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Advanced Burn-in and Test System for packaged parts
ABTS-Li
High power logic individual temperature control
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Conducted Immunity Test System
Conducted RF immunity tests acc. to IEC/EN61000-4-6 and BCI tests acc. to ISO 11452-4 and MIL-STD 461 CS 114 Signal generator,RF-power amplifier, RF-power meter and directional coupler (optional) in one 19”-caseStand-alone operation possible with optional available netbookControl-software includedMost important parameters are shown on an integrated displayAutomatic EUT-monitoringOperation via USB port of a PC or NotebookComplete range of CDNs available
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Measurement System For Testing & Binning Of Back-End LEDs
TP121-TH
The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
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Industrial-quality chambers for combination testing with vibration systems
AGREE Series
For years AGREE chambers have been the workhorses of the environmental test chamber industry. Originally created to meet military test standards, their flexible design has made them suitable for a wide variety of applications. Fast temperature changes of 5 to 25°C/m. are possible, even with significant loads. The chambers have a removable floor, allowing integration with vibration test systems.
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Mixed Signal Test Systems
MTS1010i
The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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RSP-2T Test System Interface Probe
RSP-2T
Current Rating (Amps): 5Average Probe Resistance (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 167Full Travel (mm): 4.24Recommended Travel (mil): 79Recommended Travel (mm): 2.00
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OLED Life Time Test System
A system for measuring measurement items (brightness and so forth through Voltage, Current, and Photodiode) and their lifetime in intervals of set time, while supplying power to multiple (32 Channel) OLED panel stably.
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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In-Line Full Automatic Testing System
ALMAX
Automated press unit with board loading belt.ALMAX can become automated in-line type in-circuit tester in case our ICT is integrated. And it also can become automated in-line function tester as well.PLC is not used in order to reduce cost as a PC control mechanical part.Press unit is 4 shaft structures which reduce unbalanced load and contact fail of probe pins.
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Cable/Harness Test System with Rack-Mounted Switching
CKT1175-20
The CKT1175-20 is a high-voltage wiring analysis system that features rack-mounted switching matrices. This system is expandable in 100 test point increments to 96,000 test points, and available with a wide variety of adapter cable interface connectors, with the standard interface being the CKT MAC interface system.
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Automated Test System
Automated Test System is a production-ready solution that combines test software and various hardware for validation test in both manufacturing and R&D. The solution provides a high performance and cost-effective system based on National Instruments technology.
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Annual testing of Automatic Identification System
AIS
The purpose of an annual testing is to determine that AIS is operational as defined in appropriate performance standards - the International Maritime Organization (IMO) Performance Standard (MSC 74(69)) and IEC standard, IEC 61993-2: Maritime Navigation and Radio Communications Equipment and Standards Automatic Identification Systems (AIS).
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GC System
Agilent's Gas Chromatography systems provide modern laboratories with new performance expectations by increasing analytical performance, reducing cost of ownership, and saving capital expenditure investing. These benchtop, on-line, and portable GC systems (available for in-lab and field analysis) are all supported with Agilent's 10-year Value Promise Guarantee demonstrating our commitment to long-term reliability.
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PLD Systems
Pulsed Laser Deposition
Is a versatile thin film deposition technique. A pulsed laser (~20 ns pulse width) rapidly evaporates a target material forming a thin film that retains target composition. This unique ability of stoichiometeric transfer of target composition into the film was realized first by the research team led by Dr. Venkatesan at Bell Communications Research, NJ, USA, nearly 30 years ago while depositing high temperature superconducting (YBa2Cu3O7) thin films. Since then, PLD has become the preferred deposition technique where ever thin films of complex material compositions are considered. Another unique feature of PLD is its ability for rapid prototyping of materials. The energy source (pulsed laser) being outside the deposition chamber, facilitates a large dynamic range of operating pressures (10-10 Torr to 500 Torr) during material synthesis. By controlling the deposition pressure and substrate temperature and using relatively small target sizes, a variety of atomically controlled nano-structures and interfaces can be prepared with unique functionalities.
