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ATE System Integration
Cyth Systems is a Systems Integration Company specializing in Automated Test (ATE), Embedded Controls, and Machine Vision. Our skilled and experienced team uses their natural talent for problem-solving to create solutions in a wide range of industries. We build our solutions starting with the National Instruments (NI) platforms including LabVIEW and PXI, and by adding best-in class sensors and components.
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LIFA FLIM System
The Lambert Instruments LIFA FLIM system is the fastest and easiest way to perform Fluorescence Lifetime Imaging Microscopy (FLIM).Available in versatile configurations dependent on your specific applications, the LIFA system offers a turn-key solution for fluorescence lifetime imaging microscopy. Compatible with any fluorescence microscope with a camera output – including microscopes by Leica, Nikon, Olympus, TILL and Zeiss. Set up is quick and easy, with all hardware integrated seamlessly with our dedicated LIFA software, so you can focus on your experiment.The advanced software instantly analyses data and presents the calculated fluorescence lifetimes visually. Recorded images are compatible with ImageJ, FIJI, Matlab and MetaMorph, while detailed statisitcal data can be exported to an Excel worksheet.
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Tire Pressure Monitoring Systems
TPMS
With the widespread use of tire pressure monitoring systems (English: Tire Pressure Monitoring System - TPMS) come to new requirements on dealers, garages and tire shops. Since November 2014 every newly registered vehicle must have on board a tire pressure monitoring system as standard. With its carefully designed parts solutions and efficient service devices of VDO They are well equipped for the service!
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Quantum Computing Control System
In 2018, Zurich Instruments introduced the first commercial Quantum Computing Control System (QCCS), designed to control more than 100 superconducting and spin qubits. Each component of the QCCS is conceived to play a specific role in qubit control, readout and feedback, and operates in a fully synchronized manner with the other parts of the system. LabOne®, the Zurich Instruments control software, enables fast access to qubit data and facilitates the integration into higher-level software frameworks.
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Optics Test Systems
F Number Meter
Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
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Gas Detection System Controller
SMC Sentry IT
The SMC Sentry IT Controller is a powerful network-enabled hazardous gas detection system that operates up to 32 detectors and interfaces with devices over Modbus RTU, 4-20 mA, Sentry PSG Bus, and conventional dry contact. The embedded web application enables users to view important data remotely and provides connectivity into the Industrial Internet of Things (IIoT).
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Integrated UHPLC Systems
LC-4000 Series
The LC-4000 Series UHPLC system offers high performance separations at up to 130MPa (around 20,000psi) for use with the smallest particle sizes and longest column lengths. The pump, autosampler and detectors are optimized for the smallest band broadening and fastest cycle times.
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Systems Analysis Interface
Saint2
The Systems Analysis INterface Tool 2, a Delphi Preferred Tool, for Low-cost EOL Testing & Reflashing Without the Need of Additional Hardware.
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Telemetry Systems
For Automotive, Aerospace, Marine, Motor & Generator Health, Energy, Power Plant, and Industrial Applications.
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High Resolution Magnet Systems
EPR
EPR samples with S=1/2 electronic spins exhibiting a narrow signal at G=2 and require magnetic fields of only ca. 3.5 T. However, EPR spectra from S>1/2 spins are typically much broader and have spectral features that spread over magnetic field range of several Tesla.
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TDR System
TS9001
The system accurately analyzes the wiring quality of various leading-edge semiconductor packages such as Flip Chip BGA, wafer level packages, and 2.5D/3D ICs using terahertz technology. It is a TDR analysis system that has the world’s top-class signal quality.
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Magnetic Probing Systems
MPS-C-300 and MPS-C-350
MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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UV-VIS Systems
The tec5 UV systems offer fast and reliable measurements starting from 190 nm. The modular system platform enables multiple integration options for easy and efficient handling of various measurement tasks in research and production applications. Due to the system’s dedicated design for industrial processes, even applications in harsh environments are possible without any difficulties, including simple and safe connection to process control systems utilizing common interface concepts established on the market.
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Laser Test Systems
Santa Barbara Infrared, Inc. offers an extensive family of test systems and components that test and characterize the performance of laser range finders, designators, illuminators and spot trackers.
