IV
measure of current flow as a function of voltage.
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Oscilloscope: 200 MHz, 2 Analog Channels
DSOX4022G
The 4000 X-Series boasts 12.1-inch display, capacitive touch screen technology, InfiniiScan Zone touch triggering, 1-million-waveforms/sec update rate, MegaZoom IV smart memory technology and standard segmented memory.
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Clamp Meters
Amprobe invented the first clamp meter in 1948 and has continued to innovate and evolve. Today Amprobe offers several categories of clamp meters – from the rugged CAT IV rated Navigator Series, to the versatile Swivel clamp meters, to the compact mini-clamps. Whether you work on residential, commercial, or industrial applications you’ll find an Amprobe tool that fits your needs.
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Power Quality mobile / Description
Mobile Power Quality-Analyzers such as PQ-Box 100, PQ-Box 150 and PQ-Box 200 were developed for the operation in harsh environment (protection degree IP65). Both are applicable for measurements in public (CAT IV) and industrial networks for voltages up to 1000V. Analyzers are delivered with WinPQ Mobile, intuitive, user-friendly software package for settings, records extraction and visualization, second to none in its class.
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Level Switch
Z-Tron IV
The Z-Tron IV level switch is one of our most popular on/off level switches offering an effective, low-cost material level detection in a wide variety of applications. It is widely used as an alternative to electromechanical level switches.
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Modular Solar Array Simulators
MP4300A Series
The output power of solar cells varies with numerous environmental conditions (e.g., temperature, irradiation) and operational conditions (e.g., eclipse, spin). The Keysight MP4300A Series solar array simulator enables you to test all these conditions with high accuracy. It delivers fast current-voltage (I-V) curve changes with a quick recovery time, emulating rapidly changing conditions.
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Parameter & Device Analyzers, Curve Tracer
Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Series provides a wide selection of IV analyzers suitable to your specific measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
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Materials Lab XM
The Materials Lab XM product provides a fully integrated reference grade time domain and AC measurement platform. No need to switch sample connections between techniques. Time domain measurements include I-V (current voltage) characterization as well as fast pulse techniques. AC testing techniques include everything from single-sine analysis, to multisine / Fast Fourier Transform for faster low frequency analysis, to harmonics and intermodulation for testing linearity and breakdown of materials. Measurements of electrical impedance spectroscopy (EIS), admittance, permittivity and capacitance are all provided from the XM-studio MTS software platform, together with integrated equivalent circuit analysis functionality.
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PXIe-4147, 4-Channel, ±8 V, 3 A Precision PXIe Source Measure Unit
786888-01
PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing engine, you can synchronize SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4147 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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Measuring and Analysis Software
With over 10 years of experience, IVS-KA6000 PV Test IV software has been developed by Enli Technology. IVS-KA5000, the previous generation, has more than 500 users. IVS-KA6000 is evolved from IVS-KA5000 based on users’ feedback and experience. IVS-KA6000 can control a variety of SMUs and perform data collection of current and voltage based on setting parameters by users. The formulas and algorithms of IVS-KA6000 are …
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Sorter
IV-200I
IV-200I is a sorter for package in pocket tape that features a lot summary information. This product is used for mapping data with Defect Code Data/Report as well as exporting data or report archiving. IV-200I works well with an In.D X-ray Image Analyser.
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Infusion Device Analyzers
Dual Channel with unique "Synchro-Start" function optimize IV Pump and Analyzer accuracyTest all types of pumps dual-rate, pulsatile flow, and PCA infusion pumpsAutosequence editing, plus test results
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Post Wire and Die Bond Inspection Machine
IV-T3300
IV-T3300 is a post wire and die bond inspection machine with Dual JEDEC Tray Feeder System. It features a large inspection area of 600x500mm and a quick trays change of 5-7 seconds.
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Reject Station for X-Ray Image Analyser
IV-110I
IV-11OI is a reject station for X-Ray Image Analyser known for having an X-Ray Image Wire Defect Detection and a compact and space-saving dimension.
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Mobilize
A complete wireless solution that connects your Pronk test equipment to your smart device!* Take complete control of your Pronk products — Safe-T Sim® Mobilize Electrical Safety Analyzer, Mobilize SC-5 SimCube® NIBP Simulator, Mobilize OX-2 OxSim Flex® SpO2 Simulator, and Mobilize FlowTrax® IV Pump Analyzer — to set up your own test protocols or run your CMMS procedures right from your Apple iOS device.
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Materials Test System
ModuLab XM MTS
I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials) High-speed pulse (used to activate charge carriers in electronic and dielectric materials)Staircase and smooth stepless analog ramp waveformsImpedance, admittance, permittivity / capacitance, electrical modulusC-V capacitance - voltage, Mott-SchottkyAutomatic sequencing of time domain and impedance/capacitance measurements
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1500V 15A I-V Curve Tracer
I-V500w
I-V500w allows field detection of I-V Curve an of the main characteristic parameters both of a single module and of strings of modules for PV installations up to a maximum of 1500V and 10A or 1000V and 15A. For measuring I-V Curve, I-V500w manages an internal database of the modules, which can be updated at any time by the user and comparison between the measured data with the rated values allows immediately evaluating whether the string or the module fulfills the efficiency parameters declared by the manufacturer.
