable proficiency and reliability to the table. With its remote driver capability, the TDK HBLED-540 High Bay LED Light Fixture is ideal for EMC chambers with minimal RF emissions.
