QE
photon converted to electron ratio.
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Product
QE Systems
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Abet Technologies offers a range of standard EQE and IQE measurement systems. Model QE-1100 is configured with the most useful components for single junction devices. It has a 350 – 1100 nm range. The QE-1800 is configured with components most useful for components for triple junction cells. Beyond the standard systems offered systems can be custom configured to meet a customer’s metrology needs.
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Product
SR/QE Testing System
PVE300
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Industrial Vision Technology Pte Ltd.
Solar Cell Multi-function SR/QE Testing System is specially designed for Photovoltaic Industry to characterize the Optical Performance of Raw material, process wafer, finished solar cell, as well as small Module.
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Product
Intensified Cameras - Ultra-Sensitive CMOS Cameras from Deep UV to NIR Spectrum
iCameras
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The cameras are equipped with a high-resolution sensor with high frame rate for excellent quality of image production, which is well‐suited to detect high speed moving objects or ultra-fast phenomenon.The mechanical architecture of the iCamera is small, compact and light-weight, especially designed for easy integration into any system.The iCamera features an exceptional sensitivity based on high QE image intensifier - ultra-fast gating technology down to a few nanoseconds, which allows it to be coupled with a laser source to perform high fidelity active imaging.
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Product
Complete Testing Solutions
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System includes a lamp and monochromator for a tunable light source, which is coupled to a high sensitivity source meter with measurement software. This user-friendly system is the most powerful Spectral Response system currently on the market, but its true power is the ease of upgrading from the base PTS-1 to the more powerful PTS-2-QE (Quantum Efficiency) or PTS-3-CPM (Constant Photocurrent Method). Designed for researchers who have limited budgets but want to start work immediately, this allows the ability to do baseline studies until additional funding for the full QE or CPM system becomes available.
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Product
Front Side Illuminated Sensor with Pixel Size of 5.3µm with NIR Spectrum Sensitivity
Ruby Family
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The EV76C660 and EV76C661 are members of Teledyne e2v’s Ruby family of CMOS imaging sensors. These breakthrough devices provide sensitivity and performance beyond that considered possible on a front side illuminated sensor with a pixel size of 5.3µm, Quantum Efficiency (QE) of over 80% and excellent sensitivity and performance in the near-infrared (NIR) spectrum (>50% at 850nm). This significantly reduces system illumination costs, or enables very low-light imaging in outdoor camera applications.
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Product
QE System
PVE300
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The PVE300 system is a monolithic,turnkey solution for photovoltaic material and device characterization;a key component in research, or as part of a production-line quality process.
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Product
FastCamera
FC300
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The FastCamera 300 is a high-speed 3 megapixel digital camera system, using a CMOS imager with an electronic global shutter. This camera has a the option of a high-speed, scalable, integrated FPGA, image processor, and memory subsystem which enables stand-alone high speed in camera image processing and extended storage. Options include back thinned versions with high QE in the visible and NIR range, ruggedized, Camera Link output. When integrated with a high powered frame grabber /coprocessor board, the resulting system capabilities can be expanded by adding processors and memory on the board according to the needs of the user.
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Product
Image Sensor Characterization Systems
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Image Sensor QE and Spectral Responsivity Characterization
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Product
High Power Tuneable Light Source (280-1100nm)
TLS120Xe
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This compact solution easily fits into a wide range of applications in spectroscopy and spectrophotometry and delivers superlative stability and continuous tuning over 280-1100nm. The wavelength agile TLS120Xe offers a high power monochromatic beam suited to a wide range of materials and photodetector characterisation applications in research, industry and OEM, including: Fluorescence imaging, Photoluminescence / fluorimeter excitation, Detector responsivity / QE evaluation ...
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Product
Ultra-compact Scientific CMOS Camera
Sylent™
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The HORIBA Sylent scientific CMOS (sCMOS) uncooled camera line provides end-users with three novel high QE backilluminated sensor models that provide diversified solutions to successfully meet the most demanding photonic applications for the scientific and industrial sectors.
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Product
FastCamera
FC200
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The FastCamera 200 is a high-speed 2 megapixel digital camera system, using a CMOS imager with an electronic global shutter. This camera has a the option of a high-speed, scalable, integrated FPGA, image processor, and memory subsystem which enables stand-alone high speed in camera image processing and extended storage. Options include back thinned versions with high QE in the visible and NIR range, ruggedized, Camera Link output. When integrated with a high powered frame grabber /coprocessor board, the resulting system capabilities can be expanded by adding processors and memory on the board according to the needs of the user.
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Product
Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems
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QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.
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Product
Solar Cell Systems
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he Solar Cell Scan is a multifunctionalexperimental platform,which is based on the measurement of Quantum Efficiency (QE) . The system employs a turnkey integrated design, which can carry out QE, Reflectivity and Mapping testing functions automatically. There are also modular and customdesigned accessories to adapt to different solar cell samples.
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Product
Quantum Efficiency Measurement Systems
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Newest generation of quantum efficiency (yield) measurement tool, which allows the user to determine QE of powders, liquids, solids and films. An optically optimized geometry using an integration hemisphere and low stray light array spectrometer enables world class measurements and new applications.
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Product
OEM CCD Camera
Syncerity BI-NIR Camera
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The TE-cooled back illuminated 2048 x 70 CCD Camera combines affordability, performance and versatility for OEM applications. With peak QE of 84% @ 700nm and 20% at 1050nm, Syncerity BI-NIR offers a relatively broad response and addresses multiple applications. In the near-NIR, this detector is a much lower cost alternative to a deep depleted CCD, with no etaloning. Syncerity’s flexible design allows our OEM-dedicated team to quickly adapt the camera for industrial requirements, ranging from alternate CCD chips to electronics
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Product
Solution Toolkit
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An extension plug-in which accelerates the development of applications in integrated development environments. It is configured with the Smart Utilities, which can be used in development for all fields of application, and Quick and Effective Tool Solutions (QEs), which are for particular fields. Both enhance efficiency from development to mass production, and will reduce total costs.
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Product
Boundary Scan Trainer Kit
QE49
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Qmax Test Technologies Pvt. Ltd.
The QE-49 IEEE1149.1 Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