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Mixed Signal Oscilloscope: 1.5 GHz, 4 Analog Plus 16 Digital Channels
MSOX4154G
The 4000 X-Series boasts 12.1-inch display, capacitive touch screen technology, InfiniiScan Zone touch triggering, 1-million-waveforms/sec update rate, MegaZoom IV smart memory technology and standard segmented memory.
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Wafer Inspection Machine
IV-W2000
The IV-W2000 is a wafer inspection machine that features on-the-fly scanning and inspection as well as automatic handling of 6/8/12-inch wafers. With the option to have a Chinese language UI, this machine is also known for being intuitive and user-friendly.
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Test Leads
AL-34WB 10A
Standard Electric Works Co., Ltd
● Wire length: 1m approx. Silicone insulated wire (700mm) with wire connected to straight input plugs (150mm PVC wire), and wire for clamp (150mm PVC wire).● Outside diameter of silicone insulated wire: 6.4mm Outside diameter of PVC wire: 4mm● Input plug color: Red•Green•Black•Blue ● Current rating: 10A● Voltage rating: 300V● Designed for Milliohm meter, Micro-ohm meter, Low resistance measurement with high current injection. ● Conductor size: 40mm maximum● Safety standard: IEC/EN 61010-031 CAT IV 300V
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Products for High-Frequency Measurement
This product range includes passive high-frequency test probes and accessories as well as touch-protected BNC plug connectors, insulated BNC panel-mount sockets, leads with RG58 or RG59 cable, adapters and converters. Our test probes are suitable for use in CAT III- and CAT IV environments (Measurement Categories), such as the analysis of house and building installations with mains analysis/mains monitoring devices. Our high-frequency accessories are designed with clearance and creepage distances in accordance with IEC/EN 61010-031.
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Reference Cells For PIV-IV Systems
NREL calibrated cell used for calibration transfer.The Abet Technologies solar reference cell is a precision instrument for the determination of solar simulator irradiance levels. The sensor is a mono-crystalline silicon solar cell having an area of2x2cm(4cm).The back of the solar cell is attached to the device in such a way that a good heat transfer to the device housing is guaranteed. Below the solar cell a Pt100 RTD temperature sensor is mounted to allow monitoring of device temperature. The device is not shunted allowing the whole IV-curve to be measured. The solar cell is protected by a high quality fused silica window, assuring spectral sensitivity over a 320 -1100 nm range.
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Tube-Above Wavelength Dispersive X-ray Fluorescence Spectrometer
ZSX Primus IV
As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
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Voltage/Continuity Testers
VOT-53
Standard Electric Works Co., Ltd
● 2000-count digital display (LCD type). ● Test leads positioned at 19mm apart.● Interchangeable probe tip for 2mm and 4mm.● Polarity test ● Audible continuity test.● Auto sensing function for: voltage (AC/DC), Ω, diode.● Measurement function: ACV/DCV: 1000V Resistance: 2000Ω Frequency: 30Hz~1kHz ● Phase rotation test : ● Waterproof design, protection class: IP65.● Phase / Neutral identification.● Rubberized double-molded housing.● Flashlight function.● Safety standard : EN 61010-1 CAT III 1000V EN 61010-1 CAT IV 600V EN 61243-3 EN 61326-1
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Leadframe Inspection Machine
IV-L200
The IV-L200 is a leadframe inspection machine ideal for measuring leadframe dimension and pitch. Aside from identifying leadframe warpage, it is also used to detect bent or skewed leads as well as surface defects such as scratch, ink, and contamination, among others.
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Digital LCR Multimeter
MT-5211
MT-5211 is a Fully featured multimeter with LCR meter. Ideal for a wide variety of electrical and electronic testing applications. Comply with CAT IV 600V.
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Stand-alone I-V Test Systems
OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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Test Software
American Probe & Technologies, Inc.
This new series of software allows you to analyze materials or semiconductor leakage with all of the capabilities of your HP 4140B to resolutions of 1 fA @ 100VDC. Completely rewritten in Visual Basic for Windows XP operating system, it offers Virtual Front Panel Operation of 4140B for I-V & CV Analysis and allows operator to virtually control the 4140B for any instrument operation. I-V Plots with options of displaying current over time. CV Plots with high resolution plotting capability.
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Post Wire and Die Bond Inspection Machine
IV-E1700
IV-E1700 is a post wire and die bond inspection machine that is known for having a proven, effective and patented 2D+3D Inspection system. This product is best used to weed out defects with data collection for process improvement and reports for SPC quality Control.
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Cable & Antenna Analyzer
iVA Series
VSWR, Return Loss Measurement & Distance to Fault. The iVA Series Cable & Antenna Analyzer is an exciting new product from Kaelus that enables users to accurately measure VSWR/return loss and the location of the VSWR/return loss faults in their RF infrastructure. The wireless connectivity allows unprecedented measurement flexibility and opens up new & important possibilities in sweep testing and multi-port testing.