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Production Line Test System
1740
The fully programmable Model 1740 facilitates high speed, production line testing in both automated and manual applications. Standard tests include AC Hipot, DC Hipot, Resistance, patented Tang-Weld Resistance and Surge. Robust software offers automatic setup of all test parameters, complete result storage, Go/No-Go testing requiring no operator judgment, and online statistics for all tests.
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Functional Test Trainer System
QT65
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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PXI/CPCI System Platform
PX44201
LinkedHope Intelligent Technologies Co.,Ltd.
PX44201 is a 3U PXI/CPCI system platform compliant with PXI Rev2.2, PICMG 2.0 specifications. With the air cooling design and PXI/CPCI modular design on the platform, PX44201 has excellent heat dissipation performance, and can save costs on maintenance in the long run.
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Pressure Comparator (System D)
P Series
AMETEK Sensors, Test & Calibration
The P-Series (System D) comparators are hydraulic screw pumps designed for easy, controlled, high pressure generation. Each comparator includes a 4 connection manifold, which can be used for the reference indicator, the device under test, a fine adjust, an isolation valve, or a fluid reservoir. The adjustable reference pressure port lets you set your reference gauge at the best viewing angle. Three models are available for hydraulic oil, water, or both.
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Complete Data Acquisition System
ScopeLogicDAQ
ScopeLogic - complete data acquisition system - consists of Digital Oscilloscope and Logic Analyser. This small instrument is making the accurate analysis of complex analog-digital signals possible - thanks to simultaneous sampling finding relationship between these signals is easy. The user is able to simultaneous use 16 digital channels and 2 analog channels with standard scope probes.
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X-Ray Inspection System
MX1
Manncorp’s new MX1 is a high-performance x-ray inspection system designed for real time imaging of multilayer PCBs and dense metal BGAs, μBGAs, and chip scale packages. Its high voltage (80kV), computer-controlled x-ray tube and 35 μm focal spot provide the power necessary for detection of a variety of defects including bridging, voids, and missing balls. The MX1’s standard camera features continuous zoom magnification from 4X to 50X and variable angle viewing up to 45°, and an upgrade to the x-ray tube can boost magnification to 225X.
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Manual Vision Measuring System
Manual Vision Measuring MachineQS-LAF/B QS-LZB QS-EB Series. 2-D Manual Type Vision Measuring MachineQuick Image
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Machinery Vibration Protection System
Alta Solutions' machinery protection systems can quickly detect abnormal machinery conditions and shutdown your machinery to avoid catastrophic failures and further damage.
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Scientific Systems
Teledyne e2v has been producing turnkey focal plane arrays, camera systems, electronics and astronomical cameras for over 15 years. As part of our advanced system and instrument group we act as your partner to collaborate and develop the next generation of scientific products and technologies.
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Thermal Desorption Systems
TD-30 Series
The TD-30 was developed as the optimal solution for gas and materials analysis. Its outstanding processing ability and excellent expandability provide strong support for all types of analysis, from work in research departments to quality control.
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Systems for Water Leak Detection
Here you are getting an overview about our devices for water leak detection. In our portfolio you can find systems for electro-acoustic water leak detection, compact onehand receiver, correlators, stationary noise loggers and a lot more...
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Laser Warnings Systems
Elbit Systems of America’s laser warning systems use both coherent and non-coherent laser sources. We understand the full scope of issues associated with each laser threat and have the systems engineering expertise necessary to accurately and reliably detect, locate and categorize these threats. Each LWS is equipped with a direction indicator and provides complete threat coverage in a high dynamic range with audio and visual warnings.
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Miniature Airborne Recording System
MARC II
The MARC II is a complete Miniature Airborne ReCording system designed to record messages of several communication protocols. Small, light, with low power consumption and large storage capacity for recorded data, the MARC II is the perfect standalone solution for airborne recording.Ethernet is built-in to the MARC II. In addition to Ethernet, you can order the MARC II with up to three additional modules of the supported protocols.
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Physical Vapor Deposition Systems
Physical Vapor Deposition (PVD) systems use physical processes, like sputtering and evaporation, to deposit thin films with exceptional purity and control. These techniques are widely used in semiconductor manufacturing, optical coatings and protective applications.
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Epi Thickness & Composition System
Element
The Element system is the tool of record for wafer suppliers for high speed impurity mapping and epi thickness measurement. It is the only tool on the market with the unique combination of transmission and reflection based technology. This system is the industry standard for dielectric monitoring.
