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Showing results: 76 - 90 of 262 items found.

  • Benchtop Discrete Component Tester

    Imapact 7BT - Lorlin Test Systems

    The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results and uses a Windows 10 64-BIT Operating Systems and a USB 2.0 Interface.

  • Test System

    Griffin III - Hilevel Technology, Inc.

    The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.

  • Insulation Multimeter Series

    Brymen Technology Corporation

    Insulation Multimeter is a new category of test tool that combines a full featured True-rms DMM and a megohmme- ter. It's an integrated tool for maintaining and troubleshooting motor systems, electrical distribu- tion, and production equipment.

  • Drivetrain Test Stands

    RedViking

    Customers in automotive and off-highway vehicle production and R&D environments trust us to design and build precise, reliable, and repeatable drivetrain component test stands. All of our systems are designed to provide the highest level of dynamic testing capability at a competitive price. For decades, RedViking has designed, built, and implemented highly engineered test systems for drivetrain systems and components.

  • Wafer Probing Machine

    UF3000EX-e - CSE Co.,Ltd

    Wafer Probe Station is used in connection with test system in Wafer Test process.It is a device to move wafer automatically to examine fair quality of individual chip on the wafer. Probe Station is seperated depending on purpose. For analysis, for mass production as well as manual, semi-automatic, full-automatic.

  • Spectrometer

    LSCM - OptCom Company, Ltd

    This device performs high-speed measurement and sorting of LED electrical and optical characteristics while synched with control signals from the LED production line inspection and sorting system. The LSCM then provides that pass/fail information to the system. The LSCM is equipped with the function to test both electrical and optical characteristics by applied voltage and current to the LED. This test device was designed to integrate test functions required by the inspection and sorting system into one compact body.

  • IQC Test Systems

    Signalysis, Inc.

    Signalysis has worked with many Tier I and Tier II Automotive sub-suppliers to provide production test systems. Below are some examples of our systems; we have also supplied systems for wiper motors, axles, door panels, window mechanisms, and many other interior components.

  • Battery Test System P 480 – 1000

    S.E.A. Datentechnik GmbH

    The P480-1000 battery test system is a scalable high-performance test system consisting of a central power unit with power supply units and electronic loads and up to four mobile test stations. The test stations contain the necessary measuring technology and the PC terminal with touch screen for operating the test bench. The modular concept, the common use of power supply units and loads as well as the regenerative capability of the loads enables an extremely cost-efficient operation of the entire test system both in the development and production of battery systems. The required power is switched to the respective test station via a specially developed high-performance switching matrix

  • Standard Test Systems

    WaveCore™ Products - Textron Systems

    Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.

  • Test System

    LB302 - Computer Gesteuerte Systeme GmbH

    The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.

  • Dynamic Component Test Systems

    RedViking

    RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.

  • Test House Services

    Microtest S.p.A.

    Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).

  • Solar Simulator Device

    PSS 8 - Berger Lichttechnik GmbH & Co. KG

    The Pulsed Solar Simulator PSS 8 is optimized for module production lines, Research&Development and off-line measurement. It can be easily integrated into automatic and semi automatic handling systems by automation suppliers. The system is available with options as a customized "Plug&Play" test station for manual and automatic use.

  • PXIe-5831, 44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver

    786853-01 - NI

    44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver - The PXIe-5831 supports validation and production test into mmWave frequency bands. The PXIe-5831 incorporates a vector signal generator, vector signal analyzer, and high-speed serial interface with FPGA-based real-time signal processing and control. The PXIe‑5831 combines fast measurement speed and the small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments, making it an ideal solution in both the lab and the production floor. The PXIe-5831 meets the stringent challenges of 5G New Radio, but it is also able to test a variety of cellular and wireless standards such as Wi-Fi 6. In addition, you can easily expand a test system in the PXI Express form factor to support multiple input, multiple output (MIMO) configurations with phase-coherent synchronization.

  • PXIe-5831, 44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver

    786856-01 - NI

    44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver - The PXIe-5831 supports validation and production test into mmWave frequency bands. The PXIe-5831 incorporates a vector signal generator, vector signal analyzer, and high-speed serial interface with FPGA-based real-time signal processing and control. The PXIe‑5831 combines fast measurement speed and the small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments, making it an ideal solution in both the lab and the production floor. The PXIe-5831 meets the stringent challenges of 5G New Radio, but it is also able to test a variety of cellular and wireless standards such as Wi-Fi 6. In addition, you can easily expand a test system in the PXI Express form factor to support multiple input, multiple output (MIMO) configurations with phase-coherent synchronization.

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