O-Level Test
unit test using equipment maintanence checks.
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Exchangeable Test Fixture
MA 2109/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 8,50 kg
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Test Cell System
qCf FC25/100
The quickCONNECTfixture with an active fuel cell area of 25 cm 2 has been an integral part of our product portfolio since 2006. The excellent properties and the patented design of the cellFixture offer enormous advantages in the characterization of cell-internal components for fuel cells and electrolysis.
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Semiconductor Testing
The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).
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DC High-Voltage Test Device
PGK 50
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK 50. The portable, one-piece PGK 50 high-voltage test device for generating negative DC voltage up to 50 kV is primarily used for onsite testing of paper-insulated mass-impregnated cables in the medium-voltage network. The high voltage is generated through a high-voltage transformer with secondary voltage-multiplier. The internal operating frequency of 20 kHz enables the smallest of device dimensions.* Continuous adjustable output voltage* The voltage measurement is done directly at the high voltage output* Timer of 1-30 min* Sensitive current measurement for recording the smallest of insulation currents with 6-time range switch, decadal
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Leakage Test
Leakage current and discharge current depend on the insulation of the device. The measurement simulates various fault situations that could occur during operation. The test determines whether the measured current is within the permissible limits and poses no danger to the user in case of a fault.
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Test Automation System for Heavy-Duty Engine Emission Testing
STARS HDEET
STARS HDEET is a Heavy-Duty Engine Emission Test application available as an optional extension to STARS Automation. It provides efficient test cycle execution, emissions equipment control, results calculation and reporting, in compliance with the different legislative standards. Its flexible design offers a wide range of customization while addressing the various requirements for research and development, conformity of production, and certification testing.
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Thermal/Mechanical Testing
Accolade Engineering Solutions
As new products employ advanced materials and processes, the need to measure and characterize those material properties becomes increasingly important. DSC is used to measure heat flow in to or out of a material. Some DSC applications include measurement of melting temperature, polymorphic transitions, crystallization temperature, thermal stability, heat of fusion and degree of cure. TMA is used to measure dimensional changes of a material as a function of temperature.
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Automated Robot Test System
ATS-8000A
High Power Pulse Instruments GmbH
The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP, HMM and CC-TLP on package- and wafer-level.Future extension for CDM is optional.
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Test Adapter / Extender
The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly.
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Portable Appliance Testing (PATs)
In response to ever growing industry requirements, Megger offers a sophisticated line of electrical product testing equipment.
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Railroad Test Sets
Triplett Test Equipment & Tools
Railroad Testers are designed to perform standard maintenance tasks (using Volts, Ohms, and Amps measurements) as well as specialized tasks requiring measurements on railroad coding equipment. The 2000 Series is compatible with older test technologies and offers test features not found on earlier test sets.
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Soil Testing Instruments
Soil water hardness meter, soil moisture meter, soil nutrient tester, soil salinity tester, soil water potential tester
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Sensors And MEMS Test
Easy docking and undocking of the MEMS modules to the standard test handler whether Gravity, Pick and Place or Test in StripTest in the complete tri-temp range for ambient, hot and cold (automotive certified)Easily convertible to other packagesDownscaled stand-alone engineering set-up availableGlobal support by experienced Cohu Field Service and Applications staff
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Battery Cell Testing Equipment
Xiamen WinAck Battery Technology Co., Ltd.
The battery cycle life tester is a high-precisionsystem designed specifically for the battery cell charge and discharge testing.It is suitable for the battery cell cycle test, battery cell charge anddischarge aging test, battery cell performance test, battery cell capacitydetection test, battery cell IR test, deep-discharging test, function test ofhigh-power lithium-ion battery cells, such as EV battery module, ES batterymodule, super capacitor…
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Latch-on Test Fixtures
Latch-on Test Fixtures provide a convenient way for production personnel to quickly and reliably make electrical connections to a product for programming or final test. These custom fixtures eliminate the need to hand-wire products in order to power them up and communicate with them. Typical applications for latch-on test fixtures are metering devices, control panels, and any type of controls that connect via terminal strips.
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Rack Based Test Solutions
Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.
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Vacuum Test Adapter
Vacuum test adapters (VA) are suitable for contacting electronic assemblies with large quantities (mass testing) and a small number of variants. INGUN vacuum test adapters are available as standard as a single system without an exchangeable replacement kit.
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Universal Testing Systems
Instron universal testing systems are versatile, high-accuracy platforms (available in electromechanical and hydraulic variants) designed to perform a wide range of static mechanical tests, such as tension, compression, bend, peel, shear, puncture, and more, on virtually any material. They support force capacities from fractions of a newton up to thousands of kilonewtons, with precision load measurement, high data acquisition rates, and compatibility with thousands of accessories, including a wide range of extensometers, grips, fixturing, and automation solutions to meet demanding quality and throughput standards.
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Coherent Transmission Test Instruments
Optical modulation analyzers provide detailed insights into the complex modulated optical signals at the physical layer to determine signal quality or evaluate components that are designed for IQ modulation and demodulation.
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Test Analyzer
ST2302
Shenzhen Star Instrument Co., Ltd.
The ST2302 three-phase energy meter field test analyzer reaches accuracy class 0.02. Its stable performance comes from the embedding technology and digital signal processing. It is Windows CE-based and provides 7 inches color LCD display.
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Phase Noise Test System
PN9000 System
Noise eXtended Technologies S.A.S.
The PN9000 is a simple and fast Automatic Phase Noise Test System covering a very wide frequency range. Its modular architecture allows optimum configuration, multiple measurement techniques and future growth in a NIST tested instrument.
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Engineering Testing
At ARC, we know engineering testing, and with our in-house mixed signal test capabilities, we can get you the right test services for what you need. Working with our leveraged partnerships (National Instruments, Keysight and others), we can augment our standard capability with whatever test requirements you have for power, precision analog, high-speed digital, and RF testing up through to 50Ghz.
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Test & Programming Software
ScanExpress
The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.
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Manual Tablet Testing Units
H-Series
The manual lab testers of the H-series in the new LAB.line design combine state-of-the art technology with usability: round shapes, generous radii and smooth surfaces allow for easy and hygienic cleaning.Operation of the embedded touch display is simple and intuitive: you can change a product or view informative test results with just a few clicks.The H series consists of three unit variations with usually 500 N, alternatively 50 N or 1000 N. The H5 version offers to connect an external scale (Sartorius/Mettler). With the H5+ version, you can even perform high-precision measurements with the external thickness gauge module.
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Shock Test Systems
Accurately measure the fragility of products and evaluate how they respond to specific shock inputs.
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Laser Diode Characterization Testing
The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
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FPGA Testing
Silicon Turnkey Solution, Inc.
The secret to our success in the FPGA testing field is the STS hammer file, a proprietary test methodology based on our experience testing thousands of unique FPGA designs. The hammer file is designed to program the FPGA to its maximum combination and block configuration and then tests the completely programmed FPGA for full dynamic, DC and at-speed AC performance. Power and transient tests are also conducted under worst-case populated configurations. Application-specific usage configurations are also used to assist in generating the worst-case electrical specification limits at worst-case environmental use.
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Electrostatic Discharge Testing
MET Labs offers special ESD testing services at controlled temperature and humidity, in a specially-designed and dedicated chamber.The chamber consists of ESD waveform verification setup and tables that accommodate a variety of EUTs. The chamber has a capability to vary the relative humidity from 15% to 65% and temperature from 18°C to 24°C.