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Optics Test Systems
Mobile Wedge Angle Sensor With Positioning System
Optik Elektronik Gerätetechnik GmbH
Mobile wedge angle sensor for determining the wedge angle and the radius of curvature of glass panes, eg windshields of automobiles, helicopters, airplanes or rail vehicles.
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Eddy Current Test System
CIRCOGRAPH® Product Family
Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Mechanical Shock Test System
BW-MST-E5000
The Mechanical Shock Tower develops the kinetic energy electromagnetically. An iron core "bullet" is attracted to the magnetic core of the solenoid by the dense magnetic field that is created as current flows through the field coil of the shock tower. As the bullet is drawn into the center of the magnetic field the acceleration increases exponentially as the gap reduces to zero on impact causing the high impact shock
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Tracking Systems
Portable wand based systems are utilized to walk a pipeline to precisely locate a stuck pig. These systems allow for visual and audible indication of pig location.
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High Temperature Component Test Fixture
16194A
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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LogiCue Systems
LogiCue 12
LogiCue is a digital cue light system that makes cueing actors and production crew easy and accurate. The LogiCue 12 gives stage managers the ability to control up to 12 different cue lights.
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Hydrostatic Test Stand, Hydraulic System Components
9901HTX-100LR2-72x24x12
The 6 foot wide Hydrostatic Test Stand, Hydraulic System Components is utilized for pressure testing hose and tube assemblies as well as any component requiring hydrostatic testing in the integral safety test chamber.
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Impulse Current Test Systems
Fivestar HV Testing Equipment Co., Ltd.
Impulse current test systems are mainly used for testing transmission and distribution systems against the effects of direct or indirect lightning strokes or against electromagnetic interference effects. Primary application of impulse current test systems is the testing of surge arresters, nowadays mainly of the metal-oxide type (MOA) and surge protection devices (SPD). Now they are also widely used to test vehicles, aircrafts, and military applications.
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Level System
Universal II
The Universal II level transmitter offers increased reliability, low maintenance and an intrinsically safe design for dependable level measurements in all kinds of process liquids, slurries, granulars and interfaces.Universal IIThe Universal II is a two wire level transmitter that eliminates the need for line power in the field and saves costs for additional hardware. It provides reliable level measurements in all kinds of process liquids, slurries, granulars and interfaces.When powered from an approved source this level transmitter can be made intrinsically safe. Its rugged contruction resists corrosion and abraision. The no moving parts design eliminates break downs.The Universal II level transmitter utilizes RF Admittance technology with manual calibration and a 4 – 20 mA output signal. The patented Cote-Shield circuitry ensures accuracy and reliability regardless of product build-up on the level transmitter.This level system is unaffected by changes in the process material density, pressure, or temperature variations.
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Control System
HICOS
HIGHVOLT Prüftechnik Dresden GmbH
The HiCOS controller is a collection of modules for monitoring test systems and recording, creating, evaluating and evaluating measurement data. It is suitable for mobile and stationary test systems as well as measuring devices. The modular design of the HiCOS controller allows the expansion of functions. Existing test systems from other manufacturers can be upgraded with HiCOS.
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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BSV Systems
In the medical field, electrical devices are used on which people's lives or healing processes depend. The highest demands are therefore placed on the devices required in the operating room or intensive care unit. Gustav Klein BSV systems guarantee an uninterrupted and safe power supply in accordance with VDE 0100 and ÖVE/ÖNORM E 8007.
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Power Systems
Astronics serves global customers as the aircraft industry’s electrical power experts, offering a breadth of power and motion solutions for commercial transport, business, VIP, rotorcraft, military aircraft, and other airborne platforms. Whatever your program, you’ll find a proven, certified solution with Astronics.
